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21. 发明授权

US07606347B2 Photon counting x-ray detector with overrange logic control 有权
标题翻译：光子计数x射线探测器与超量程逻辑控制
公开(公告)号：US07606347B2
公开(公告)日：2009-10-20
申请号：US11744292
申请日：2007-05-04
申请人： John Eric Tkaczyk , Jonathan D. Short , James Wilson Rose , Xiaoye Wu , Samit Kumar Basu
发明人： John Eric Tkaczyk , Jonathan D. Short , James Wilson Rose , Xiaoye Wu , Samit Kumar Basu
IPC分类号： A61B6/03
CPC分类号： A61B6/5205 , A61B6/032 , A61B6/4291 , G01T1/2018 , G01T1/242 , G01T1/243 , G01T1/249
摘要： A CT detector includes a first detector configured to convert radiographic energy to electrical signals representative of energy sensitive radiographic data and a second detector configured to convert radiographic energy to electrical signals representative of energy sensitive radiographic data and positioned to receive x-rays that pass through the first detector. A logic controller is electrically connected to the first detector and the second detector and is configured to receive a logic output signal from the second detector indicative of an amount of a saturation level of the first detector, compare the logic output signal to a threshold value, and output, based on the comparison, electrical signals from the first detector, the second detector, or a combination thereof to an image chain.
摘要翻译： CT检测器包括：第一检测器，其被配置为将射线照相能量转换成表示能量敏感射线照相数据的电信号;以及第二检测器，被配置为将放射线照相能量转换成表示能量敏感射线照相数据的电信号，并被定位成接收穿过第一检测器逻辑控制器电连接到第一检测器和第二检测器，并且被配置为从第二检测器接收指示第一检测器的饱和电平的量的逻辑输出信号，将逻辑输出信号与阈值进行比较，并且基于比较将来自第一检测器，第二检测器或其组合的电信号输出到图像链。

22. 发明授权

US07488945B2 Subpixel routing and processing for an imaging system or the like 有权
标题翻译：用于成像系统等的子像素路由和处理
公开(公告)号：US07488945B2
公开(公告)日：2009-02-10
申请号：US11291273
申请日：2005-11-30
申请人： Wen Li , John Eric Tkaczyk , Yanfeng Du , James Leblanc
发明人： Wen Li , John Eric Tkaczyk , Yanfeng Du , James Leblanc
IPC分类号： G01T1/24
CPC分类号： H01L27/14603 , G01T1/2928 , H01L27/14659
摘要： Count rates may be obtained from one or more subpixels for a given pixel in an imaging system detector. Count rates may be obtained from individual subpixels, or may be from electronically binned subpixels at least in part in various subpixel arrangements where a selected subpixel arrangement may be adaptively set according to a detected count rate. For lower count rates, two or more subpixels may be electronically binned together and the counts may be obtained from the binned subpixels, for example to mitigate a charge sharing effect. For higher count rates, the count rates of a greater number of subpixels may be individually obtained, for example to mitigate a pulse pile-up effect. Detective quantum efficiency may be optimized over a wider range of photon flux rate via the adaptive subpixel arrangement.
摘要翻译：可以从成像系统检测器中的给定像素的一个或多个子像素获得计数率。可以从各个子像素获得计数速率，或者可以至少部分地根据检测到的计数速率自适应地选择所选择的子像素排列的各种子像素排列从电子分组的子像素获得。对于较低的计数率，可以将两个或更多个子像素电子地分组在一起，并且可以从二进制子像素获得计数，例如以减轻电荷共享效应。对于更高的计数率，可以单独获得更多数量的子像素的计数率，例如以减轻脉冲堆积效应。可以通过自适应子像素排列在更宽的光子通量速率范围内优化探测量子效率。

