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    • 29. 发明申请
    • RUN-TIME INSTRUMENTATION DIRECTED SAMPLING
    • 运行时间仪表指示采样
    • US20130246741A1
    • 2013-09-19
    • US13422532
    • 2012-03-16
    • Charles W. Gainey, JR.Marcel M. MitranChung-Lung K. ShumKevin Stoodley
    • Charles W. Gainey, JR.Marcel M. MitranChung-Lung K. ShumKevin Stoodley
    • G06F9/312
    • G06F11/3466G06F9/3005G06F11/3636G06F11/3644G06F11/3648
    • Embodiments of the invention relate to implementing run-time instrumentation directed sampling. An aspect of the invention includes fetching a run-time instrumentation next (RINEXT) instruction from an instruction stream. The instruction stream includes the RINEXT instruction followed by a next sequential instruction (NSI) in program order. The method further includes executing the RINEXT instruction by a processor. The executing includes determining whether a current run-time instrumentation state enables setting a sample point for reporting run-time instrumentation information during program execution. Based on the current run-time instrumentation state enabling setting the sample point, the NSI is a sample instruction for causing a run-time instrumentation event. Based on executing the NSI sample instruction, the run-time instrumentation event causes recording of run-time instrumentation information into a run-time instrumentation program buffer as a reporting group.
    • 本发明的实施例涉及实现运行时仪表定向采样。 本发明的一个方面包括从指令流获取运行时仪器下一个(RINEXT)指令。 指令流包括RINEXT指令,后面是程序顺序的下一个顺序指令(NSI)。 该方法还包括由处理器执行RINEXT指令。 该执行包括确定当前运行时仪表状态是否能够在程序执行期间设置用于报告运行时仪表信息的采样点。 根据当前的运行时仪器状态设置采样点,NSI是一个用于引起运行时仪表事件的示例指令。 基于执行NSI示例指令,运行时仪表事件将运行时仪表信息记录到作为报告组的运行时仪表程序缓冲区中。