专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

11. 发明申请

US20110051127A1 REFRACTIVE INDEX MEASURING APPARATUS 有权
标题翻译：折射指数测量装置
公开(公告)号：US20110051127A1
公开(公告)日：2011-03-03
申请号：US12990547
申请日：2010-01-21
申请人： Yusuke Kusaka , Yohei Takechi , Atsushi Fukui , Seiji Hamano , Kazumasa Takata
发明人： Yusuke Kusaka , Yohei Takechi , Atsushi Fukui , Seiji Hamano , Kazumasa Takata
IPC分类号： G01N21/41
CPC分类号： G01M11/0228
摘要： By using two probe optical systems for measurement by disposing the probe optical systems with a test object sandwiched therebetween, an optical path length of light transmitted through the test object which is identified locally is calculated using an interference signal thereof. In addition, a geometrical thickness of the same part is calculated by measuring positions of the probe optical systems, whereby two calculated values are obtained. Based on the values and a calculated value for a reference object, a refractive index distribution of the test object is obtained.
摘要翻译：通过使用两个探测光学系统进行测量，通过将测试对象夹在其间设置探测光学系统，使用其干扰信号来计算通过本地识别的测试对象传输的光的光路长度。此外，通过测量探针光学系统的位置来计算同一部分的几何厚度，由此获得两个计算值。基于参考对象的值和计算值，获得测试对象的折射率分布。

12. 发明授权

US07821626B2 Angle measuring device and method 有权
标题翻译：角度测量装置及方法
公开(公告)号：US07821626B2
公开(公告)日：2010-10-26
申请号：US11994077
申请日：2006-09-20
申请人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
发明人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
IPC分类号： G01C1/00
CPC分类号： G01B11/26
摘要： By diffracting light emitted from a collimator lens into lights of different orders by a transmission diffraction grating, applying the diffracted lights to a flat surface of an object, forming the light that has been reflected on the flat surface of the object and thereafter retransmitted through the transmission diffraction grating into an image in a position located apart from the optical axis of the outgoing light and measuring the angle of the object with respect to the optical axis of the collimator lens using the image location and the order of the light formed as the image, the angle in a wide range can be measured with a high resolving power.
摘要翻译：通过透射衍射光栅将从准直透镜发射的光衍射成不同顺序的光，将衍射光施加到物体的平坦表面，形成已被反射在物体的平坦表面上的光，然后通过透射衍射光栅转换成位于远离出射光的光轴的位置的图像，并使用图像位置和形成为图像的光的顺序来测量物体相对于准直透镜的光轴的角度，可以以高分辨能力测量宽范围内的角度。

13. 发明申请

US20090231573A1 ANGLE MEASURING DEVICE AND METHOD 有权
标题翻译：角度测量装置和方法
公开(公告)号：US20090231573A1
公开(公告)日：2009-09-17
申请号：US11994077
申请日：2006-09-20
申请人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
发明人： Takashi Urashima , Kazumasa Takata , Tomotaka Furuta , Hidetoshi Utsuro
IPC分类号： G01B11/26
CPC分类号： G01B11/26
摘要： By diffracting light emitted from a collimator lens into lights of different orders by a transmission diffraction grating, applying the diffracted lights to a flat surface of an object, forming the light that has been reflected on the flat surface of the object and thereafter retransmitted through the transmission diffraction grating into an image in a position located apart from the optical axis of the outgoing light and measuring the angle of the object with respect to the optical axis of the collimator lens using the image location and the order of the light formed as the image, the angle in a wide range can be measured with a high resolving power.
摘要翻译：通过透射衍射光栅将从准直透镜发射的光衍射成不同顺序的光，将衍射光施加到物体的平坦表面，形成已被反射在物体的平坦表面上的光，然后通过透射衍射光栅转换成位于远离出射光的光轴的位置的图像，并使用图像位置和形成为图像的光的顺序来测量物体相对于准直透镜的光轴的角度，可以以高分辨能力测量宽范围内的角度。

