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11. 发明授权

US5694059A Buffer of fine connection structure for connecting an atom level circuit and a general semiconductor circuit 失效
标题翻译：用于连接原子电平电路和一般半导体电路的精细连接结构缓冲器
公开(公告)号：US5694059A
公开(公告)日：1997-12-02
申请号：US383843
申请日：1995-02-06
申请人： Yasuo Wada , Munehisa Mitsuya , Yasushi Tomioka , Mark I. Lutwyche , Seiichi Kondo , Seiji Heike
发明人： Yasuo Wada , Munehisa Mitsuya , Yasushi Tomioka , Mark I. Lutwyche , Seiichi Kondo , Seiji Heike
IPC分类号： G11C5/00 , G11C11/34 , G11C19/00 , H01L27/06 , H01L49/00 , H03F3/04 , H03K19/02 , H03K19/08 , H03K19/0175
CPC分类号： B82Y15/00 , B82Y10/00 , G11C11/34 , G11C19/00 , H01L27/06 , H01L49/00 , H01L49/006 , H03F3/04 , H03K19/02 , H03K19/08 , G11C13/025 , G11C2213/81 , G11C2216/08 , Y10S977/936 , Y10S977/937
摘要： A buffer circuit ID provided for connecting an atom level device (for example, an Atom Relay Transistor circuit), formed by arranging atoms in a predetermined pattern, to a device such as a semiconductor device and a quantum device. The buffer circuit can be formed as a voltage or current amplification circuit. The voltage amplification circuit may be a single electron transistor circuit, and the current amplification circuit may be an avalanche amplification device circuit. The Atom Relay Transistor circuit and the device such as a semiconductor device and a quantum device are formed substantially on the same flat insulating member, and connected by a fine connection structure made of a conductive body such as metal.
摘要翻译：提供用于连接原子级装置（例如，原子继电器晶体管电路）的缓冲电路ID，其通过以预定图案排列原子而形成于诸如半导体装置和量子装置之类的装置。缓冲电路可以形成为电压或电流放大电路。电压放大电路可以是单电子晶体管电路，并且电流放大电路可以是雪崩放大器件电路。原子继电器晶体管电路和诸如半导体器件和量子器件的器件基本上形成在相同的平坦绝缘构件上，并且由诸如金属的导电体形成的精细连接结构连接。

12. 发明授权

US5510614A Solid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatus 失效
标题翻译：固体表面观察方法及其设备，以及由固体表面观察装置和形成电子设备的方法形成的电子设备
公开(公告)号：US5510614A
公开(公告)日：1996-04-23
申请号：US184068
申请日：1994-01-21
申请人： Munehisa Mitsuya , Yasuo Wada , Seiji Heike , Seiichi Kondo
发明人： Munehisa Mitsuya , Yasuo Wada , Seiji Heike , Seiichi Kondo
IPC分类号： C04B41/00 , C04B41/80 , C23C26/00 , G01Q30/02 , G01Q60/10 , G11B9/00 , H01J37/00
CPC分类号： G01Q30/02 , B82Y35/00 , C04B41/0027 , C04B41/0045 , C04B41/009 , C04B41/80 , C23C26/00 , G01Q60/10 , B82Y10/00 , C04B2111/94 , G11B9/14 , G11B9/149 , H01J2237/31732 , Y10S977/855
摘要： A surface of an insulator or semiconductor substrate is irradiated with a beam such as an electron beam, an electromagnetic wave beam, an ion beam, etc. to excite carriers so as to form an electrical conductive layer on the surface of and in the inside of the substrate to thereby make it possible to perform observation and micro working on the insulator by using a scanning tunneling microscope.
摘要翻译：用电子束，电磁波束，离子束等光束照射绝缘体或半导体基板的表面，以激励载流子，以在其表面上和内部形成导电层从而能够通过使用扫描隧道显微镜对绝缘体进行观察和微加工。

13. 发明授权

US08912789B2 Magnetic force microscope and magnetic field observation method using same 有权
标题翻译：磁力显微镜和磁场观察法使用相同
公开(公告)号：US08912789B2
公开(公告)日：2014-12-16
申请号：US13479860
申请日：2012-05-24
申请人： Seiji Heike
发明人： Seiji Heike
IPC分类号： G01B7/14 , G01Q60/56 , G01R33/038 , B82Y35/00
CPC分类号： G01R33/0385 , B82Y35/00 , G01Q60/56
摘要： A magnetic force microscope capable of measuring the absolute value of a magnetic field with high resolution without causing a change in magnetization state of the probe. The magnetic force microscope includes a cantilever, a probe, a displacement detector that detects a displacement of the probe, a specimen carrier, and various transfer units. The magnetic force microscope that measures an undulation distribution as well as a magnetic field distribution on the surface of a specimen placed on the specimen carrier is further provided with a magnetic-field impress-unit that impresses a magnetic field to the probe, and an output of the magnetic-field impress-unit is controlled such that a magnetic force impressed onto the probe 5 is turned zero to thereby measure a magnetic field distribution on the surface of the specimen.
摘要翻译：能够以高分辨率测量磁场的绝对值而不引起探针的磁化状态变化的磁力显微镜。磁力显微镜包括悬臂，探针，位移检测器，其检测探针的位移，试样载体和各种转移单元。测量放置在试样载体上的试样表面上的波动分布以及磁场分布的磁力显微镜还设置有向探针施加磁场的磁场印迹单元，以及输出控制磁场印迹单元的位置，使得施加到探针5上的磁力变为零，从而测量样本表面上的磁场分布。

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