23. 发明申请

US20070290142A1 X-ray detectors with adjustable active area electrode assembly 审中-公开
标题翻译：具有可调节有源区电极组件的X射线探测器
公开(公告)号：US20070290142A1
公开(公告)日：2007-12-20
申请号：US11454532
申请日：2006-06-16
申请人： Yanfeng Du , John Eric Tkaczyk , Wen Li
发明人： Yanfeng Du , John Eric Tkaczyk , Wen Li
IPC分类号： G01T1/24
CPC分类号： G01T1/241
摘要： An electrode assembly having an adjustable active area is provided. The electrode assembly is configured to detect photons. The electrode assembly includes a central readout electrode, and one or more bias control portions. The bias control portions are disposed adjacent to the central readout electrode. The active area is altered by controlling voltages of the bias control portions relative to a voltage of the central readout electrode.
摘要翻译：提供具有可调节有效面积的电极组件。电极组件被配置为检测光子。电极组件包括中央读出电极和一个或多个偏置控制部分。偏置控制部分邻近中央读出电极设置。通过控制偏置控制部分相对于中央读出电极的电压的电压来改变有效区域。

24. 发明授权

US07260182B2 Method and apparatus of radiographic imaging with an energy beam tailored for a subject to be scanned 有权
标题翻译：使用针对待扫描的被摄体定制的能量束的放射照相成像的方法和装置
公开(公告)号：US07260182B2
公开(公告)日：2007-08-21
申请号：US11419851
申请日：2006-05-23
申请人： Thomas L. Toth , John Eric Tkaczyk , Jiang Hsieh
发明人： Thomas L. Toth , John Eric Tkaczyk , Jiang Hsieh
IPC分类号： G21K3/00 , A61B6/03
CPC分类号： A61B6/4042 , A61B6/032 , A61B6/4035 , A61B6/4488 , G01T1/2985 , G21K1/04 , G21K1/10
摘要： A method and apparatus for tailoring the profile of an x-ray beam for radiographic imaging for a specific subject is disclosed. The invention includes a filter assembly having a pair of filters, each of which may be dynamically controlled by a motor assembly during data acquisition. The filters are positionable in the x-ray beam so as to shape the intensity profile of the x-ray beam. In one exemplary embodiment, the filters are dynamically positioned during CT data acquisition based on the shape of the subject. A method of determining the shape of the subject prior to CT data acquisition is also disclosed.
摘要翻译：公开了一种用于定制用于特定对象的X射线成像的X射线束的轮廓的方法和装置。本发明包括具有一对滤波器的滤波器组件，每个滤波器可以在数据采集期间由电机组件动态地控制。过滤器可以定位在x射线束中，以便形成x射线束的强度分布。在一个示例性实施例中，基于对象的形状，在CT数据采集期间，滤波器被动态地定位。还公开了在CT数据采集之前确定对象的形状的方法。

25. 发明授权

US07212604B2 Multi-layer direct conversion computed tomography detector module 有权
标题翻译：多层直接计算机断层摄影检测模块
公开(公告)号：US07212604B2
公开(公告)日：2007-05-01
申请号：US11171169
申请日：2005-06-29
申请人： John Eric Tkaczyk , James Walter Leblanc , Wen Li , Deborah Joy Walter , Yanfeng Du
发明人： John Eric Tkaczyk , James Walter Leblanc , Wen Li , Deborah Joy Walter , Yanfeng Du
IPC分类号： H01L25/00
CPC分类号： G01T1/2985 , G01T1/241 , G01T1/242 , G01T1/243 , G01T1/249
摘要： A computed tomography detector module is presented. The detector module includes a substrate having a topside and a bottom side. Additionally, the detector module includes a plurality of detector layers disposed on the top side of the substrate in a direction that is substantially orthogonal to the substrate, where each of the plurality of detector layers comprises a direct conversion material configured to absorb radiation, and where each of the plurality of detector layers comprises a first side and a second side. Further, the detector module includes a plurality of pixelated anode contacts is disposed on the first side of each of the plurality of detector layers. Also, the detector module includes a common cathode contact is disposed on the second side of each of the plurality of detector layers.
摘要翻译：提出了一种计算机断层扫描检测器模块。检测器模块包括具有顶侧和底侧的基板。另外，检测器模块包括多个检测器层，该多个检测器层沿基本上垂直于衬底的方向设置在衬底的顶侧上，其中多个检测器层中的每一个包括被配置为吸收辐射的直接转换材料，并且其中多个检测器层中的每一个包括第一侧和第二侧。此外，检测器模块包括多个像素化的阳极触点设置在多个检测器层中的每一个的第一侧上。此外，检测器模块包括公共阴极接触件设置在多个检测器层中的每一个的第二侧上。

