会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 11. 发明授权
    • Brain/neuronal cell-protecting agent and therapeutic agent for sleep disorder
    • 脑/神经元细胞保护剂和睡眠障碍治疗剂
    • US07812025B2
    • 2010-10-12
    • US11990385
    • 2006-08-11
    • Takahiro MatsumotoMasakuni KoriMitsunori Kouno
    • Takahiro MatsumotoMasakuni KoriMitsunori Kouno
    • A61K31/501A61K31/497A61K31/44C07D237/02C07D401/06C07D403/06C07D413/06C07D241/06C07D401/02C07D213/02
    • C07D213/75C07D237/20C07D261/14C07D333/20C07D405/14C07D409/14C07D413/14
    • A compound represented by the formula (I) or a salt thereof; and an agent for protecting a brain/neuronal cell or a therapeutic agent for sleep disorder comprising the compound or salt: wherein Z represents an oxygen or sulfur; R1 represents an aryl or heterocyclic group which may be substituted, provided that R1 is not a 3-ethyl-6-methoxy-2-methyl-5-naphthalen-1-yl group; R1a represents a hydrogen atom, a hydrocarbon group which may be substituted, a hydroxyl group or the like; R2 represents a piperidin-1,4-diyl or piperazin-1,4-diyl which may be substituted; R3 represents a bivalent group which is formed by removing two hydrogen atoms from a benzene ring or 6-membered aromatic heterocyclic ring which may have a substituent, provided that R3 is not a pyridazin-3,6-diyl; and R4 represents a group which is formed by removing one hydrogen atom from a benzene ring or 5- to 6-membered heterocyclic ring which may be substituted, provided that the substituent on the heterocyclic ring is not a phenylethyl group which may be substituted when Z is sulfur.
    • 由式(I)表示的化合物或其盐; 以及用于保护脑/神经元细胞或用于睡眠障碍的治疗剂的药剂,其包含所述化合物或盐:其中Z表示氧或硫; R1表示可被取代的芳基或杂环基,条件是R 1不是3-乙基-6-甲氧基-2-甲基-5-萘-1-基; R 1a表示氢原子,可被取代的烃基,羟基等; R2代表可被取代的哌啶-1,4-二基或哌嗪-1,4-二基; R3表示通过从可以具有取代基的苯环或6元芳族杂环除去2个氢原子而形成的二价基团,条件是R 3不是哒嗪-3,6-二基; 并且R 4表示通过从可以被取代的苯环或5-至6-元杂环除去一个氢原子而形成的基团,条件是杂环上的取代基不是Z时可以被取代的苯基乙基 是硫。
    • 13. 发明申请
    • POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, EXPOSURE APPARATUS, AND DEVICE FABRICATION METHOD
    • 位置检测装置,位置检测方法,曝光装置和装置制造方法
    • US20090244513A1
    • 2009-10-01
    • US12412295
    • 2009-03-26
    • Takahiro MatsumotoKoichi SentokuSatoru Oishi
    • Takahiro MatsumotoKoichi SentokuSatoru Oishi
    • G03B27/32G01B11/14
    • G01B11/024G03B27/32G03F9/7046G03F9/7065G03F9/7088
    • The present invention provides a position detection apparatus including a first obtaining unit configured to obtain imaging characteristics of an imaging optical system for a plurality of light beams, having different wavelength with each other, of the light having the wavelength width, a second obtaining unit configured to obtain optical images of a target object for the plurality of light beams, a restoration unit configured to restore optical images of the target object for the plurality of light beams by correcting, deterioration in the obtained optical images of the target object attributed to the imaging optical system, based on the obtained imaging characteristics of the imaging optical system, and a generation unit configured to generate an optical image of the target object for light including the plurality of light beams by synthesizing the restored optical images of the target object for the plurality of light beams.
    • 本发明提供了一种位置检测装置,包括第一获取单元,被配置为获得具有波长宽度的光彼此具有不同波长的多个光束的成像光学系统的成像特性,第二获取单元配置 以获得所述多个光束的目标物体的光学图像;恢复单元,被配置为通过校正所获得的所述目标对象的光学图像的劣化来恢复所述多个光束中的目标对象的光学图像 光学系统,基于所获得的成像光学系统的成像特性,以及生成单元,被配置为通过合成复原的多个目标对象的光学图像来生成包括多个光束的光的目标对象的光学图像 的光束。
    • 16. 发明授权
    • Position detection apparatus and exposure apparatus
    • 位置检测装置和曝光装置
    • US07528966B2
    • 2009-05-05
    • US11965868
    • 2007-12-28
    • Takahiro Matsumoto
    • Takahiro Matsumoto
    • G01B11/14
    • G03F9/7026
    • The position detection apparatus includes a light projecting optical system which has an optical axis, and which cause two light beams symmetrical about the optical axis to enter a substrate, a light receiving optical system which receives the two light beams which have emerged from the light projecting optical system and are reflected by the substrate, a light receiving unit which is arranged at a position shifted in the optical axis direction, a detection unit which respectively detects the positions of the two light beams which have entered the light receiving unit, and a calculator which calculates the surface position of the substrate in the normal direction based on the positions of the two light beams, which are detected by the detection unit. At least one of the light projecting optical system and the light receiving optical system is shared for the two light beams.