14. 发明申请

US20060192977A1 Method and apparatus for inspection of optical component 失效
标题翻译：光学部件检查方法和装置
公开(公告)号：US20060192977A1
公开(公告)日：2006-08-31
申请号：US11319172
申请日：2005-12-28
申请人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
发明人： Kazumasa Takata , Hidetoshi Utsuro , Tomotaka Furuta , Takashi Urashima
IPC分类号： G01B11/02 , G01B9/02
CPC分类号： G01M11/0271
摘要： An inspection method for evaluating the performance of an optical component at high precision is provided. According to the inspection method, a first light beam 24 and a second light beam 26 both having different phases are generated from light which has passed through an optical component 18, and are interfered with each other to form an interference region 30. A linear line 66, a linear line 70 and linear lines 72 are set within the interference region 30 so as to determine a distribution of light intensities on each of the linear lines 72. Then, a frequency corresponding to the maximal light intensity is determined. Further, an approximated liner line or an approximated curved line is determined from a plurality of frequencies determined for each of the linear line 72. Then, the aberration of the optical component is evaluated based on the coefficient of the approximated linear or curved line.
摘要翻译：提供了一种用于高精度地评估光学部件的性能的检查方法。根据检查方法，由已经通过光学部件18的光产生具有不同相位的第一光束24和第二光束26，并且彼此干涉以形成干涉区域30。线性线66，线性线70和线性线72设置在干涉区域30内，以便确定每个线性线72上的光强度的分布。然后，确定与最大光强度对应的频率。此外，根据为每个线性线72确定的多个频率来确定近似线性线或近似曲线。然后，基于近似线性或曲线的系数来评价光学部件的像差。

15. 发明授权

US06538749B1 Method and apparatus for evaluating aberrations of optical element for use with optical device by using phase differences determined by overlapping two diffracted lights to form a sharing image 失效
$Method and apparatus for evaluating aberrations of optical element for use with optical device by using phase differences determined by overlapping two diffracted lights to form a sharing image$
标题翻译：用于通过使用通过重叠两个衍射光确定的相位差来评估用于光学装置的光学元件的像差的方法和装置，以形成共享图像
公开(公告)号：US06538749B1
公开(公告)日：2003-03-25
申请号：US09361143
申请日：1999-07-27
申请人： Kazumasa Takata , Masahiro Nakajo , Kanji Nishii
发明人： Kazumasa Takata , Masahiro Nakajo , Kanji Nishii
IPC分类号： G01B902
CPC分类号： G01M11/0271
摘要： A method for evaluating aberrations of an optical element such as optical head for use with an optical system such as DVD. In this method, light is transmitted through the optical element and then diffracted into 0, ±1, ±2, . . . order diffraction lights, for example. Among others, first and second lights (e.g., 0 and +1, 0 and −1, +1 and −1, or 0 and ±1 order diffracted lights) are overlapped to form an image shared by the first and second lights. Then, light intensity at first and second points in the shared image are detected. At this moment, light intensity at the first and second points are changed. Then, a phase difference in light intensity of between first and second points is determined. Using the phase difference, aberrations of the optical element are determined.
摘要翻译：一种用于评估诸如用于诸如DVD之类的光学系统的光学头的光学元件的像差的方法。在这种方法中，光通过光学元件传输，然后衍射成0，±1，±2。。。订单衍射灯，例如。其中，第一和第二光（例如0和+1,0和-1，+1和-1，或0和±1级衍射光）被重叠以形成由第一和第二光共享的图像。然后，检测共享图像中的第一点和第二点处的光强度。此时，第一点和第二点的光强度发生变化。然后，确定第一和第二点之间的光强度的相位差。使用相位差，确定光学元件的像差。

