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21. 发明申请

US20220229031A1 TITRATION MODULE, TEST APPARATUS AND METHOD FOR MEASURING TITRATION CONTACT ANGLES 有权
公开(公告)号：US20220229031A1
公开(公告)日：2022-07-21
申请号：US17522998
申请日：2021-11-10
申请人： King Yuan Electronics Co., Ltd.
发明人： Chieh-Wen LU , Yu-Hao CIOU , Po-Ting LAI , Kuang-Hsiang LIU
IPC分类号： G01N31/16 , G01B7/30 , G01B11/06
摘要： A titration module includes a base, at least one titration unit, a contact angle measuring module, and a computing unit. The at least one titration unit is disposed above the base for titrating a globule onto a device under test. The contact angle measurement module is disposed above the base for measuring a first height and a first radius of the globule. The computing unit can calculate a second radius according to the first height and the first radius, and can calculate a contact angle of the globule according to the first height and the second radius. Also disclosed are a test apparatus, and a method for measuring titration contact angles.

22. 发明授权

US08275568B2 Semiconductor test system with self-inspection of electrical channel 有权
标题翻译：半导体测试系统具有电气通道的自检功能
公开(公告)号：US08275568B2
公开(公告)日：2012-09-25
申请号：US12457815
申请日：2009-06-23
申请人： Chung Lung Chang
发明人： Chung Lung Chang
IPC分类号： G01R27/28 , G01R31/26 , G01R31/02
CPC分类号： G01R31/024 , G01R31/2889 , G01R35/00
摘要： A semiconductor test system with self-inspection of an electrical channel is disclosed, which includes a tester head, a plurality of parameter detection units and a self-inspection controller. The tester head includes a plurality of pin electronics cards inserted therein, in which the plurality of pin electronics cards contain a plurality of power channels, a plurality of I/O channels and a plurality of drive channels. The self-inspection controller outputs different inspection signals respectively to each power channel, each I/O channel and each drive channel. Then, the plurality of parameter detection units detect response signals respectively produced by each power channel, each I/O channel and each drive channel in response to the inspection signals respectively received thereby, and the response signals are judged by the self-inspection controller. Thus, the invention is capable of self-inspecting each electrical channel if it is in a normal condition, either in an open or short circuit, or if there exists a leakage condition.
摘要翻译：公开了一种具有电通道自检的半导体测试系统，其包括测试头，多个参数检测单元和自检控制器。测试器头包括插入其中的多个引脚电子卡，其中多个引脚电子卡包含多个功率通道，多个I / O通道和多个驱动通道。自检控制器分别向每个电源通道，每个I / O通道和每个驱动通道输出不同的检查信号。然后，多个参数检测单元响应于由其分别接收到的检查信号，检测由各个功率信道，每个I / O通道和每个驱动通道分别产生的响应信号，并且响应信号由自检控制器判断。因此，本发明能够在开路或短路中处于正常状态时，或者如果存在泄漏状况，则能够对每个电气通道进行自检。

23. 发明申请

US20120212249A1 HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF 审中-公开
标题翻译：硬和耐磨探头及其制造方法
公开(公告)号：US20120212249A1
公开(公告)日：2012-08-23
申请号：US13207348
申请日：2011-08-10
申请人： FONG JAY CHEN , CHIU-FANG CHANG
发明人： FONG JAY CHEN , CHIU-FANG CHANG
IPC分类号： G01R1/067 , B22F3/10 , B22F3/24 , H01B1/02
CPC分类号： G01R3/00 , B22F2998/10 , C22C29/08 , B22F5/006 , B22F3/162
摘要： The present invention relates to a hard and wear-resisting probe and manufacturing method thereof, and particularly relates to a hard and wear-resisting probe comprising tungsten steel (WC) and manufacturing method thereof. This hard and wear-resisting probe is substantially made of a tungsten steel with high hardness and wear resistance so that the probe is difficult to be worn and the lifetime of the probe is longer. Furthermore, the frequencies for changing the probe and the cost of testing are reduced, and the testing efficiency can be improved.
摘要翻译：本发明涉及耐磨耐磨探头及其制造方法，特别涉及包含钨钢（WC）的硬质耐磨探头及其制造方法。该硬质耐磨探头基本上由具有高硬度和耐磨性的钨钢制成，使得探针难以磨损，并且探针的寿命更长。此外，用于改变探头的频率和测试成本降低，并且可以提高测试效率。

