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    • 21. 发明申请
    • Probe card and method for assembling the same
    • 探针卡及其组装方法
    • US20090051377A1
    • 2009-02-26
    • US11892431
    • 2007-08-23
    • Cheng-Yi Wang
    • Cheng-Yi Wang
    • G01R1/073G01R31/02H01R43/00
    • G01R3/00G01R1/07342G01R1/0735Y10T29/532
    • A probe card and a method for assembling the same, the probe card comprises a base plate, a plurality of probes, a fixing ring, and a fixing member. The fixing ring is provided with a hole and the outer wall of its bottom is used for connecting the probes. The fixing ring is spaced from the probes in a distance so that when the fixing ring is inserted through a hole of the base plate, the terminal ends of main bodies of the probes are located under the hole while the anterior ends are electronically connected with the base plate or outer circuit. The fixing member is inserted through the hole of the fixing ring, the terminal end of which protrudes out of the hole so that a micro strip line is formed between the terminal end of the fixing member and the terminal ends of the probes.
    • 探针卡及其组装方法,探针卡包括基板,多个探针,固定环和固定部件。 固定环设有孔,底部的外壁用于连接探针。 固定环与探针间隔一定距离,使得当固定环插入基板的孔时,探头主体的末端位于孔的下方,而前端与 基板或外部电路。 固定构件通过固定环的孔插入,其终端突出孔,使得在固定构件的末端和探针的末端之间形成微带线。
    • 23. 发明申请
    • SUPPLY SYSTEM AND INJECTION-HEAD STRUCTURE THEREOF
    • 供应系统及其注射头结构
    • US20090262165A1
    • 2009-10-22
    • US12197160
    • 2008-08-22
    • Cheng-Yi WangWan-Wen ChiuKuo-Hua WuChen-Chu TsaiChao-Kai Cheng
    • Cheng-Yi WangWan-Wen ChiuKuo-Hua WuChen-Chu TsaiChao-Kai Cheng
    • B41J2/06
    • B41J2/145B41J2/175B41J2/19B41J2202/20
    • A supply system capable of providing a working fluid is provided. The supply system includes an access device, a first energizer, a second energizer, a third energizer and an output device. The access device utilized to access the working fluid includes a connecting port. The first energizer provides a first energy to energize the working fluid, thereby expelling the bubbles from the working fluid. The second energizer provides a second energy to energize the working fluid received in the access device, thereby expelling the working fluid through the connecting port of the access device. The output device is connected to the access device, thereby receiving and outputting the working fluid. The third energizer provides a third energy to heat the working fluid passing through the access device and the output device.
    • 提供了能够提供工作流体的供应系统。 供电系统包括一个接入装置,一个第一激发器,一个第二激发器,一个第三激发器和一个输出装置。 用于接近工作流体的进入装置包括连接端口。 第一激发器提供第一能量来激励工作流体,从而从工作流体排出气泡。 第二激发器提供第二能量以激励接入设备中接收的工作流体,从而通过接入设备的连接端口排出工作流体。 输出装置与接入装置连接,从而接收并输出工作流体。 第三激发器提供第三能量来加热通过进入装置和输出装置的工作流体。
    • 25. 发明申请
    • PROBING APPARATUS FOR INTEGRATED CIRCUIT TESTING
    • 用于集成电路测试的探测器
    • US20120013358A1
    • 2012-01-19
    • US12836241
    • 2010-07-14
    • Cheng-Yi WANG
    • Cheng-Yi WANG
    • G01R1/06
    • G01R1/06772G01R1/06766
    • A probing apparatus for integrated circuit testing at least includes a substrate, a probe body and a bypass capacitor. The substrate is fixed in an external conductor after an internal conductor is filled with an insulating material. One end of the substrate has a section, so that both the internal conductor and the insulating material are exposed on the section. One end of the probe body is electrically connected to the internal conductor exposed on the section. A tip end of the probe body is used for contacting a pad of an element to be tested. The bypass capacitor has a first electrode terminal and a second electrode terminal. The first electrode terminal is electrically connected to the probe body, and the second electrode terminal is connected to the external conductor at the end of the substrate.
    • 用于集成电路测试的探测装置至少包括衬底,探针体和旁路电容器。 在用绝缘材料填充内部导体之后,将基板固定在外部导体中。 衬底的一端具有一部分,使得内部导体和绝缘材料都暴露在该部分上。 探头主体的一端电连接到暴露在该部分上的内部导体。 探针体的尖端用于接触要测试的元件的焊盘。 旁路电容器具有第一电极端子和第二电极端子。 第一电极端子电连接到探针体,并且第二电极端子在基板的端部连接到外部导体。