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11. 发明授权

US06815963B2 Probe for testing a device under test 失效
公开(公告)号：US06815963B2
公开(公告)日：2004-11-09
申请号：US10445099
申请日：2003-05-23
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R3100
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

12. 发明授权

US06803779B2 Interconnect assembly for use in evaluating probing networks 失效
标题翻译：用于评估探测网络的互连组件
公开(公告)号：US06803779B2
公开(公告)日：2004-10-12
申请号：US10459259
申请日：2003-06-11
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R3102
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/06772 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices.
摘要翻译：用于评估探针测量网络的互连组件包括基底，在基底的上表面上以相互共面的关系的相应的内部和外部探测区域，参考结点和连接探测区域和参考结点的高频传输结构使得高频信号可以均匀地传输，尽管例如可以在探测区域上对网络的设备探测端进行可变定位。用于评估网络的信号通道的优选方法包括将参考单元连接到参考点，并且将与感兴趣的信号通道相对应的每个设备探测端连续定位在内部探测区域上。由于传输结构均匀地传送信号，因此信号在进入或离开每一端时的相对状况将基本上与由参考单元测量或呈现的信号的条件相匹配，从而可以参考设备 - 探测结束。该组件特别适用于评估用于测试平面微电子器件的探针测量网络。

13. 发明授权

US06608496B1 Reference transmission line junction for probing device 失效
标题翻译：用于探测装置的参考传输线路结
公开(公告)号：US06608496B1
公开(公告)日：2003-08-19
申请号：US09611806
申请日：2000-07-07
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R3102
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/06772 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices.
摘要翻译：用于评估探针测量网络的互连组件包括基底，在基底的上表面上以相互共面的关系的相应的内部和外部探测区域，参考结点和连接探测区域和参考结点的高频传输结构使得高频信号可以均匀地传输，尽管例如可以在探测区域上对网络的设备探测端进行可变定位。用于评估网络的信号通道的优选方法包括将参考单元连接到参考点，并且将与感兴趣的信号通道相对应的每个设备探测端连续定位在内部探测区域上。由于传输结构均匀地传送信号，因此信号在进入或离开每一端时的相对状况将基本上与由参考单元测量或呈现的信号的条件相匹配，从而可以参考设备 - 探测结束。该组件特别适用于评估用于测试平面微电子器件的类型的探针测量网络。

14. 发明授权

US5973505A System for evaluating probing networks 失效
标题翻译：系统评估探测网络
公开(公告)号：US5973505A
公开(公告)日：1999-10-26
申请号：US175062
申请日：1998-10-19
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R31/26 , G01R1/00 , G01R1/067 , G01R1/073 , G01R31/02 , G01R31/28 , G01R35/00 , H01L21/66
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005 , G01R1/06772
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred there-between despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices.
摘要翻译：用于评估探针测量网络的互连组件包括基座，在基座的上表面上以相互共面关系的相应的内部和外部探测区域，参考点和连接探测区域和参考结点的高频传输结构使得尽管例如在探测区域上网络的设备探测端的可变定位，但是高频信号可以均匀地传送到其中。用于评估网络的信号通道的优选方法包括将参考单元连接到参考点，并且将与感兴趣的信号通道相对应的每个设备探测端连续定位在内部探测区域上。由于传输结构均匀地传送信号，因此信号在进入或离开每一端时的相对状况将基本上与由参考单元测量或呈现的信号的条件相匹配，从而可以参考设备 - 探测结束。该组件特别适用于评估用于测试平面微电子器件的类型的探针测量网络。

15. 发明授权

US07518387B2 Shielded probe for testing a device under test 失效
标题翻译：用于测试被测设备的屏蔽探头
公开(公告)号：US07518387B2
公开(公告)日：2009-04-14
申请号：US11906055
申请日：2007-09-27
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R31/02
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译：用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。

16. 发明授权

US07436194B2 Shielded probe with low contact resistance for testing a device under test 失效
标题翻译：具有低接触电阻的屏蔽探头，用于测试被测器件
公开(公告)号：US07436194B2
公开(公告)日：2008-10-14
申请号：US11977324
申请日：2007-10-24
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R31/00
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译：探针测量系统具有低稳定的接触电阻，用于测量集成电路或其他微电子器件在高频下的电气特性。

17. 发明授权

US07304488B2 Shielded probe for high-frequency testing of a device under test 失效
标题翻译：用于被测设备的高频测试的屏蔽探头
公开(公告)号：US07304488B2
公开(公告)日：2007-12-04
申请号：US11607398
申请日：2006-12-01
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R31/00
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.
摘要翻译：用于测量高频集成电路或其他微电子器件的电气特性的屏蔽探针。探针可以包括延伸穿过电介质基底的探针尖端，其在第一表面上支撑测试仪器的信号路径，并且在第二表面上支撑屏蔽信号路径和探针尖端的接地路径。

18. 发明授权

US07161363B2 Probe for testing a device under test 有权
公开(公告)号：US07161363B2
公开(公告)日：2007-01-09
申请号：US10848777
申请日：2004-05-18
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R31/00
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

19. 发明授权

US06987398B2 System for evaluating probing networks 失效
标题翻译：系统评估探测网络
公开(公告)号：US06987398B2
公开(公告)日：2006-01-17
申请号：US10951917
申请日：2004-09-28
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R31/02
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/06772 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.
摘要翻译：用于评估探针测量网络的互连组件包括基底，在基底的上表面上以相互共面的关系的相应的内部和外部探测区域，参考结点和连接探测区域和参考结点的高频传输结构使得高频信号可以在其间均匀地传输。用于评估网络的信号通道的优选方法包括将参考单元连接到参考点，并且将与感兴趣的信号通道相对应的每个设备探测端连续定位在内部探测区域上。

20. 发明授权

US5869975A System for evaluating probing networks that have multiple probing ends 失效
标题翻译：用于评估具有多个探测结束的探测网络的系统
公开(公告)号：US5869975A
公开(公告)日：1999-02-09
申请号：US866165
申请日：1997-05-30
申请人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
发明人： Eric W. Strid , Jerry B. Schappacher , Dale E. Carlton , K. Reed Gleason
IPC分类号： G01R31/26 , G01R1/00 , G01R1/067 , G01R1/073 , G01R31/02 , G01R31/28 , G01R35/00 , H01L21/66
CPC分类号： B82Y15/00 , G01R1/06705 , G01R1/073 , G01R31/2886 , G01R35/00 , G01R35/005 , G01R1/06772
摘要： An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement network can be simultaneously placed on these respective areas, a reference junction, and a high frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite variable positioning of the device-probing ends on the probing areas. Because the transmission structure uniformly transfers signals despite variable positioning of the device-probing ends, the measurement network can be accurately calibrated with reference, in particular, to the device-probing ends of the network by a reference unit connected to the reference junction.
摘要翻译：用于评估探针测量网络的互连组件包括基本相应的第一，第二和第三设备探测区域，所述第一，第二和第三设备探测区域以间隔开的关系布置在所述基座的上表面上，使得第一，第二和第三设备探测端属于测量网络可以同时放置在这些各个区域，参考结点和连接探测区域和参考结点的高频传输结构，使得高频信号可以在其间均匀地传输，尽管设备探测结束的可变定位在探测区域。由于尽管设备探测结束的可变定位，传输结构均匀地传送信号，所以可以通过参考连接到参考连接点的参考单元参考网络的设备探测端来精确地校准测量网络。

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