16. 发明授权

US5894345A Optical method of detecting defect and apparatus used therein 失效
标题翻译：检测缺陷的光学方法及其中使用的装置
公开(公告)号：US5894345A
公开(公告)日：1999-04-13
申请号：US859423
申请日：1997-05-20
申请人： Kenji Takamoto , Kanji Nishii , Masami Ito , Atsushi Fukui , Kazumasa Takata
发明人： Kenji Takamoto , Kanji Nishii , Masami Ito , Atsushi Fukui , Kazumasa Takata
IPC分类号： G01B11/30 , G01N21/88 , G01N21/89 , G01N21/956 , G01N21/00
CPC分类号： G01N21/8903
摘要： An array light source 1 with semiconductor laser sources disposed one-dimensionally and a projective lens 2 are used to illuminate an inspected object so that light beams projected from the array light source form a dotted line on the object. A line sensor is used to receive through an objective lens 3 light emitted from an imaging area 11 away from an illuminated area 12. An image signal, fed to an image processing unit 8 through a pre-processing unit 7 producing an image from signals from the line sensor 4 and a stage 5 is processed, while the stage 5 bearing the object 6 is being gradually moved, to inspect the object 6 for crack defects 9 and 10 by detecting an optically nonhomogeneous portion of the object. The method allows a crack defect of an object, such as a ceramic substrate or a sintered metal product, to be detected fast with high accuracy.
摘要翻译：使用具有一维设置的半导体激光源的阵列光源1和投射透镜2来照射被检查物体，使得从阵列光源投射的光束在物体上形成虚线。线传感器用于通过物镜3接收从成像区域11发出的远离照明区域12的光。图像信号，通过预处理单元7馈送到图像处理单元8，从预处理单元7产生来自在承载物体6的台架5正在逐渐移动的同时，对线传感器4和台5进行处理，通过检测物体的光学非均匀部分来检查物体6的裂纹缺陷9和10。该方法允许以高精度快速检测诸如陶瓷基板或烧结金属产品的物体的裂纹缺陷。

17. 发明授权

US5754341A Phase grating, its fabricating method, optical encoder, motor using the optical encoder, and robot using the motor 失效
标题翻译：相位光栅，其制造方法，光学编码器，使用光学编码器的电动机和使用电动机的机器人
公开(公告)号：US5754341A
公开(公告)日：1998-05-19
申请号：US661154
申请日：1996-06-10
申请人： Kazumasa Takata , Kanji Nishii , Kenji Takamoto , Masami Ito , Atsushi Fukui
发明人： Kazumasa Takata , Kanji Nishii , Kenji Takamoto , Masami Ito , Atsushi Fukui
IPC分类号： G01D5/38 , G02B5/18 , G02B27/46
CPC分类号： G02B5/1871 , G02B27/46 , Y10S359/90
摘要： A phase grating has a concave part of rectangular shape type substantially, of which grating depth is deeper in a specific range than depth d' calculated in a formula .vertline.n-n.sub.0 .vertline..times.(p-d'/e)/p.times.d'=(.lambda./2).times.(1+2m) (where m=0, .+-.1, .+-.2, . . . ) in terms of center wavelength .lambda. of light having partial interference to be diffracted by the phase grating, pitch length p of the phase grating, refractive index n of base material of the phase grating, refractive index n.sub.0 of medium surrounding the phase grating, and shape ratio e as the ratio of grating depth to width of slope of the concave part.
摘要翻译：相位光栅具有基本上为矩形形状类型的凹部，光栅深度在与公式| n-n0 | x（p-d'/ e）/ pxd'=（ λ/ 2）x（1 + 2m）（其中m = 0，+/- 1，+/- 2，...）就具有待被相位光栅衍射的部分干涉的光的中心波长λ 相位光栅的长度p，相位光栅的基材的折射率n，围绕相位光栅的介质的折射率n0，以及作为凹部的光栅深度与斜率宽度的比率的形状比e。

