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    • 11. 发明申请
    • Use of a porous dielectric material as an etch stop layer for non-porous dielectric films
    • 使用多孔电介质材料作为非多孔介电膜的蚀刻停止层
    • US20050258542A1
    • 2005-11-24
    • US10845718
    • 2004-05-14
    • Nicholas FullerTimothy Dalton
    • Nicholas FullerTimothy Dalton
    • H01L21/768H01L23/48H01L23/532
    • H01L21/76835H01L21/76807H01L21/76808H01L21/76829H01L21/76834H01L23/5329H01L23/53295H01L2924/0002H01L2924/00
    • Interconnect structures possessing a non-porous (dense) low-k organosilicate glass (OSG) film utilizing a porous low-k OSG film as an etch stop layer or a porous low-k OSG film using a non-porous OSG film as a hardmask for use in semiconductor devices are provided herein. The novel interconnect structures are capable of delivering improved device performance, functionality and reliability owing to the reduced effective dielectric constant of the stack compared with that of those conventionally employed and also because of the relatively uniform line heights made feasible by these unique and seemingly counterintuitive features. The present invention also provides a fluorocarbon-based dual damascene etch process that achieves selective etching of a dense low-k OSG films relative to that of a porous low-k OSG film owing to the tunability of the gas-phase fluorine:carbon ratio (gas dissociation) and ion current below a critical threshold and given the larger carbon content of the porous film relative to that of the dense film.
    • 具有使用多孔低k OSG膜作为蚀刻停止层的无孔(致密)低k有机硅酸盐玻璃(OSG)膜的互连结构或使用无孔OSG膜作为硬掩模的多孔低k OSG膜 用于半导体器件中。 新颖的互连结构能够提供改进的器件性能,功能和可靠性,这是由于与传统采用的叠层相比,堆叠的有效介电常数降低,并且还因为这些独特且看似违反直觉的特征使得线的高度相对均匀 。 本发明还提供了一种基于碳氟化合物的双镶嵌蚀刻工艺,由于气相氟:碳比的可调性,实现了相对于多孔低k OSG膜的致密低k OSG膜的选择性蚀刻( 气体离解)和离子电流低于临界阈值,并且给出多孔膜相对于致密膜的碳含量较大。
    • 12. 发明申请
    • Dual damascene process flow enabling minimal ULK film modification and enhanced stack integrity
    • 双镶嵌工艺流程可实现极少的ULK膜修饰和增强的堆叠完整性
    • US20070161226A1
    • 2007-07-12
    • US11328981
    • 2006-01-10
    • Timothy DaltonNicholas FullerSatyanarayana Nitta
    • Timothy DaltonNicholas FullerSatyanarayana Nitta
    • H01L21/4763
    • H01L21/76801H01L21/76808H01L21/76829
    • Interconnect structures possessing an organosilicate glass interlayer dielectric material with minimal stoichiometeric modification and optionally an intact organic adhesion promoter for use in semiconductor devices are provided herein. The interconnect structure is capable of delivering improved device performance, functionality and reliability owing to the reduced effective dielectric constant of the stack compared with that of those conventionally employed because of the use of a sacrificial polymeric material deposited onto the dielectric and optional organic adhesion promoter during the barrier open step done prior to ashing the patterning material. This sacrificial film protects the dielectric and optional organic adhesion promoter from modification/consumption during the subsequent ashing step during which the polymeric film is removed.
    • 本文提供了具有最小化学计量变化的有机硅酸盐玻璃层间介电材料和任选的用于半导体器件的完整有机粘合促进剂的互连结构。 互连结构能够提供改进的器件性能,功能性和可靠性,因为与常规使用的那些相比,堆叠的有效介电常数降低,因为使用沉积在电介质上的牺牲聚合物材料和任选的有机粘合促进剂 在灰化图案材料之前完成的阻挡层开口步骤。 该牺牲膜在后续的灰化步骤期间保护电介质和任选的有机粘合促进剂免于修饰/消耗,在此期间除去聚合物膜。