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    • 15. 发明授权
    • Process and device for measuring the thickness of a transparent material using a modulated frequency light source
    • 使用调制频率光源测量透明材料的厚度的方法和装置
    • US06215556B1
    • 2001-04-10
    • US09346708
    • 1999-07-02
    • Jingwei ZhangPascal Grente
    • Jingwei ZhangPascal Grente
    • G01B1102
    • G01B11/06
    • The invention relates to a process and to a device for measuring the thickness of transparent materials. More particularly, but not exclusively, the invention concerns the thickness measurement of glass materials and, even more precisely, the thickness measurement of flat glass, in particular float glass. According to the invention, a light beam with modulated frequency is focused, two light beams or rays reflected by each of the surfaces of the transparent material are received, interference is created between them, the number of oscillations per modulation period of the interference signal is determined, the path difference (&dgr;) between the two beams and the thickness (e) of the transparent material are deduced and the phase shift (&phgr;) of the said interference signal is determined. This determination of the phase-shift between the two signals each coming from one of the surfaces of the transparent material can then be used to deduce other characteristics of the said material. It may in particular be applied to the precise measurement of local thickness variations, in particular of a strip of float glass. Similarly, it is proposed to apply it to measuring the thickness of a thin transparent material, preferably more than 0.2 mm.
    • 本发明涉及一种用于测量透明材料厚度的方法和装置。 更具体地但并不排他地,本发明涉及玻璃材料的厚度测量,甚至更确切地说,是平板玻璃,特别是浮法玻璃的厚度测量。 根据本发明,对具有调制频率的光束进行聚焦,接收由透明材料的每个表面反射的两个光束或射线,在它们之间产生干涉,干扰信号的每个调制周期的振荡次数为 确定了两个光束之间的路径差(delta)和透明材料的厚度(e),并确定了所述干涉信号的相移(phi)。 然后可以使用来自透明材料的一个表面的两个信号之间的相移的确定来推断所述材料的其它特性。 特别适用于局部厚度变化的精确测量,特别是浮法玻璃条。 类似地,建议将其应用于测量薄透明材料的厚度,优选大于0.2mm。
    • 19. 发明申请
    • FLAT COPLANAR-DISCHARGE LAMP AND USES OF SAME
    • 平面共振放电灯及其使用
    • US20090058295A1
    • 2009-03-05
    • US12064516
    • 2006-08-16
    • Guillaume AudayJingwei ZhangDidier DuronPhilippe GuillotThierry CallegariPhilippe Belenguer
    • Guillaume AudayJingwei ZhangDidier DuronPhilippe GuillotThierry CallegariPhilippe Belenguer
    • H01J61/04
    • H01J65/046H01J61/04H01J61/305H01J61/95
    • A flat discharge lamp transmitting radiation in ultraviolet or visible, including first and second flat, or substantially flat, glass elements substantially parallel to each other and defining an internal space filled with gas, the first and/or second glass element being made of a material that transmits the radiation; at least one first electrode and at least one second electrode, which may be at different potentials and may be supplied by an AC voltage, the first and second electrodes being associated with one or more main faces of the first glass element, the first and second electrodes being essentially elongate and substantially parallel to one another, and separated by at least one interelectrode space of given width substantially constant; and at least one third electrode which may be at a given potential associated with a main face of the second glass element and at least partly occupying, in projection, the interelectrode space.
    • 透射紫外线或可见光的平面放电灯,包括基本上彼此平行的第一和第二平坦或基本平坦的玻璃元件,并限定填充有气体的内部空间,第一和/或第二玻璃元件由材料制成 传播辐射; 至少一个第一电极和至少一个第二电极,其可以处于不同的电位并且可以由AC电压提供,所述第一和第二电极与所述第一玻璃元件的一个或多个主面相关联,所述第一和第二电极 电极基本上是细长的并且基本上彼此平行,并且被给定宽度的至少一个电极间隔基本上恒定分开; 以及至少一个第三电极,其可以处于与第二玻璃元件的主面相关联的给定电位,并且至少部分占据投射电极间空间。
    • 20. 发明授权
    • Method of measuring the thickness of a transparent material
    • 测量透明材料厚度的方法
    • US5657124A
    • 1997-08-12
    • US530378
    • 1995-12-15
    • Jingwei ZhangPascal Grente
    • Jingwei ZhangPascal Grente
    • G01B11/06G01B9/02
    • G01B11/06
    • A method and apparatus for measuring the thickness of a transparent material. A light beam from a laser diode has a modulated optical frequency. The emitted light shines on opposite surfaces of a wall of the material and is reflected from both of the surfaces. The two beams are used to form an interference. The difference of step .delta. of the interference signal is then determined. The thickness of the transparent material is determined from this difference of step. The apparatus may be used with bottles of glass or plastic material, whether clear or colored and on flat glass.
    • PCT No.PCT / FR95 / 00184 Sec。 371 1995年12月15日第 102(e)1995年12月15日日期PCT 1995年2月17日提交PCT公布。 WO95 / 22740 PCT公开 日期:1995年8月24日用于测量透明材料厚度的方法和装置。 来自激光二极管的光束具有调制的光频率。 发射的光照射在材料的壁的相对表面上并且从两个表面反射。 两个波束用于形成干扰。 然后确定干扰信号的步长差值。 透明材料的厚度由步骤的差异确定。 该设备可以与玻璃或塑料材料瓶一起使用,无论是透明的还是彩色的,并且在平板玻璃上。