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    • 25. 发明授权
    • Systems and methods for using non-contact voltage sensors and corona discharge guns
    • 使用非接触式电压传感器和电晕放电枪的系统和方法
    • US07110238B1
    • 2006-09-19
    • US11154991
    • 2005-06-16
    • Zhiwei (Steve) XuJianou ShiShiyou PeiMahmood MirzaaghaeianJeffrey A. Rzepiela
    • Zhiwei (Steve) XuJianou ShiShiyou PeiMahmood MirzaaghaeianJeffrey A. Rzepiela
    • H01H47/00
    • G01N27/002
    • A method and a system for calibrating the work function of a non-contact voltage sensor are provided. The method includes preparing a reference sample to have a stable work function, measuring a voltage of the sample using a non-contact voltage sensor, and determining a work function correction factor of the sensor from the measured voltage. In turn, the calibrated work function may be used to adjust voltages of substrates measured by the sensor. A corona gun which includes a first electrode and one or more conductive rods is provided. In some embodiments, the conductive rods may be angled between 0 and 90 degrees with respect to a first electrode sidewall and/or be concentrically arranged less than 90 degrees from each other. In addition or alternatively, the corona gun may be adapted to alter its length and/or include a second electrode partially inset within a space surrounded by the first electrode.
    • 提供了一种用于校准非接触式电压传感器的功能的方法和系统。 该方法包括制备参考样品以具有稳定的功函数,使用非接触电压传感器测量样品的电压,以及根据测量的电压确定传感器的功函数校正因子。 反过来,校准的功函数可以用于调节由传感器测量的衬底的电压。 提供包括第一电极和一个或多个导电棒的电晕枪。 在一些实施例中,导电棒相对于第一电极侧壁可以在0度和90度之间成角度和/或彼此同心布置成小于90度。 另外或替代地,电晕枪可以适于改变其长度和/或包括在由第一电极包围的空间内部分插入的第二电极。
    • 28. 发明申请
    • Methods and systems for determining one or more properties of a specimen
    • 用于确定样品的一个或多个性质的方法和系统
    • US20050206402A1
    • 2005-09-22
    • US11078669
    • 2005-03-10
    • Jianou ShiJeffrey RzepielaShiyou PeiZhiwei XuJohn Alexander
    • Jianou ShiJeffrey RzepielaShiyou PeiZhiwei XuJohn Alexander
    • H01L21/66G01R31/26G01R31/311
    • G01R31/311G01R31/2648
    • Various methods and systems for determining one or more properties of a specimen are provided. One system for determining a property of a specimen is configured to illuminate a specimen with different wavelengths of light substantially simultaneously. The different wavelengths of light are modulated at substantially the same frequency. The system is also configured to perform at least two measurements on the specimen. A minority carrier diffusion length of the specimen may be determined from the measurements and absorption coefficients of the specimen at the different wavelengths. Another system for detecting defects on a specimen is configured to deposit a charge at multiple locations on an upper surface of the specimen. This system is also configured to measure a vibration of a probe at the multiple locations. Defects may be detected on the specimen using a two-dimensional map of the specimen generated from the measured surface voltages.
    • 提供了用于确定样本的一个或多个属性的各种方法和系统。 用于确定样本特性的一个系统被配置为基本上同时照射具有不同波长的光的样本。 不同波长的光以基本上相同的频率被调制。 该系统还被配置为对样本进行至少两次测量。 样品的少数载流子扩散长度可以根据不同波长的样品的测量和吸收系数来确定。 用于检测样本上的缺陷的另一系统被配置为在样本的上表面上的多个位置沉积电荷。 该系统还被配置为测量在多个位置处的探针的振动。 可以使用从测量的表面电压产生的样本的二维图来在样本上检测缺陷。