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    • 12. 发明授权
    • Lorentz force microscope and method of measuring magnetic domain using Lorentz force
    • 洛仑兹力显微镜和使用洛伦兹力测量磁畴的方法
    • US06696833B2
    • 2004-02-24
    • US10138643
    • 2002-05-06
    • Seung-bum HongJong Up JeonHyun-jung Shin
    • Seung-bum HongJong Up JeonHyun-jung Shin
    • G01R3302
    • G01Q60/54G01R33/0385
    • A Lorentz force microscope and a method of measuring magnetic domains using Lorentz force are provided. The Lorentz force microscope includes: a conductive probe which is actuated by Lorentz force occurring due to the interaction between a magnetic field of the magnetic medium and current applied into the magnetic field; a bottom electrode which is prepared on one side of the magnetic medium, for charging the magnetic field with electricity; a scanner for supporting the magnetic medium on which the bottom electrode is prepared and actuating the magnetic medium when the conductive probe opposite to a record of the magnetic medium scans the record of the magnetic medium; and an information detector for controlling the scanner and detecting information on magnetization of the magnetic medium from motion components of the conductive probe. Directions of Lorentz force which is applied to the conductive probe are sensed in a state that the conductive probe contacts or does not contact the magnetic medium to detect magnetization directions of the magnetic domains. Thus, a magnetic domain distribution map having improved resolution can be obtained.
    • 提供洛伦兹力显微镜和使用洛伦兹力测量磁畴的方法。 洛伦兹力显微镜包括:由于磁介质的磁场和施加到磁​​场中的电流之间的相互作用而产生的由洛伦兹力驱动的导电探针; 制备在磁介质一侧的用于对电磁场充电的底电极; 用于支撑制备底部电极的磁性介质的扫描器,当与磁性介质的记录相对的导电探针扫描磁性介质的记录时,致动磁性介质; 以及信息检测器,用于控制扫描仪并且从导电探针的运动分量检测关于磁介质的磁化的信息。 在导电探针接触或不接触磁介质以检测磁畴的磁化方向的状态下感测施加到导电探针的洛伦兹力的方向。 因此,可以获得具有改善的分辨率的磁畴分布图。