会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 17. 发明申请
    • Method and apparatus for embedded Built-In Self-Test (BIST) of electronic circuits and systems
    • 电子电路和系统的嵌入式自检(BIST)的方法和装置
    • US20050210352A1
    • 2005-09-22
    • US11130332
    • 2005-05-16
    • Michael RicchettiChristopher Clark
    • Michael RicchettiChristopher Clark
    • G01R31/3185G01R31/28
    • G01R31/318544G01R31/318555
    • An embedded electronic system built-in self-test controller architecture that facilitates testing and debugging of electronic circuits and in-system configuration of programmable devices. The system BIST controller architecture includes an embedded system BIST controller, an embedded memory circuit, an embedded IEEE 1149.1 bus, and an external controller connector. The system BIST controller is coupled to the memory circuit and the IEEE 1149.1 bus, and coupleable to an external test controller via the external controller connector. The external test controller can communicate over the IEEE 1149.1 bus to program the memory and/or the system BIST controller circuitry, thereby enabling scan vectors to be debugged by the external test controller and then downloaded into the memory for subsequent application to a unit under test by the system BIST controller.
    • 嵌入式电子系统内置自检控制器架构,便于电子电路的测试和调试以及可编程器件的系统配置。 系统BIST控制器架构包括嵌入式系统BIST控制器,嵌入式存储器电路,嵌入式IEEE 1149.1总线和外部控制器连接器。 系统BIST控制器耦合到存储器电路和IEEE 1149.1总线,并通过外部控制器连接器与外部测试控制器耦合。 外部测试控制器可以通过IEEE 1149.1总线进行通信,对存储器和/或系统BIST控制器电路进行编程,从而使扫描向量由外部测试控制器进行调试,然后下载到存储器中,以供后续应用到被测单元 由系统BIST控制器。