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21. 发明申请

US20060114729A1 Non-volatile semiconductor memory device and memory system using the same 失效
公开(公告)号：US20060114729A1
公开(公告)日：2006-06-01
申请号：US11243985
申请日：2005-10-06
申请人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
发明人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
IPC分类号： G11C7/10 , G11C11/34
CPC分类号： G11C29/785 , G06F11/1008 , G06F11/1068 , G06F2201/81 , G06F2212/2022 , G11C16/10 , G11C16/12 , G11C16/24 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/34 , G11C29/52
摘要： The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite operation, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

22. 发明授权

US06967892B2 Non-volatile semiconductor memory device and memory system using the same 失效
标题翻译：非易失性半导体存储器件和使用其的存储器系统
公开(公告)号：US06967892B2
公开(公告)日：2005-11-22
申请号：US10804094
申请日：2004-03-19
申请人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
发明人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
IPC分类号： G06F11/10 , G11C16/10 , G11C16/12 , G11C16/34 , G11C29/00 , G11C29/34 , G11C29/52 , G11C16/04
CPC分类号： G11C29/785 , G06F11/1008 , G06F11/1068 , G06F2201/81 , G06F2212/2022 , G11C16/10 , G11C16/12 , G11C16/24 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/34 , G11C29/52
摘要： The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.
摘要翻译：可以缩短程序验证和擦除验证操作所需的时间。即使重复执行写入和擦除操作，也可以抑制存储单元的阈值变化。在编程和擦除操作之后，可以根据每个位线上的电位的预充电之后的所有位线同时判断操作，而不改变列地址。在数据重写过程中，通过改变数据寄存器中的数据，对数据一次正确写入的存储单元不会影响重写操作。

23. 发明申请

US20050237829A1 Non-volatile semiconductor memory device 有权
标题翻译：非易失性半导体存储器件
公开(公告)号：US20050237829A1
公开(公告)日：2005-10-27
申请号：US11104599
申请日：2005-04-13
申请人： Hiroshi Nakamura , Tomoharu Tanaka
发明人： Hiroshi Nakamura , Tomoharu Tanaka
IPC分类号： G11C16/06 , G11C7/00 , G11C16/02 , G11C16/04 , G11C16/10 , G11C16/30
CPC分类号： G11C16/0483 , G11C16/10 , G11C16/30
摘要： A non-volatile semiconductor memory device comprises a memory cell array of data-rewritable non-volatile memory cells or memory cell units containing the memory cells, and a plurality of word lines each commonly connected to the memory cells on the same row in the memory cell array. In write pulse applying during data writing, a high voltage for writing is applied to a selected word line, and an intermediate voltage for writing is applied to at least two of non-selected word lines. The beginning of charging a first word line located between the selected word line and a source line to a first intermediate voltage for writing is followed by the beginning of charging a second word line located between the selected word line and a bit line contact to a second intermediate voltage for writing.
摘要翻译：非易失性半导体存储器件包括数据可重写非易失性存储器单元的存储单元阵列或包含存储单元的存储单元单元，以及多个字线，每个字线共同连接到存储器中相同行上的存储器单元单元格阵列。在数据写入期间的写入脉冲施加中，写入用的高电压被施加到所选择的字线，并且用于写入的中间电压被施加到至少两个未选择的字线。将位于所选择的字线和源极线之间的第一字线充电到用于写入的第一中间电压的开始之后，将位于所选择的字线和位线接触之间的第二字线开始充电到第二写入中间电压。

24. 发明授权

US06344996B2 Semiconductor memory device 有权
标题翻译：半导体存储器件
公开(公告)号：US06344996B2
公开(公告)日：2002-02-05
申请号：US09768588
申请日：2001-01-25
申请人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
发明人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
IPC分类号： G11C1604
CPC分类号： G11C16/0483 , G11C7/1048 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C11/565 , G11C16/26 , G11C2211/5642
摘要： A semiconductor memory device comprises memory cells, a bitline connected to the memory cells, a read circuit including a precharge circuit, and a first transistor connected between the bitline and the read circuit, wherein a first voltage is applied to a gate of the first transistor when the precharge circuit precharges the bitline, and a second voltage which is different from the first voltage is applied to the gate of the first transistor when the read circuit senses a change in a voltage of the bitline.
摘要翻译：半导体存储器件包括存储器单元，连接到存储器单元的位线，包括预充电电路的读取电路和连接在位线和读取电路之间的第一晶体管，其中第一电压施加到第一晶体管的栅极当预充电电路对位线进行预充电，并且当读取电路感测到位线的电压变化时，与第一电压不同的第二电压被施加到第一晶体管的栅极。

