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11. 发明授权

US09741616B2 Method for producing optoelectronic semiconductor components, leadframe assembly and optoelectronic semiconductor component 有权
公开(公告)号：US09741616B2
公开(公告)日：2017-08-22
申请号：US14405393
申请日：2013-05-03
申请人： OSRAM Opto Semiconductors GmbH
发明人： Thomas Schlereth , Michael Bestele , Christian Gaertner , Tobias Gebuhr , Hans-Christoph Gallmeier , Peter Holzer , Karlheinz Arndt , Albert Schneider
IPC分类号： G01R31/27 , H01L21/78 , H01L33/00 , H01L33/62 , H01L21/50 , H01L21/66 , G01R31/26 , H01L33/48 , H01L23/495
CPC分类号： H01L21/78 , G01R31/2635 , H01L21/50 , H01L22/10 , H01L23/49541 , H01L23/49565 , H01L33/0095 , H01L33/486 , H01L33/62 , H01L2224/48091 , H01L2224/48247 , H01L2933/0033 , H01L2933/0066 , H01L2924/00014
摘要： In one embodiment, the method is configured for producing optoelectronic semiconductor components (1) and includes the steps of: providing a leadframe assembly (20) with a multiplicity of leadframes (2), each having at least two leadframe parts (21, 22); forming at least a part of the leadframe assembly (20) with a housing material for housing bodies (4); dividing the leadframe assembly (20) between at least one part of the columns (C) and/or the rows (R), wherein the leadframes (2) remain arranged in a matrix-like manner; equipping the leadframes (2) with at least one optoelectronic semiconductor chip (3); testing at least one part of the leadframes (2) equipped with the semiconductor chips (3) and formed with the housing material after the step of dividing; and separating to form the semiconductor components (1) after the step of forming and after the step of testing.

12. 发明申请

US20170231039A1 Isolated Active Circuit for Measuring the Current of an Illuminant on the Secondary Side 有权
公开(公告)号：US20170231039A1
公开(公告)日：2017-08-10
申请号：US15329355
申请日：2015-07-14
申请人： TRIDONIC GMBH & CO KG
发明人： Patrick Marte , Johannes Bachmann
IPC分类号： H05B33/08 , G01R19/00 , H02M3/337 , G01R31/26 , H02M3/335 , H02M1/08
CPC分类号： H05B33/0815 , G01R19/0092 , G01R31/2635 , H02M1/08 , H02M3/33592 , H02M3/337 , H02M2001/0009 , Y02B70/1475
摘要： The invention relates to a drive circuit for operating an illuminant, preferably at least one LED, comprising an isolated converter which is clocked on the primary side by a control unit by means of at least one controlled switch unit, said converter supplying a rectifier starting from which the illuminant can be fed, a measurement circuit for indirectly measuring the current on the secondary side of the converter having a transformer with at least one winding on the primary side.

13. 发明申请

US20170219626A1 GIMBAL ASSEMBLY TEST SYSTEM AND METHOD 审中-公开
公开(公告)号：US20170219626A1
公开(公告)日：2017-08-03
申请号：US15014479
申请日：2016-02-03
申请人： GLOBALFOUNDRIES INC.
发明人： David L. Gardell , David M. Audette , Peter W. Neff
IPC分类号： G01R1/073 , G01R31/28 , G01R35/00
CPC分类号： G01R1/07364 , G01R1/0735 , G01R31/24 , G01R31/2635 , G01R31/44 , G01R33/0017 , G01R35/005
摘要： Aspects of the present disclosure provide a gimbal assembly test system including: a protective cover affixed to a test surface of a wafer probe card mounted within a gimbal bearing, wherein the protective cover includes an exterior surface oriented outward from the test surface of the wafer probe card; and a recess extending into the exterior surface of the protective cover and shaped to matingly engage a load cell tip therein.

