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    • 13. 发明申请
    • Comparator circuit
    • 比较器电路
    • US20050218938A1
    • 2005-10-06
    • US11085611
    • 2005-03-22
    • Takashi Sugano
    • Takashi Sugano
    • H03K5/08H03F1/52H03F3/08H03F3/45H03F3/68H03K5/22H03K5/24
    • H03K5/2481
    • A comparator circuit that operates over a wide range of input voltage from Vss to Vdd is offered. This comparator circuit includes a first comparator receiving a pair of differential input signals from input terminals, a second comparator to which a pair of differential outputs of the first comparator is inputted, a current source that provides the pair of differential outputs of the first comparator with a very low current that flows to a ground and a third comparator that receives the pair of differential input signals from the input terminals. A differential output of the second comparator and a differential output of the third comparator are combined to make an output signal. The output signal is received by to an inverter. The first comparator is a P-type comparator while the second and the third comparators are N-type comparators.
    • 提供了从Vss到Vdd的宽范围的输入电压工作的比较器电路。 该比较器电路包括从输入端接收一对差分输入信号的第一比较器,输入第一比较器的一对差分输出的第二比较器,提供第一比较器的一对差分输出的电流源 流到地的非常低的电流和从输入端接收一对差分输入信号的第三比较器。 第二比较器的差分输出和第三比较器的差分输出被组合以产生输出信号。 输出信号被接收到逆变器。 第一比较器是P型比较器,而第二和第三比较器是N型比较器。
    • 16. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US07459965B2
    • 2008-12-02
    • US11098620
    • 2005-04-05
    • Takashi Sugano
    • Takashi Sugano
    • H01L25/00
    • H01L29/92H01L29/94
    • The invention provides a semiconductor integrated circuit of which malfunction caused by noise from outside is reduced. The semiconductor integrated circuit has a power supply terminal, a ground terminal, internal circuits supplied with a power supply potential and a ground potential from the power supply terminal and the ground terminal, output circuits, an exclusive ground wiring extending from the ground terminal, a first capacitor connected between the exclusive ground wiring and a power supply wiring, an exclusive power supply wiring extending from the power supply terminal, and a second capacitor connected between the exclusive power supply wiring and a ground wiring.
    • 本发明提供一种半导体集成电路,其由来自外部的噪声引起的故障减少。 半导体集成电路具有电源端子,接地端子,从电源端子和接地端子提供的具有电源电位和接地电位的内部电路,输出电路,从接地端子延伸的专用接地布线, 连接在专用接地布线和电源布线之间的第一电容器,从电源端子延伸的专用电源布线,以及连接在专用电源布线和接地布线之间的第二电容器。
    • 17. 发明申请
    • Low voltage detection circuit
    • 低电压检测电路
    • US20070096771A1
    • 2007-05-03
    • US11588424
    • 2006-10-27
    • Takashi Sugano
    • Takashi Sugano
    • H03K5/22
    • G01R19/16552G06F11/0757
    • A low voltage detection circuit that is precise and highly reliable at the power-on as well as during normal operation is offered. The low voltage detection circuit includes a reference voltage generation circuit, a divider circuit, a comparator that serves as a comparison circuit, and a second constant current transistor connected in series with the divider circuit. An auxiliary current transistor as well as a first constant current transistor is connected in series with a load element. The auxiliary current transistor is controlled by a voltage at a drain of the second constant current transistor. A gate of the second constant current transistor and a gate of the first constant current transistor are connected with each other to form a current mirror. A size of the second constant current transistor is adjusted so that the second constant current transistor can provide a second constant current that is several times larger than a first constant current provided by the first constant current transistor.
    • 提供了在上电时以及在正常工作期间精确高度可靠的低电压检测电路。 低电压检测电路包括参考电压产生电路,分频器电路,用作比较电路的比较器和与分压电路串联连接的第二恒流晶体管。 辅助电流晶体管以及第一恒流晶体管与负载元件串联连接。 辅助电流晶体管由第二恒流晶体管的漏极处的电压控制。 第二恒流晶体管的栅极和第一恒流晶体管的栅极彼此连接以形成电流镜。 调整第二恒流晶体管的尺寸,使得第二恒流晶体管可以提供比由第一恒流晶体管提供的第一恒定电流大几倍的第二恒定电流。
    • 19. 发明申请
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US20050224911A1
    • 2005-10-13
    • US11098620
    • 2005-04-05
    • Takashi Sugano
    • Takashi Sugano
    • G11C17/00H01L21/822H01L27/00H01L27/04H01L27/10H01L29/00H01L29/92H01L29/94
    • H01L29/92H01L29/94
    • The invention provides a semiconductor integrated circuit of which malfunction caused by noise from outside is reduced. The semiconductor integrated circuit has a power supply terminal, a ground terminal, internal circuits supplied with a power supply potential and a ground potential from the power supply terminal and the ground terminal, output circuits, an exclusive ground wiring extending from the ground terminal, a first capacitor connected between the exclusive ground wiring and a power supply wiring, an exclusive power supply wiring extending from the power supply terminal, and a second capacitor connected between the exclusive power supply wiring and a ground wiring.
    • 本发明提供一种半导体集成电路,其由来自外部的噪声引起的故障减少。 半导体集成电路具有电源端子,接地端子,从电源端子和接地端子提供的具有电源电位和接地电位的内部电路,输出电路,从接地端子延伸的专用接地布线, 连接在专用接地布线和电源布线之间的第一电容器,从电源端子延伸的专用电源布线,以及连接在专用电源布线和接地布线之间的第二电容器。