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    • 15. 发明授权
    • Secondary cell degradation state judgment system
    • 二次电池退化状态判断系统
    • US08396679B2
    • 2013-03-12
    • US12744398
    • 2008-11-26
    • Tsurayoshi ImanishiShinichi Kitamura
    • Tsurayoshi ImanishiShinichi Kitamura
    • G01R31/26H02J7/00
    • G01R31/3679G01R31/3682
    • A secondary cell degradation state judgment system which includes: operation information measurement means (5) measuring operations information on a secondary cell (3) such as a temperature, an elapse time, a discharge depth, and a discharge capacitance of the secondary cell; degradation value calculation means (7) which calculates degradation values (15) respectively corresponding to the measurement values according to the measurement values; degradation accumulation value storage means (8) which stores degradation accumulation values (14) accumulated for each of the calculated degradation values; main accumulation value selection means (9) which selects the greatest degradation value as a main accumulation value (16) from the degradation accumulation values; and overall degradation value calculation means (10) which calculates an overall degradation value (18) according to the selected main accumulation value and a degradation value corresponding to the degradation accumulation values which have not been selected as the main accumulation value.
    • 二次电池劣化状态判断系统,包括:操作信息测量装置(5),测量二次电池的温度,经过时间,放电深度和放电电容等二次电池(3)的操作信息; 劣化值计算装置(7),其根据测量值分别对应于测量值计算劣化值(15); 劣化累积值存储装置(8),其存储针对每个所计算的劣化值累积的劣化累积值(14) 主累积值选择装置(9),其根据劣化累积值选择最大劣化值作为主累积值(16); 和整体劣化值计算装置(10),其根据所选择的主累积值和对应于未被选择为主累积值的劣化累积值的劣化值来计算总体劣化值(18)。
    • 17. 发明申请
    • Phase Feedback AFM and Control Method Therefor
    • 相位反馈AFM及其控制方法
    • US20080229813A1
    • 2008-09-25
    • US12051362
    • 2008-03-19
    • Shinichi Kitamura
    • Shinichi Kitamura
    • G01B5/28
    • G01Q60/32G01Q10/065
    • A phase feedback AFM (atomic force microscope) and method for the phase feedback AFM. A cantilever is driven to oscillate at a constant frequency close to the resonance frequency of the cantilever by a driving signal. The distance between the probe and the sample is controlled such that the phase difference between the driving signal and a cantilever deflection signal indicating deflections of the cantilever is kept constant. The phase feedback AFM has an amplifier-controller for receiving the cantilever deflection signal, the output from an oscillator for driving the cantilever into oscillation, and a signal representing a reference amplitude of oscillation of the cantilever. The phase feedback AFM further includes a feedback circuit which receives the output from the amplifier-controller which controls the cantilever deflection signal to a preset amplitude.
    • 相位反馈AFM(原子力显微镜)和相位反馈AFM的方法。 通过驱动信号驱动悬臂以接近悬臂的共振频率的恒定频率振荡。 控制探针和样品之间的距离,使得驱动信号和指示悬臂的偏转的悬臂偏转信号之间的相位差保持恒定。 相位反馈AFM具有用于接收悬臂偏转信号的放大器控制器,用于驱动悬臂振荡的振荡器的输出以及表示悬臂的基准振荡振幅的信号。 相位反馈AFM还包括反馈电路,其接收来自控制悬臂偏转信号到预设幅度的放大器控制器的输出。