14. 发明申请

US20170200877A1 LIGHT EMITTING DIODE DEVICE WITH RECONSTITUTED LED COMPONENTS ON SUBSTRATE 有权
公开(公告)号：US20170200877A1
公开(公告)日：2017-07-13
申请号：US15469518
申请日：2017-03-25
申请人： Invensas Corporation
发明人： Liang Wang , Eric Tosaya
IPC分类号： H01L33/62 , G01R31/26 , H01L21/66 , H01L33/40 , H01L25/075 , H01L33/00
CPC分类号： H01L33/62 , G01R31/2635 , H01L22/14 , H01L22/32 , H01L23/481 , H01L24/95 , H01L25/0753 , H01L33/0095 , H01L33/385 , H01L33/405 , H01L2224/81
摘要： Disclosed herein are technologies for forming a plurality of known good die (KGD)-light emitting diode (LED) components into a larger size optically coherent LED chips or devices. This Abstract is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims

15. 发明授权

US09651608B2 Light-emitting device diagnostic circuit 有权
公开(公告)号：US09651608B2
公开(公告)日：2017-05-16
申请号：US14515599
申请日：2014-10-16
申请人： Nisho Image Tech Inc.
发明人： Harunobu Yoshida
IPC分类号： G01R3/00 , G01R31/26 , B41J2/165 , B41J2/21 , H05B37/03 , G01R19/165
CPC分类号： G01R31/2635 , B41J2/16579 , B41J2/2142 , G01R19/165 , H05B33/089 , H05B37/03 , H05B37/034
摘要： A diagnostic circuit for inspecting a light-emitting device having light-emitting elements. The diagnostic circuit includes a power source module, a buffer module, and an abnormality detection module. The buffer module includes a plurality of buffers. Each buffer has a buffer input terminal and a buffer output terminal. The buffer input terminal receives a first power source signal from the power source module, and the buffer output terminal outputs a second power source signal to one of the light-emitting elements. The abnormality detection module includes a plurality of comparators. Each comparator has a pair of detection input terminals and a detection output terminal. The detection input terminals is configured to receive the first and second power source signals. The detection output terminal outputs a comparison signal to generate a diagnostic result.

16. 发明授权

US09620436B2 Light emitting diode device with reconstituted LED components on substrate 有权
公开(公告)号：US09620436B2
公开(公告)日：2017-04-11
申请号：US14338327
申请日：2014-07-22
申请人： Invensas Corporation
发明人： Liang Wang , Eric Tosaya
IPC分类号： H01L33/00 , H01L23/48 , H01L23/00 , G01R31/26 , H01L25/075
CPC分类号： H01L33/62 , G01R31/2635 , H01L22/14 , H01L22/32 , H01L23/481 , H01L24/95 , H01L25/0753 , H01L33/0095 , H01L33/385 , H01L33/405 , H01L2224/81
摘要： Disclosed herein are technologies for forming a plurality of known good die (KGD)-light emitting diode (LED) components into a larger size optically coherent LED chips or devices. This Abstract is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

17. 发明申请

US20160353546A1 ELECTROLUMINESCENT DEVICE WITH SHORT DETECTION CIRCUIT 有权
标题翻译：具有短路检测电路的电致发光器件
公开(公告)号：US20160353546A1
公开(公告)日：2016-12-01
申请号：US15114877
申请日：2015-01-13
申请人： KONINKLIJKE PHILIPS N.V.
发明人： Dirk HENTE
IPC分类号： H05B33/08
CPC分类号： H05B33/0887 , G01R31/2635 , H05B33/0815 , H05B33/083 , H05B33/0845 , H05B33/0893 , H05B33/0896
摘要： The present invention relates to an electroluminescent device (20) with a light- emitting element (21) having a capacitance, a switchable current source (22) being connected to the light-emitting element for providing a driving current to the light-emitting element, and a short detection circuit (23) for detecting a short in the light-emitting element. The short detection circuit comprises a triggerable voltage determining unit (24) for determining, upon being triggered, a voltage across the light-emitting element, a triggering unit (25) for triggering the triggerable voltage determining unit to determine the voltage across the light-emitting element after a time period (Δt) during which the driving current is not provided to the light-emitting element, and a short detection unit (26) for detecting a short in the light- emitting element based on the determined voltage across the light-emitting element. Therewith, the detection can be less sensitive with respect to production tolerances and the like.
摘要翻译：本发明涉及具有电容的发光元件（21）的电致发光器件（20），与发光元件连接的可切换电流源（22），用于向发光元件提供驱动电流，以及用于检测发光元件中的短路的短路检测电路（23）。短路检测电路包括：触发电压确定单元，用于在被触发时确定发光元件两端的电压;触发单元，用于触发可触发电压确定单元，在不向发光元件提供驱动电流的时间段（Δt）之后的发光元件的短路检测单元（26），以及基于所确定的光的两端的发光元件的短路检测短路检测单元 -emitting元素。因此，相对于生产公差等，检测可以较不敏感。

