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    • 21. 发明授权
    • Mirror assembly for an exposure apparatus
    • 用于曝光设备的镜组件
    • US09323157B2
    • 2016-04-26
    • US14116634
    • 2012-06-13
    • Alton H. PhillipsDouglas C. WatsonLorri L. Watson
    • Alton H. PhillipsDouglas C. Watson
    • G03B27/54G03F7/20G02B7/18
    • G03F7/7015G02B7/1815
    • A mirror assembly (332) for directing a beam (28) from an illumination source (26) to a reticle (36) includes a mirror (352) and a back plate (350). The mirror (352) includes a mirror body (352A) that defines a reflective first surface (352B) that directs the beam (28), a mirror mounting region (370), a mirror perimeter region (372) that encircles the mirror mounting region (370), and mirror slot (374) that separates the mirror perimeter region (372) from the mirror mounting region (370). The back plate (350) retains and engages the mirror mounting region (370) of the mirror (352) with the mirror perimeter region (372) spaced apart from the back plate (350). Further, the mirror body (352A) can include a second surface (352C) that is substantially opposite the first surface (352B), and the mirror mounting region (370) extends between the second surface (352C) to near the first surface (352B). Further, the mirror slot (374) extends from the second surface (352C) to near the first surface (352B).
    • 用于将光束(28)从照明源(26)引导到掩模版(36)的反射镜组件(332)包括反射镜(352)和背板(350)。 反射镜(352)包括:镜体(352A),其限定引导光束(28)的反射第一表面(352B);反射镜安装区域(370);镜面周边区域(372),其包围反射镜安装区域 (370)和将反射镜周边区域(372)与反射镜安装区域(370)分离的反射镜槽(374)。 背板(350)将反射镜(352)的反射镜安装区域(370)保持并与反射镜周边区域(372)与后板(350)间隔开。 此外,镜体(352A)可以包括与第一表面(352B)大致相对的第二表面(352C),并且镜安装区域(370)在第二表面(352C)之间延伸到第一表面(352B)附近 )。 此外,镜槽(374)从第二表面(352C)延伸到第一表面(352B)附近。
    • 22. 发明授权
    • Exposure method and device manufacturing method including selective deformation of a mask
    • 包括掩模选择性变形的曝光方法和装置制造方法
    • US09304385B2
    • 2016-04-05
    • US12560760
    • 2009-09-16
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • G03B27/32G03F1/00G03F7/20
    • G03B27/32G03F1/144G03F1/50G03F7/70783G03F7/70875
    • An exposure method that uses a substrate (M) held by a holding member (28) to perform exposure processing, comprising a holding process, which holds a prescribed region (AR3) of the substrate as the holding region by means of the holding member, and a deformation process, which selectively deforms one side of the holding region of the substrate held by the holding process with respect to the other side. According to the present invention, a prescribed region of the substrate is held as a holding region by means of a holding member, and one side of the holding region of said held substrate is selectively deformed with respect to the other side, so it is possible to selectively eliminate the nonlinear deformation components attributable to holding of the substrate with respect to one side from among the two sides of the substrate using the holding region as a reference. Since it is possible to put the pattern projected via the substrate into a linearly correctable status, it is possible to reduce warping of the pattern.
    • 一种使用由保持构件(28)保持的基板(M)进行曝光处理的曝光方法,包括通过保持构件保持基板的规定区域(AR3)作为保持区域的保持工序, 以及变形过程,其选择性地使通过保持过程保持的基板的保持区域的一侧相对于另一侧变形。 根据本发明,通过保持构件将衬底的规定区域保持为保持区域,并且所述保持衬底的保持区域的一侧相对于另一侧选择性地变形,因此可能 以使用保持区域作为基准来选择性地消除归因于基板相对于基板的两侧之间的一侧的保持的非线性变形分量。 由于可以将通过基板投射的图案置于线性可校正状态,可以减少图案的翘曲。
    • 23. 发明申请
    • EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, AND MASK
    • 曝光方法,装置制造方法和掩模
    • US20100097588A1
    • 2010-04-22
    • US12560760
    • 2009-09-16
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • Alton H. PhillipsDouglas C. WatsonHiromitsu YoshimotoYusaku Uehara
    • G03B27/42G03B27/32G03F1/00
    • G03B27/32G03F1/144G03F1/50G03F7/70783G03F7/70875
    • An exposure method that uses a substrate (M) held by a holding member (28) to perform exposure processing, comprising a holding process, which holds a prescribed region (AR3) of the substrate as the holding region by means of the holding member, and a deformation process, which selectively deforms one side of the holding region of the substrate held by the holding process with respect to the other side. According to the present invention, a prescribed region of the substrate is held as a holding region by means of a holding member, and one side of the holding region of said held substrate is selectively deformed with respect to the other side, so it is possible to selectively eliminate the nonlinear deformation components attributable to holding of the substrate with respect to one side from among the two sides of the substrate using the holding region as a reference. Since it is possible to put the pattern projected via the substrate into a linearly correctable status, it is possible to reduce warping of the pattern.
    • 一种使用由保持构件(28)保持的基板(M)进行曝光处理的曝光方法,包括通过保持构件保持基板的规定区域(AR3)作为保持区域的保持工序, 以及变形过程,其选择性地使通过保持过程保持的基板的保持区域的一侧相对于另一侧变形。 根据本发明,通过保持构件将衬底的规定区域保持为保持区域,并且所述保持衬底的保持区域的一侧相对于另一侧选择性地变形,因此可能 以使用保持区域作为基准来选择性地消除归因于基板相对于基板的两侧之间的一侧的保持的非线性变形分量。 由于可以将通过基板投射的图案置于线性可校正状态,可以减少图案的翘曲。
    • 27. 发明申请
    • Six Degree-of-Freedom Stage Apparatus
    • 六自由度舞台装置
    • US20070267995A1
    • 2007-11-22
    • US11750604
    • 2007-05-18
    • Michael B. BinnardYoichi AraiDouglas C. WatsonAlton H. PhillipsScott Coakley
    • Michael B. BinnardYoichi AraiDouglas C. WatsonAlton H. PhillipsScott Coakley
    • B64C17/06
    • G03F7/70716G03F7/70766
    • Methods and apparatus for providing a fine stage with up to six degrees of freedom are disclosed. According to one aspect of the present invention, a stage apparatus includes a first stage assembly, a second stage assembly, and a countermass arrangement. The first stage assembly including a first component of a first actuator, and supports a second actuator arrangement. The second stage assembly is supported over the first stage assembly such that the second actuator arrangement drives the second stage assembly along a vertical axis. The countermass arrangement includes a second component of the first actuator. The first component cooperates with the second component to allow the first stage assembly to move relative to a first horizontal axis. The countermass arrangement absorbs reaction forces associated with the first and second stage assemblies.
    • 公开了提供高达六个自由度的精细台阶的方法和装置。 根据本发明的一个方面,一种舞台装置包括第一舞台组件,第二舞台组件和反对质量装置。 第一级组件包括第一致动器的第一部件,并且支撑第二致动器装置。 第二级组件被支撑在第一级组件上,使得第二致动器装置沿着垂直轴驱动第二级组件。 反对质量布置包括第一致动器的第二部件。 第一部件与第二部件配合以允许第一级组件相对于第一水平轴线移动。 反作用装置吸收与第一和第二级组件相关联的反作用力。