26. 发明授权

US06674835B2 Methods and apparatus for estimating a material composition of an imaged object 有权
标题翻译：用于估计成像对象的材料组成的方法和装置
公开(公告)号：US06674835B2
公开(公告)日：2004-01-06
申请号：US09976693
申请日：2001-10-12
申请人： John Patrick Kaufhold , Jeffrey Wayne Eberhard , Dinko E. Gonzalez Trotter , Bernhard Erich Hermann Claus , John Eric Tkaczyk
发明人： John Patrick Kaufhold , Jeffrey Wayne Eberhard , Dinko E. Gonzalez Trotter , Bernhard Erich Hermann Claus , John Eric Tkaczyk
IPC分类号： G01N2306
CPC分类号： A61B6/583 , A61B5/4869 , A61B6/502 , G01N23/04
摘要： A method for estimating a material composition of an imaged object using an imaging system. The imaging system includes a radiation source and a digital detector. The method also includes scanning a plurality of calibration phantoms with varying material composition to acquire a plurality of reference calibration images, estimating an attenuation coefficient thickness product for each pixel in the reference calibration images, and estimating a material composition of a region of interest using the estimated pixelwise coefficient thickness product.
摘要翻译：一种使用成像系统估计成像对象的材料组成的方法。成像系统包括辐射源和数字检测器。该方法还包括用变化的材料组成扫描多个校准体模以获取多个参考校准图像，估计参考校准图像中每个像素的衰减系数厚度乘积，以及使用该方法估计感兴趣区域的材料组成估计像素系数厚度乘积。

27. 发明授权

US06621887B2 Method and apparatus for processing a fluoroscopic image 有权
标题翻译：用于处理透视图像的方法和装置
公开(公告)号：US06621887B2
公开(公告)日：2003-09-16
申请号：US09977474
申请日：2001-10-15
申请人： Douglas Albagli , Brian David Yanoff , John Eric Tkaczyk , George Edward Possin , Ping Xue
发明人： Douglas Albagli , Brian David Yanoff , John Eric Tkaczyk , George Edward Possin , Ping Xue
IPC分类号： G03C900
CPC分类号： H04N5/361 , A61B6/583 , A61B6/585 , H04N5/325
摘要： In one aspect of the invention a method for processing a fluoroscopic image is provided. The method includes scanning an object with an imaging system including at least one radiation source and at least one detector array, acquiring a plurality of dark images to generate a baseline image, acquiring a plurality of lag images subsequent to the baseline image, determining a plurality of parameters of a power law using at least one lag image and at least one baseline image, and performing a log—log extrapolation of the power law including the determined parameters.
摘要翻译：在本发明的一个方面，提供了一种用于处理透视图像的方法。该方法包括用包括至少一个辐射源和至少一个检测器阵列的成像系统扫描对象，获取多个暗图像以生成基线图像，获取基线图像之后的多个滞后图像，确定多个使用至少一个滞后图像和至少一个基线图像的功率律的参数，以及执行包括确定的参数的幂定律的对数对数外推。

