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    • 11. 发明申请
    • APPARATUS AND METHOD FOR TWO WAVE MIXING (TWM) BASED ULTRASONIC LASER TESTING
    • 用于双波混频(TWM)的超声波激光测试的装置和方法
    • US20080316498A1
    • 2008-12-25
    • US11553485
    • 2006-10-27
    • Thomas E. Drake, JR.Marc Dubois
    • Thomas E. Drake, JR.Marc Dubois
    • G01B9/02
    • G01N29/2418G01B9/02083G01B2290/65G01N2291/0231
    • A system and method for detecting ultrasonic surface displacements at a remote target are disclosed, one embodiment of the system comprising: a first laser to generate a first laser beam. The first laser beam produces ultrasonic surface displacements on a surface of the remote target. A second laser generates a second laser beam operable to detect the ultrasonic surface displacements on the surface of the remote target and to provide a reference beam to an interferometer. The second laser beam is split, at a beam-splitter, into a pump beam and a probe beam. The pump beam is amplified by a first amplifier and the probe beam is amplified by a second amplifier. The pump beam is then provided to the interferometer as a reference beam and the probe beam is directed to the target to detect the ultrasonic surface displacements. The first and second amplifiers can be controlled independently of one another to control their respective laser beam's power. Collection optics collect phase modulated light from the probe beam either reflected or scattered by the remote target, which can be optionally optically processed to increase the light intensity. The interferometer is a TWM interferometer that receives and processes the phase modulated light and generates at least one output signal based on the phase-modulated light and the amplified reference laser beam.
    • 公开了一种用于在远程目标处检测超声表面位移的系统和方法,该系统的一个实施例包括:第一激光器,用于产生第一激光束。 第一激光束在远程目标的表面上产生超声表面位移。 第二激光器产生可操作以检测远程目标表面上的超声波表面位移并向干涉仪提供参考光束的第二激光束。 第二激光束在分束器处分成泵浦光束和探测光束。 泵浦光束由第一放大器放大,并且探测光束被第二放大器放大。 然后将泵浦光束作为参考光束提供给干涉仪,并将探测光束引导到目标以检测超声波表面位移。 可以彼此独立地控制第一和第二放大器以控制它们各自的激光束的功率。 收集光学器件收集来自探测光束的相位调制光,其被远程目标物反射或散射,其可以可选地被光学处理以增加光强度。 干涉仪是TWM干涉仪,其接收和处理相位调制光并且基于相位调制光和放大的参考激光束产生至少一个输出信号。
    • 13. 发明授权
    • System and method of determining porosity in composite materials using ultrasound
    • 使用超声波测定复合材料孔隙度的系统和方法
    • US06684701B2
    • 2004-02-03
    • US09905444
    • 2001-07-13
    • Marc DuboisJohn B. Deaton, Jr.Peter W. LorraineThomas E. Drake, Jr.Robert J. Filkins
    • Marc DuboisJohn B. Deaton, Jr.Peter W. LorraineThomas E. Drake, Jr.Robert J. Filkins
    • G01H100
    • G01N29/30G01N29/11G01N29/2418G01N29/449G01N29/46G01N2291/014G01N2291/0231G01N2291/0245G01N2291/0289G01N2291/0421G01N2291/044
    • The invention provides for ultrasonically measuring the porosity in a sample composite material by accessing only one side of the sample composite material and includes the steps of measuring a sample ultrasonic signal from the sample composite material, normalizing the sample ultrasonic signal relative to the surface echo of the sample composite material, and isolating a sample back-wall echo signal from the sample ultrasonic signal. A sample frequency spectrum of the sample back-wall ultrasonic signal is then determined. Next, the method and system include the steps of measuring a reference ultrasonic signal from a reference composite material, normalizing the reference ultrasonic signal relative to the surface echo of the reference composite material; and isolating a reference back-wall echo signal from the sample ultrasonic signal. A reference frequency spectrum of the reference back-wall ultrasonic signal is then determined. The invention further includes deriving the ultrasonic attenuation of the sample ultrasonic signal as the ratio of the sample frequency spectrum to the reference frequency spectrum over a predetermined frequency range. Comparing the derived ultrasonic attenuation to predetermined attenuation standards permits evaluating the porosity of the sampled composite material.
    • 本发明提供了通过仅访问样品复合材料的一侧来超声波测量样品复合材料中的孔隙率,并且包括以下步骤:从样品复合材料测量样品超声波信号,使样品超声信号相对于表面回波归一化 样品复合材料,并从样品超声波信号中分离样品后壁回波信号。 然后确定样品后壁超声波信号的采样频谱。 接下来,该方法和系统包括以下步骤:从参考复合材料测量参考超声波信号,使参考超声信号相对于参考复合材料的表面回波标准化; 并从样本超声波信号隔离参考后壁回波信号。 然后确定参考后壁超声波信号的参考频谱。 本发明还包括将样本超声波信号的超声波衰减导出为在预定频率范围内的采样频谱与参考频谱的比率。 将得到的超声波衰减与预定的衰减标准进行比较,可以评估采样的复合材料的孔隙率。