25. 发明授权

US06208573B1 Semiconductor memory device 有权
标题翻译：半导体存储器件
公开(公告)号：US06208573B1
公开(公告)日：2001-03-27
申请号：US09504903
申请日：2000-02-16
申请人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
发明人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
IPC分类号： G11C700
CPC分类号： G11C16/0483 , G11C7/1048 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C11/565 , G11C16/26 , G11C2211/5642
摘要： A semiconductor memory device comprises memory cells, a bitline connected to the memory cells, a read circuit including a precharge circuit, and a first transistor connected between the bitline and the read circuit, wherein a first voltage is applied to a gate of the first transistor when the precharge circuit precharges the bitline, and a second voltage which is different from the first voltage is applied to the gate of the first transistor when the read circuit senses a change in a voltage of the bitline.
摘要翻译：半导体存储器件包括存储器单元，连接到存储器单元的位线，包括预充电电路的读取电路和连接在位线和读取电路之间的第一晶体管，其中第一电压施加到第一晶体管的栅极当预充电电路对位线进行预充电，并且当读取电路感测到位线的电压变化时，与第一电压不同的第二电压被施加到第一晶体管的栅极。

26. 发明授权

US6134140A Nonvolatile semiconductor memory device with soft-programming to adjust erased state of memory cells 失效
标题翻译：具有软编程的非易失性半导体存储器件来调整存储器单元的擦除状态
公开(公告)号：US6134140A
公开(公告)日：2000-10-17
申请号：US78137
申请日：1998-05-14
申请人： Tomoharu Tanaka , Hiroshi Nakamura , Ken Takeuchi , Riichiro Shirota , Fumitaka Arai , Susumu Fujimura
发明人： Tomoharu Tanaka , Hiroshi Nakamura , Ken Takeuchi , Riichiro Shirota , Fumitaka Arai , Susumu Fujimura
IPC分类号： G11C7/00 , G11C11/56 , G11C16/34 , G11C16/04
CPC分类号： G11C16/0483 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/3404 , G11C16/3409 , G11C16/344 , G11C16/3445 , G11C16/345 , G11C16/3454 , G11C16/3459 , G11C16/3463 , G11C2211/5621
摘要： A NAND cell unit includes a plurality of memory cells which are connected in series. An erase operation is effected on all memory cells. Then, a soft-program voltage, which is opposite in polarity to the erase voltage applied in the erase operation, is applied to all memory cells, thereby setting all memory cells out of an over-erased state. Thereafter, a program voltage of 20V is applied to the control gate of any selected one of the memory cells, 0V is applied to the control gates of the two memory cells provided adjacent to the selected memory cell, and 11V is applied to the control gates of the remaining memory cells. Data is thereby programmed into the selected memory cell. The time for which the program voltage is applied to the selected memory cell is adjusted in accordance with the data to be programmed into the selected memory cell. Hence, data "0" can be correctly programmed into the selected memory cell, multi-value data can be read from any selected memory cell at high speed.
摘要翻译： NAND单元单元包括串联连接的多个存储单元。对所有存储单元进行擦除操作。然后，将与在擦除操作中施加的擦除电压极性相反的软编程电压施加到所有存储单元，从而将所有存储单元设置为过擦除状态。此后，将20V的编程电压施加到任何一个存储单元的控制栅极，将0V施加到与所选存储单元相邻设置的两个存储单元的控制栅极，并将11V施加到控制栅极的剩余存储单元。因此数据被编程到所选择的存储单元中。根据要编程到所选择的存储单元中的数据来调整对所选存储单元施加编程电压的时间。因此，可以将数据“0”正确地编程到所选择的存储单元中，可以从任何选择的存储单元高速读取多值数据。

27. 发明授权

US06064611A Semiconductor memory device 失效
标题翻译：半导体存储器件
公开(公告)号：US06064611A
公开(公告)日：2000-05-16
申请号：US055216
申请日：1998-04-06
申请人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
发明人： Tomoharu Tanaka , Hiroshi Nakamura , Toru Tanzawa
IPC分类号： G11C16/06 , G11C11/56 , G11C16/02 , G11C7/00
CPC分类号： G11C16/0483 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C11/565 , G11C16/26 , G11C2211/5642 , G11C7/1048
摘要： A semiconductor memory device includes memory cells, a bitline connected to the memory cells, a read circuit including a precharge circuit, and a first transistor connected between the bitline and the read circuit, wherein a first voltage is applied to a gate of the first transistor when the precharge circuit precharges the bitline, and a second voltage which is different from the first voltage is applied to the gate of the first transistor when the read circuit senses a change in a voltage of the bitline.
摘要翻译：半导体存储器件包括存储器单元，连接到存储单元的位线，包括预充电电路的读取电路和连接在位线和读取电路之间的第一晶体管，其中第一电压施加到第一晶体管的栅极当预充电电路对位线进行预充电，并且当读取电路感测到位线的电压变化时，与第一电压不同的第二电压被施加到第一晶体管的栅极。