    • 位置检测装置包括具有光轴的光投射光学系统,其使得关于光轴对称的两个光束进入基板;受光光学系统,其接收从光投射的两个光束 光学系统,并被基板反射,布置在沿光轴方向偏移的位置的光接收单元,分别检测已经进入光接收单元的两个光束的位置的检测单元和计算器 其基于由检测单元检测到的两个光束的位置来计算基板在法线方向上的表面位置。 光投射光学系统和光接收光学系统中的至少一个被共享用于两个光束。
    • 18. 发明申请
    • SHAPE MEASURING APPARATUS, SHAPE MEASURING METHOD, AND EXPOSURE APPARATUS
    • 形状测量装置,形状测量方法和曝光装置
    • US20080151258A1
    • 2008-06-26
    • US11942348
    • 2007-11-19
    • Takahiro MatsumotoRyo Sasaki
    • Takahiro MatsumotoRyo Sasaki
    • G01B9/023
    • G01B11/2441G03F9/7026G03F9/7034
    • A shape measuring method for measuring a surface shape of a measurement target includes dividing light from a light source into measurement light and reference light, the measurement light being obliquely incident upon a surface of the measurement target, the reference light being incident upon a reference mirror, introducing the measurement light reflected by the measurement target and the reference light reflected by the reference mirror to a photoelectric conversion element, detecting interference light formed by the measurement light and the reference light by the photoelectric conversion element while moving the measurement target, and measuring the surface shape of the measurement target based on an interference signal obtained from the measurement light that has been reflected at the same position on the surface of the measurement target.
    • 用于测量测量对象的表面形状的形状测量方法包括将来自光源的光分成测量光和参考光,测量光倾斜地入射到测量对象的表面上,参考光入射到参考反射镜 将由测量对象反射的测量光和由参考反射镜反射的参考光引入光电转换元件,在移动测量目标的同时检测由光电转换元件测量的光和参考光形成的干涉光,并测量 基于从已经在测量对象的表面上的相同位置反射的测量光获得的干涉信号来测量目标的表面形状。
    • 19. 发明授权
    • Superconducting magnet apparatus for MRI
    • MRI超导磁体设备
    • US07382134B2
    • 2008-06-03
    • US11305010
    • 2005-12-19
    • Takahiro Matsumoto
    • Takahiro Matsumoto
    • G01V3/00
    • G01R33/3815G01R33/3806
    • In a superconducting magnets for MRI configured to generate a homogeneous magnetic field and a gradient magnetic field in a space between a top superconducting magnet and a bottom superconducting magnet, the bottom superconducting magnet is provided with a supporting member that supports a helium vessel, and the supporting member is fixed to a vacuum vessel of the bottom superconducting magnet at one end, and is fixed to the floor surface in the vicinity of the end fixed to the vacuum vessel. A high-quality MR image can be thus obtained by preventing direct transmission of oscillation of the gradient coils to the superconducting magnet and reducing oscillation of the gradient coils while achieving a reduction of the overall superconducting magnet in size.
    • 在用于MRI的超导磁​​体被配置为在顶部超导磁体和底部超导磁体之间的空间中产生均匀的磁场和梯度磁场,底部超导磁体设置有支撑氦容器的支撑构件,并且 支撑构件在一端固定到底部超导磁体的真空容器,并且固定到固定到真空容器的端部附近的地板表面。 因此可以通过防止梯形线圈的振荡直接传递到超导磁体并减小梯度线圈的振荡,同时实现整个超导磁体的尺寸的减小,从而可以获得高质量的MR图像。
    • 20. 发明授权
    • Position detecting method
    • 位置检测方法
    • US07265841B2
    • 2007-09-04
    • US10872031
    • 2004-06-18
    • Takahiro Matsumoto
    • Takahiro Matsumoto
    • G01B11/00
    • G03F9/7092G03F9/7046
    • A method for calculating a position of an image of an alignment mark formed on an object to be detected includes the steps of obtaining first information indicative of a center position in the alignment mark based on a detection signal, obtaining a waveform characteristic of the detection signal as second information, and correcting the first information based on the second information that has been obtained, and a measurement error of the center position of the alignment mark, which result from an optical system for detecting the alignment mark.
    • 用于计算形成在待检测物体上的对准标记的图像的位置的方法包括以下步骤:基于检测信号获得指示对准标记中的中心位置的第一信息,获得检测信号的波形特性 作为第二信息,并且基于获得的第二信息和由用于检测对准标记的光学系统产生的对准标记的中心位置的测量误差来校正第一信息。