18. 发明申请

US20080144196A1 Optical Unit And Its Manufacturing Method 有权
标题翻译：光学单元及其制造方法
公开(公告)号：US20080144196A1
公开(公告)日：2008-06-19
申请号：US11793234
申请日：2005-12-15
申请人： Yoshiro Kitamura , Seiji Kumazawa , Koji Funami , Kazumasa Takata , Yasuo Nishihara
发明人： Yoshiro Kitamura , Seiji Kumazawa , Koji Funami , Kazumasa Takata , Yasuo Nishihara
IPC分类号： G02B7/02
CPC分类号： G11B7/22 , B29C65/14 , B29C65/1406 , B29C65/1416 , B29C65/1483 , B29C65/1609 , B29C65/1616 , B29C65/1632 , B29C65/1635 , B29C65/1638 , B29C65/1654 , B29C65/1664 , B29C65/4845 , B29C65/52 , B29C66/1122 , B29C66/1222 , B29C66/1224 , B29C66/30223 , B29C66/534 , B29C66/65 , B29C66/71 , B29C66/712 , B29C66/73117 , B29C66/73771 , B29C66/73921 , B29C66/91631 , B29C66/91641 , B29C66/919 , B29C2035/0827 , B29K2105/0079 , B29K2995/0039 , B29L2011/0016 , G02B7/025 , G11B7/1372 , B29K2023/00
摘要： Provided is a method for manufacturing an optical unit (10) having an optical element (22) and a support member (12) supporting the optical element. According to the method, at least one of the optical element (22) and the support member (12) is deformed, securing the optical element (22) and the support member (12) together.
摘要翻译：提供一种用于制造具有支撑光学元件的光学元件（22）和支撑构件（12）的光学单元（10）的方法。根据该方法，光学元件（22）和支撑构件（12）中的至少一个变形，将光学元件（22）和支撑构件（12）固定在一起。

19. 发明授权

US6068382A Panel-form illuminating system 有权
标题翻译：面板式照明系统
公开(公告)号：US6068382A
公开(公告)日：2000-05-30
申请号：US348855
申请日：1999-07-07
申请人： Atsushi Fukui , Kanji Nishii , Kenji Takamoto , Masami Ito , Kazumasa Takata , Ken Tatsuta , Koki Nakabayashi , Hiroshi Watanabe
发明人： Atsushi Fukui , Kanji Nishii , Kenji Takamoto , Masami Ito , Kazumasa Takata , Ken Tatsuta , Koki Nakabayashi , Hiroshi Watanabe
IPC分类号： F21V8/00 , G02B6/00 , F21V7/04
CPC分类号： G02B6/0038 , G02B6/0036 , G02B6/0061 , G02B6/0078 , G02B6/0046 , G02B6/0055 , G02B6/0056 , G02B6/0068
摘要： A highly efficient, luminous and energy-saving panel-form illuminating system suitable for mass-production, comprising at least a photoconductor, a linear light source at one side of the photoconductor, and a reflector; wherein grooves or protrusions are formed on the bottom surface of the photoconductor.
摘要翻译：一种适用于批量生产的高效，发光和节能的面板式照明系统，包括至少一个光电导体，在感光体一侧的线性光源和反射器; 其中在感光体的底表面上形成有凹槽或凸起。

20. 发明授权

US5999249A Position detecting element and range sensor 失效
标题翻译：位置检测元件和量程传感器
公开(公告)号：US5999249A
公开(公告)日：1999-12-07
申请号：US950282
申请日：1997-10-14
申请人： Masami Ito , Kanji Nishii , Kenji Takamoto , Atsushi Fukui , Kazumasa Takata
发明人： Masami Ito , Kanji Nishii , Kenji Takamoto , Atsushi Fukui , Kazumasa Takata
IPC分类号： G01B11/00 , G01B11/02 , G01C3/06 , G01C3/08 , G01C3/00 , G01N21/86 , G02B7/04
CPC分类号： G01C3/085 , G01B11/026
摘要： A position detecting element that enables a position to be detected at high speed and high precision, and a range sensor using the same. The position detecting element is provided with a PIN photodiode array 1 having n segments and a parallel arithmetic processing portion 2 that calculates the segment having maximum intensity by comparing n outputs from the segments of the PIN photodiode array 1. The range sensor includes a light source by which the object to be measured is irradiated by optical beam, a lens that gathers rays of the reflected light from the surface of the object to be measured and the position detecting element mentioned above that detects the position of the light gathered by the lens.
摘要翻译：能够高速高精度地检测位置的位置检测元件和使用该位置检测元件的距离传感器。位置检测元件设置有具有n个段的PIN光电二极管阵列1和并行算术处理部分2，其通过比较PIN光电二极管阵列1的各个部分的n个输出来计算具有最大强度的段。范围传感器包括光源被测量对象被光束照射，从被检测体的表面收集反射光的光线的透镜和上述检测由透镜收集的光的位置的位置检测元件。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式