28. 发明申请

US20130108019A1 DETECTOR MODULES FOR IMAGING SYSTEMS AND METHODS OF MANUFACTURING 有权
标题翻译：用于成像系统的检测器模块和制造方法
公开(公告)号：US20130108019A1
公开(公告)日：2013-05-02
申请号：US13283373
申请日：2011-10-27
申请人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
发明人： John Eric Tkaczyk , Kevin Matthew Durocher , James Rose , Haochuan Jiang , Abdelaziz Ikhlef , Vladimir Lobastov , Daniel David Harrison
IPC分类号： G01N23/04 , H01L31/18 , G01N23/08 , G01N23/083 , G01T1/16 , G01T1/24
CPC分类号： G01T1/247 , A61B6/037 , A61B6/4233 , G01N2223/419 , G01N2223/507 , G01T1/249 , G01T7/005
摘要： Detector modules for an imaging system and methods of manufacturing are provided. One detector module includes a substrate, a direct conversion sensor material coupled to the substrate and a flexible interconnect electrically coupled to the direct conversion sensor material and configured to provide readout of electrical signals generated by the direct conversion sensor material. The detector module also includes at least one illumination source for illuminating the direct conversion sensor material.
摘要翻译：提供了用于成像系统的检测器模块和制造方法。一个检测器模块包括衬底，耦合到衬底的直接转换传感器材料和电耦合到直接转换传感器材料并被配置为提供由直接转换传感器材料产生的电信号的读出的柔性互连。检测器模块还包括用于照亮直接转换传感器材料的至少一个照明源。

29. 发明授权

US08158951B2 Apparatus and methods for evaluating operation of pixelated detectors 有权
标题翻译：用于评估像素化检测器的操作的装置和方法
公开(公告)号：US08158951B2
公开(公告)日：2012-04-17
申请号：US12365100
申请日：2009-02-03
申请人： Girish Bal , Floribertus Heukensfeldt Jansen , Osnat Zak , Gideon Berlad , Yaron Hefetz , Sergei Dolinsky , Brian D. Yanoff , John Eric Tkaczyk , Yanfeng Du , Ravindra Mohan Manjeshwar , Evren Asma , Qian Hua
发明人： Girish Bal , Floribertus Heukensfeldt Jansen , Osnat Zak , Gideon Berlad , Yaron Hefetz , Sergei Dolinsky , Brian D. Yanoff , John Eric Tkaczyk , Yanfeng Du , Ravindra Mohan Manjeshwar , Evren Asma , Qian Hua
IPC分类号： G01T1/00
CPC分类号： G01T1/249 , G01T1/247
摘要： An apparatus and methods for evaluating the operation of pixelated detectors are provided. The method includes obtaining data values for each of a plurality of pixels of a pixelated detector and determining a data consistency metric for each of the plurality of detector pixels. The method further includes identifying, using the determined data consistency metric, any detector pixels that exceed an acceptance criterion as noisy pixels.
摘要翻译：提供了一种用于评估像素化检测器的操作的装置和方法。该方法包括获得像素化检测器的多个像素中的每一个的数据值，并确定多个检测器像素中的每一个的数据一致性度量。该方法还包括使用所确定的数据一致性度量来识别超过接受标准的任何检测器像素作为噪声像素。

30. 发明申请

US20110049376A1 SEMICONDUCTOR CRYSTAL BASED RADIATION DETECTOR AND METHOD OF PRODUCING THE SAME 有权
标题翻译：基于半导体晶体的辐射探测器及其生产方法
公开(公告)号：US20110049376A1
公开(公告)日：2011-03-03
申请号：US12550921
申请日：2009-08-31
申请人： Minglong Zhang , Yanfeng Du , John Eric Tkaczyk , Zhaoping Wu , Ira Blevis
发明人： Minglong Zhang , Yanfeng Du , John Eric Tkaczyk , Zhaoping Wu , Ira Blevis
IPC分类号： G01T1/24 , H01L31/18
CPC分类号： H01L31/115 , H01L31/1185
摘要： A radiation detector includes a semiconductor crystal having a first surface and a second surface opposite to the first surface, a first electrode electrically coupled with the first surface of the semiconductor crystal to allow current to flow between the first electrode and the crystal, and an insulating layer on the first surface and between the semiconductor crystal and the first electrode so as to create a partially transmissive electrical barrier between the first electrode and the crystal. The insulating layer has a thickness ranging from about 50 nanometers to about 500 nanometers.
摘要翻译：辐射检测器包括具有与第一表面相对的第一表面和第二表面的半导体晶体，与半导体晶体的第一表面电耦合以允许电流在第一电极和晶体之间流动的第一电极，以及绝缘在所述第一表面和所述半导体晶体与所述第一电极之间，以在所述第一电极和所述晶体之间产生部分透射的电屏障。绝缘层的厚度范围为约50纳米至约500纳米。

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