28. 发明授权

US5909399A Non-volatile semiconductor memory device and memory system using the same 失效
标题翻译：非易失性半导体存储器件和使用其的存储器系统
公开(公告)号：US5909399A
公开(公告)日：1999-06-01
申请号：US100330
申请日：1998-06-19
申请人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
发明人： Tomoharu Tanaka , Masaki Momodomi , Hideo Kato , Hiroto Nakai , Yoshiyuki Tanaka , Riichiro Shirota , Seiichi Aritome , Yasuo Itoh , Yoshihisa Iwata , Hiroshi Nakamura , Hideko Odaira , Yutaka Okamoto , Masamichi Asano , Kaoru Tokushige
IPC分类号： G06F11/10 , G11C16/10 , G11C16/12 , G11C16/24 , G11C16/34 , G11C29/00 , G11C29/34 , G11C29/52 , G11C13/00
CPC分类号： G11C29/785 , G06F11/1008 , G11C16/10 , G11C16/12 , G11C16/24 , G11C16/3436 , G11C16/344 , G11C16/3454 , G11C29/34 , G11C29/52 , G06F11/1068 , G06F2201/81 , G06F2212/2022
摘要： The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.
摘要翻译：可以缩短程序验证和擦除验证操作所需的时间。即使重复执行写入和擦除操作，也可以抑制存储单元的阈值变化。在编程和擦除操作之后，可以根据每个位线上的电位的预充电之后的所有位线同时判断操作，而不改变列地址。在数据重写过程中，通过改变数据寄存器中的数据，对数据一次正确写入的存储单元不会影响重写操作。

29. 发明申请

US20110188315A1 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING NON-SELECTED WORD LINES ADJACENT TO SELECTED WORD LINES BEING CHARGED AT DIFFERENT TIMING FOR PROGRAM DISTURB CONTROL 有权
标题翻译：具有非选定字线的非易失性半导体存储器件，与选择的字线相连，在不同的时序上对程序干扰控制进行充电
公开(公告)号：US20110188315A1
公开(公告)日：2011-08-04
申请号：US13079134
申请日：2011-04-04
申请人： Hiroshi Nakamura , Tomoharu Tanaka
发明人： Hiroshi Nakamura , Tomoharu Tanaka
IPC分类号： G11C16/04
CPC分类号： G11C16/0483 , G11C16/10 , G11C16/30
摘要： A non-volatile semiconductor memory device includes a memory cell array of data-rewritable non-volatile memory cells or memory cell units containing the memory cells, and a plurality of word lines each commonly connected to the memory cells on the same row in the memory cell array. In write pulse applying during data writing, a high voltage for writing is applied to a selected word line, and an intermediate voltage for writing is applied to at least two of non-selected word lines. The beginning of charging a first word line located between the selected word line and a source line to a first intermediate voltage for writing is followed by the beginning of charging a second word line located between the selected word line and a bit line contact to a second intermediate voltage for writing.
摘要翻译：非挥发性半导体存储器件包括数据可重写非易失性存储器单元的存储单元阵列或包含存储单元的存储单元单元，以及多个字线，每个字线共同连接到存储器中相同行上的存储器单元单元格阵列。在数据写入期间的写入脉冲施加中，写入用的高电压被施加到所选择的字线，并且用于写入的中间电压被施加到至少两个未被选择的字线。将位于所选择的字线和源极线之间的第一字线充电到用于写入的第一中间电压的开始之后，将位于所选择的字线和位线接触之间的第二字线开始充电到第二写入中间电压。

30. 发明申请

US20100118604A1 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING NON-SELECTED WORD LINES ADJACENT TO SELECTED WORD LINES BEING CHARGED AT DIFFERENT TIMING FOR PROGRAM DISTURB CONTROL 有权
标题翻译：非易失性半导体存储器件，具有非选择的字线，与选定的字线相连，在不同的时序上为程序干扰控制
公开(公告)号：US20100118604A1
公开(公告)日：2010-05-13
申请号：US12689786
申请日：2010-01-19
申请人： Hiroshi Nakamura , Tomoharu Tanaka
发明人： Hiroshi Nakamura , Tomoharu Tanaka
IPC分类号： G11C16/04 , G11C7/00
CPC分类号： G11C16/0483 , G11C16/10 , G11C16/30
摘要： A non-volatile semiconductor memory device includes a memory cell array of data-rewritable non-volatile memory cells or memory cell units containing the memory cells, and a plurality of word lines each commonly connected to the memory cells on the same row in the memory cell array. In write pulse applying during data writing, a high voltage for writing is applied to a selected word line, and an intermediate voltage for writing is applied to at least two of non-selected word lines. The beginning of charging a first word line located between the selected word line and a source line to a first intermediate voltage for writing is followed by the beginning of charging a second word line located between the selected word line and a bit line contact to a second intermediate voltage for writing.
摘要翻译：非挥发性半导体存储器件包括数据可重写非易失性存储器单元的存储单元阵列或包含存储单元的存储单元单元，以及多个字线，每个字线共同连接到存储器中相同行上的存储器单元单元格阵列。在数据写入期间的写入脉冲施加中，写入用的高电压被施加到所选择的字线，并且用于写入的中间电压被施加到至少两个未选择的字线。将位于所选择的字线和源极线之间的第一字线充电到用于写入的第一中间电压的开始之后，将位于所选择的字线和位线接触之间的第二字线开始充电到第二写入中间电压。

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