24. 发明申请

US20120158758A1 Comparison device and method for comparing test pattern files of a wafer tester 审中-公开
标题翻译：用于比较晶片测试仪的测试图案文件的比较装置和方法
公开(公告)号：US20120158758A1
公开(公告)日：2012-06-21
申请号：US12929839
申请日：2011-02-18
申请人： Fu-Tai CHEN
发明人： Fu-Tai CHEN
IPC分类号： G06F17/30
CPC分类号： G01R31/31932
摘要： A comparison device for comparing test pattern files of a wafer tester includes a storage unit and a processing unit. The comparison device stores a first to-be-compared file and a second to-be-compared file into the storage unit. The first to-be-compared file and the second to-be-compared file are text files respectively. The processing unit reads the first to-be-compared file and the second to-be-compared file from the storage unit to process and executes comparison operation, so as to generate a comparison result. The comparison operation is to compare the words in a first section of the first to-be-compared file with the words in a second section of the second to-be-compared file in a one-to-one manner.
摘要翻译：用于比较晶片测试仪的测试图案文件的比较装置包括存储单元和处理单元。比较装置将第一待比较文件和第二待比较文件存储到存储单元中。第一个待比较文件和第二个待比较文件分别是文本文件。处理单元从存储单元读取第一待比较文件和第二待比较文件，以处理并执行比较操作，以便生成比较结果。比较操作是将第一待比较文件的第一部分中的单词与第二待比较文件的第二部分中的单词以一对一的方式进行比较。

25. 发明申请

US20120136614A1 Wafer inspection system 审中-公开
标题翻译：晶圆检查系统
公开(公告)号：US20120136614A1
公开(公告)日：2012-05-31
申请号：US13064163
申请日：2011-03-09
申请人： Ta Kang Liu , Ming Hsien Lee
发明人： Ta Kang Liu , Ming Hsien Lee
IPC分类号： G06F19/00
CPC分类号： G01R31/2831 , G01R1/07385 , G01R31/2889 , G01R31/2891
摘要： A wafer inspection system for inspecting a wafer comprises a platform, a probe card, a illuminator, a test server, at least one image processing device, a control circuit board, at least a test circuit board, a load board connected to the control circuit board and the at least a test circuit board, at least an image card, and at least a relay board. The probe card includes an opening hole and a plurality of probes for contacting the wafer to transmit and receive electrical signals. The illuminator illuminates on the wafer through the opening hole. The test server is controlled to execute test procedure and data process. The test circuit board transmits test signals and performs a determination on the received result signals. The relay board is connected to the probe card and the load board for switching the direction of data flow.
摘要翻译：用于检查晶片的晶片检查系统包括平台，探针卡，照明器，测试服务器，至少一个图像处理设备，控制电路板，至少测试电路板，连接到控制电路的负载板板和至少一个测试电路板，至少一个图像卡和至少一个继电器板。探针卡包括开孔和用于接触晶片以发送和接收电信号的多个探针。照明器通过开孔照亮晶片。控制测试服务器执行测试过程和数据处理。测试电路板发送测试信号并对接收到的结果信号进行确定。继电器板连接到探针卡和负载板，用于切换数据流的方向。

