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    • 15. 发明申请
    • MEMORY/LOGIC CONJUGATE SYSTEM
    • 内存/逻辑连接系统
    • US20110255323A1
    • 2011-10-20
    • US12977243
    • 2010-12-23
    • Kanji OtsukaTsuneo ItoYoichi SatoMasahiro YoshidaShigeru YamamotoTakeshi KoyamaYuko TanbaYutaka Akiyama
    • Kanji OtsukaTsuneo ItoYoichi SatoMasahiro YoshidaShigeru YamamotoTakeshi KoyamaYuko TanbaYutaka Akiyama
    • G11C5/06
    • G06F13/4022G11C5/02G11C7/1006G11C2213/71
    • There is a problem that a bandwidth bottleneck occurs because a crossbar switch is used to cope with an increase in scale. In an example of a memory/logic conjugate system according to the present invention, a plurality of cluster memory chips each including a plurality of cluster memories 20 including basic cells 10 arranged in a cluster, the basic cell 10 including a memory circuit, and a controller chip that controls the plurality of cluster memories are three-dimensionally stacked, the plurality of cluster memories 20 located along the stacking direction of the plurality of cluster memory chips and the controller chip are electrically coupled to the controller chip via a multibus 11 including a through-via, an arbitrary one of the basic cells 10 is directly accessed through the multibus 11 from the controller chip so that truth value data is written therein, and whereby the arbitrary basic cell 10 is switched to a logic circuit as conjugate.
    • 存在带宽瓶颈的问题,因为使用交叉开关来应对规模的增加。 在根据本发明的存储器/逻辑共轭系统的示例中,多个集群存储器芯片,每个集群存储器芯片包括多个集群存储器20,其包括布置在集群中的基本单元10,基本单元10包括存储器电路,以及 控制多个集群存储器的控制器芯片是三维堆叠的,沿着多个集群存储器芯片的堆叠方向定位的多个集群存储器20和控制器芯片经由多片11电连接到控制器芯片, 通孔中,任意一个基本单元10通过多轴11从控制器芯片直接访问,从而将真值数据写入其中,从而将任意的基本单元10切换到逻辑电路作为共轭。
    • 17. 发明授权
    • Memory/logic conjugate system
    • 存储器/逻辑共轭系统
    • US08305789B2
    • 2012-11-06
    • US12977243
    • 2010-12-23
    • Kanji OtsukaTsuneo ItoYoichi SatoMasahiro YoshidaShigeru YamamotoTakeshi KoyamaYuko TanbaYutaka Akiyama
    • Kanji OtsukaTsuneo ItoYoichi SatoMasahiro YoshidaShigeru YamamotoTakeshi KoyamaYuko TanbaYutaka Akiyama
    • G11C5/06
    • G06F13/4022G11C5/02G11C7/1006G11C2213/71
    • A bandwidth bottleneck occurs because a crossbar switch is used to cope with an increase in scale. A memory/logic conjugate system according to the present invention, a plurality of cluster memory chips each including a plurality of cluster memories 20 including basic cells 10 arranged in a cluster, the basic cell 10 including a memory circuit, and a controller chip that controls the plurality of cluster memories are three-dimensionally stacked, the plurality of cluster memories 20 located along the stacking direction of the plurality of cluster memory chips and the controller chip are electrically coupled to the controller chip via a multibus 11 including a through-via, an arbitrary one of the basic cells 10 is directly accessed through the multibus 11 from the controller chip so that truth value data is written therein, and whereby the arbitrary basic cell 10 is switched to a logic circuit as conjugate.
    • 发生带宽瓶颈是因为使用横杠开关来应对规模的增加。 根据本发明的存储器/逻辑共轭系统,多个集群存储器芯片,每个集群存储器芯片包括多个集群存储器20,集群存储器20包括布置在集群中的基本单元10,基本单元10包括存储器电路,以及控制芯片, 多个集群存储器是三维堆叠的,沿着多个集群存储器芯片的堆叠方向定位的多个集群存储器20和控制器芯片经由包括通孔的多通道11电耦合到控制器芯片, 基本单元10中的任意一个基本单元10通过多轴11从控制器芯片直接访问,从而将真值数据写入其中,并且由此将任意基本单元10切换到逻辑电路作为共轭。
    • 20. 发明授权
    • Method of fabricating semiconductor device with a high breakdown voltage between neighboring wells
    • 制造相邻孔之间具有高击穿电压的半导体器件的方法
    • US08148774B2
    • 2012-04-03
    • US12606634
    • 2009-10-27
    • Hidemitsu MoriKazuhiro TakimotoToshiyuki ShouKenji SasakiYutaka Akiyama
    • Hidemitsu MoriKazuhiro TakimotoToshiyuki ShouKenji SasakiYutaka Akiyama
    • H01L29/66H01L21/8238
    • H01L21/823892H01L21/26513H01L21/823493
    • To provide a semiconductor device in which an interval between first wells can be shortened by improving a separation breakdown voltage between the first wells and a method for manufacturing the same. A semiconductor device includes a first conductivity type semiconductor substrate 1, second conductivity type first wells 2 and 3 disposed on a surface layer of the semiconductor substrate 1 with a predetermined interval between them, a first conductivity type second well 4 disposed between the first wells 2 and 3 on the surface layer of the semiconductor substrate 1 and having an impurity concentration higher than that of the semiconductor substrate, a first conductivity type third well 5 at least disposed below the second well 4 in the semiconductor substrate 1 and having an impurity concentration higher than that of the semiconductor substrate 1 and lower than that of the second well 4, and a first conductivity type fourth well 11 at least disposed below the third well 5 in the semiconductor substrate 1 and having an impurity concentration higher than that of the semiconductor substrate 1 and lower than that of the second well 4.
    • 提供一种半导体器件,其中可以通过改善第一阱之间的分离击穿电压及其制造方法来缩短第一阱之间的间隔。 半导体器件包括第一导电类型半导体衬底1,设置在半导体衬底1的表面层上的第二导电类型的第一阱2和3之间的预定间隔,设置在第一阱2之间的第一导电类型第二阱4 并且在半导体衬底1的表面层上具有杂质浓度高于半导体衬底1的杂质浓度的第一导电类型第三阱5,至少设置在半导体衬底1中的第二阱4的下方并且杂质浓度更高 比半导体衬底1低,而低于第二阱4,以及第一导电类型的第四阱11,其至少设置在半导体衬底1中的第三阱5的下方,其杂质浓度高于半导体衬底的杂质浓度 1且低于第二孔4的厚度。