18. 发明申请

US20160349304A1 System and Method for Short-Circuit Detection in Load Chains 有权
标题翻译：负载链短路检测系统及方法
公开(公告)号：US20160349304A1
公开(公告)日：2016-12-01
申请号：US14723182
申请日：2015-05-27
申请人： Infineon Technologies AG
发明人： Damiano Sartori , Marco Pamato , Maurizio Galvano
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/025 , B60Q11/005 , G01R31/2635 , H05B33/0827 , H05B33/0887
摘要： An embodiment method for short-circuit detection includes determining a set of local reference voltages each associated with a respective load chain in a plurality of load chains, and determining a global reference voltage in accordance with the set of local reference voltages. The method also includes determining, for each load chain in the plurality of load chains, a respective per-chain reference voltage in accordance with the global reference voltage, and comparing, for each load chain in the plurality of load chains, the respective per-chain reference voltage relative to a respective measured voltage across each load chain to determine a respective short-circuit condition.
摘要翻译：用于短路检测的实施例方法包括：确定与多个负载链中的相应负载链相关联的一组局部参考电压，以及根据该组参考电压确定全局参考电压。该方法还包括针对多个负载链中的每个负载链确定根据全局参考电压的相应的每链参考电压，并且对于多个负载链中的每个负载链，链参考电压相对于每个负载链上的相应测量电压以确定相应的短路状况。

19. 发明申请

US20160293587A1 Optoelectronic Semiconductor Apparatus and Carrier Assembly 审中-公开
公开(公告)号：US20160293587A1
公开(公告)日：2016-10-06
申请号：US15183867
申请日：2016-06-16
申请人： OSRAM Opto Semiconductors GmbH
发明人： Siegfried Herrmann
IPC分类号： H01L25/16 , H01L31/02 , H01L33/62 , H01L23/538 , H01L27/02
CPC分类号： H01L25/167 , G01R31/2635 , H01L23/5384 , H01L23/5386 , H01L25/0753 , H01L25/165 , H01L27/0255 , H01L31/02002 , H01L33/62 , H01L2224/16 , H01S5/02248
摘要： A semiconductor apparatus with an optoelectronic device and a further device is disclosed. Embodiments of the invention provide a semiconductor apparatus with an optoelectronic device and a further device, wherein the optoelectronic device and the further device are interconnected to one another in parallel when the semiconductor apparatus is in operation, wherein the optoelectronic device is connected to a first contact and a second contact, the first contact and the second contact being configured to externally contact the semiconductor apparatus, and wherein the further device is connected with at least one further contact of the semiconductor apparatus.

20. 发明授权

US09442155B2 System and method of testing high brightness LED (HBLED) 有权
标题翻译：高亮度LED（HBLED）测试系统及方法
公开(公告)号：US09442155B2
公开(公告)日：2016-09-13
申请号：US14089252
申请日：2013-11-25
申请人： Sof-Tek Integrators, Inc.
发明人： Daniel Creighton Morrow , Jonathan Leigh Dummer
IPC分类号： G01R31/26
CPC分类号： G01R31/2635 , G01R31/26
摘要： A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED.
摘要翻译：提供了一种测试高亮度LED（HBLED）的系统和方法，更具体地说，提供了具有提高的精度和可重复性的HBLED的受控能量测试的系统和方法。在一个实施例中，该系统包括用于向被测设备（DUT）（在这种情况下为HBLED）提供恒定功率的可编程恒定电源，其中可编程恒定电源调节输出电压或输出电流以确保给定量的功率被提供给HBLED预定的时间量并且在测试序列的持续时间内提供HBLED的结温的精确控制; 包括用于执行多个HBLED测试序列的处理器的参数测量单元（PMU）以及用于测量包括HBLED的光输出的功率和颜色（波长）的一组HBLED参数的光谱仪; 以及用于协调获取所测量的HBLED参数集合的定时的控制器。在另一个实施例中，实现光电检测器以测量HBLED的光输出的集成功率。

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