26. 发明授权

US07924039B2 Self-cleaning package testing socket 失效
标题翻译：自洁包装测试插座
公开(公告)号：US07924039B2
公开(公告)日：2011-04-12
申请号：US12591457
申请日：2009-11-20
申请人： Te Wei Chen , Kuan Chin Lu
发明人： Te Wei Chen , Kuan Chin Lu
IPC分类号： G01R31/02
CPC分类号： B08B5/04 , B08B9/00 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to a self-cleaning package testing socket, which comprises a base plate, a surround wall is configured on the periphery of the base plate and surrounding with a central testing tank inside. Two transversal channels respectively disposed at two opposite sides of the surround wall. Each transversal channel comprises a nozzle tube between inlet and outlet; the nozzle tube radially connects two bypass pipes. Herewith, the testing tank through the bypass pipes connected to the nozzle tubes of the transversal channels. Hence, when passing air into one end of the each transversal channel, it will cause the airflow rate inside the nozzle tube to speed up, so that the pressure inside the bypass pipes will reduce, and the testing tank results a vacuum-clean effect. Therefore, the present invention can be on-line self-cleaning the test socket.
摘要翻译：本发明涉及一种自清洁包装测试插座，其包括基板，在基板的周边上配置有围绕着中央测试罐的环绕壁。两个横向通道分别设置在环绕壁的两个相对的两侧。每个横向通道包括在入口和出口之间的喷嘴管; 喷嘴管径向连接两个旁路管道。因此，通过连接到横向通道的喷嘴管的旁路管的测试罐。因此，当将空气通入每个横向通道的一端时，会使喷嘴管内的气流速度加快，旁通管内的压力降低，试验箱产生真空清洁效果。因此，本发明可以在线自检测试插座。

27. 发明申请

US20110018570A1 SELF-CLEANING PACKAGE TESTING SOCKET 失效
标题翻译：自清洁包装测试插座
公开(公告)号：US20110018570A1
公开(公告)日：2011-01-27
申请号：US12591457
申请日：2009-11-20
申请人： Te Wei Chen , Kuan Chin Lu
发明人： Te Wei Chen , Kuan Chin Lu
IPC分类号： G01R31/02 , B08B5/00
CPC分类号： B08B5/04 , B08B9/00 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to a self-cleaning package testing socket, which comprises a base plate, a surround wall is configured on the periphery of the base plate and surrounding with a central testing tank inside. Two transversal channels respectively disposed at two opposite sides of the surround wall. Each transversal channel comprises a nozzle tube between inlet and outlet; the nozzle tube radially connects two bypass pipes. Herewith, the testing tank through the bypass pipes connected to the nozzle tubes of the transversal channels. Hence, when passing air into one end of the each transversal channel, it will cause the airflow rate inside the nozzle tube to speed up, so that the pressure inside the bypass pipes will reduce, and the testing tank results a vacuum-clean effect. Therefore, the present invention can be on-line self-cleaning the test socket.
摘要翻译：本发明涉及一种自清洁包装测试插座，其包括基板，在基板的周边上配置有围绕着中央测试罐的环绕壁。两个横向通道分别设置在环绕壁的两个相对的两侧。每个横向通道包括在入口和出口之间的喷嘴管; 喷嘴管径向连接两个旁路管道。因此，通过旁通管的测试罐连接到横向通道的喷嘴管。因此，当将空气通入每个横向通道的一端时，会使喷嘴管内的气流速度加快，从而使旁通管内的压力降低，并且测试罐产生真空清洁效果。因此，本发明可以在线自检测试插座。

28. 发明授权

US07786744B2 Probe card assembly and test probes therein 有权
标题翻译：探针卡组件和测试探针
公开(公告)号：US07786744B2
公开(公告)日：2010-08-31
申请号：US12338037
申请日：2008-12-18
申请人： Cheng-Chin Ni , Kun-Chou Chen
发明人： Cheng-Chin Ni , Kun-Chou Chen
IPC分类号： G01R31/02
CPC分类号： G01R1/06761 , G01R1/0675 , G01R1/07342
摘要： Discloses are a probe card assembly and test probes used therein. The probe card assembly includes a main body, a probe base disposed in a central portion of the main body and a plurality of test probes connected between the probe base and the main body. Each of the test probes has a tip extending from the probe base for contacting a wafer under test. The test probes include at least one power probe, at least one signal probe and a plurality of ground probes. Each of the test probes has a middle section interposed between the main body and the probe base. Each of the test probes except the ground probes has a naked middle section coated with an insulating film but not sheltered by an insulating sleeve.
摘要翻译：公开了在其中使用的探针卡组件和测试探针。探针卡组件包括主体，设置在主体的中心部分的探针基座和连接在探针基座与主体之间的多个测试探针。每个测试探针具有从探针基部延伸的尖端，用于接触待测晶片。测试探针包括至少一个功率探测器，至少一个信号探针和多个接地探针。每个测试探针具有介于主体和探针基座之间的中间部分。除了接地探针之外的每个测试探针具有涂覆有绝缘膜但不被绝缘套管遮蔽的裸露的中间部分。

29. 发明授权

US07710134B2 Probe card assembly 有权
标题翻译：探头卡组合
公开(公告)号：US07710134B2
公开(公告)日：2010-05-04
申请号：US12199843
申请日：2008-08-28
申请人： Cheng-Chin Ni
发明人： Cheng-Chin Ni
IPC分类号： G01R31/02
CPC分类号： G01R1/07342 , G01R1/0491 , G01R1/06772
摘要： Disclosed is a probe card assembly including a main body, a probe base provided at a center of the main body, and a plurality of test probes connecting the main body and the probe base. Therein, each of the test probes has a tip extending out from the probe base for contacting and testing a wafer. The test probes include at least one power probe, at least one grounding probe and a plurality of signal probes, wherein each of the test probes has a middle section between the main body and the probe base. Each of the power probe and the signal probes further contains therein a core that is wrapped by an insulation layer.
摘要翻译：公开了一种探针卡组件，其包括主体，设置在主体中心的探针基座和连接主体和探针基座的多个测试探针。其中，每个测试探针具有从探针基座延伸出来的用于接触和测试晶片的尖端。测试探针包括至少一个功率探测器，至少一个接地探针和多个信号探针，其中每个测试探针在主体和探针基座之间具有中间部分。功率探头和信号探头中的每一个还包含被绝缘层包裹的芯。

30. 发明授权

US07639028B2 Probe card assembly with ZIF connectors 失效
标题翻译：带ZIF连接器的探头卡组合件
公开(公告)号：US07639028B2
公开(公告)日：2009-12-29
申请号：US11889398
申请日：2007-08-13
申请人： Lin Yuan-Chi
发明人： Lin Yuan-Chi
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , H01R12/82 , Y10T29/49121
摘要： This invention discloses a probe card assembly with adjustable ZIF connectors. The probe card assembly comprises a substrate, a plurality of ZIF connectors and a plurality of adjustable fastening means for assembling and disassembling the ZIF connectors on the substrate. The substrate is a disc-like plate, having a first surface, a second surface, a plurality of concave sections disposed on the second surface and a plurality of first through holes perpendicular to the first surface. The first through holes are circularly arranged toward the substrate center. Pairs of first contacts are provided on the first surface adjacent to both sides of first through holes. A plurality of terminals are protruded from the second surface of the substrate for contacting and testing the wafer. The ZIF connectors are also circularly arranged toward the substrate center. Each ZIF connector has parallelly arranged second through holes from the top to the bottom of the connector and pairs of contact terminals for contacting the first contacts of the substrate. The adjustable fastening means are disposed from the concave section through the first and second through holes to assembling and disassembling the ZIF connectors on the first surface of the substrate.
摘要翻译：本发明公开了一种具有可调节ZIF连接器的探针卡组件。探针卡组件包括衬底，多个ZIF连接器和用于组装和拆卸衬底上的ZIF连接器的多个可调紧固装置。基板是具有第一表面，第二表面，设置在第二表面上的多个凹部和垂直于第一表面的多个第一通孔的盘状平板。第一通孔朝向基板中心圆形布置。在与第一通孔的两侧相邻的第一表面上设置有一对第一触点。多个端子从用于接触和测试晶片的基板的第二表面突出。 ZIF连接器也朝向基板中心圆形布置。每个ZIF连接器具有从连接器的顶部到底部平行布置的第二通孔和用于接触基板的第一触头的接触端子对。可调紧固装置从凹部穿过第一和第二通孔设置，以组装和拆卸基板的第一表面上的ZIF连接器。

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