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    • 16. 发明申请
    • Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof
    • 电连接器设计和接触几何及其使用方法及其制造方法
    • US20060046528A1
    • 2006-03-02
    • US10928473
    • 2004-08-27
    • Brian BeamanGeorge ChiuKeith FogelPaul LauroDaniel MorrisDa-Yuan Shih
    • Brian BeamanGeorge ChiuKeith FogelPaul LauroDaniel MorrisDa-Yuan Shih
    • H01R12/00
    • H01R13/2464G01R1/06716G01R1/06727G01R1/07314G01R1/07357H01R12/714
    • A probe or an electrical connector comprises a substrate with a surface having a plurality of electrical contact locations. A shaped elongated electrical conductor has a first end coupled to one of the electrical contact locations and a second end thereof which projects away from the electrical contact location and through an aperture in a sheet of material. The sheet is disposed to be spaced apart from the surface of the substrate. At the second end of the elongated electrical conductor there is a tip structure, which is larger than the aperture in the sheet of material. The tip structure has a pointed portion thereof. The tip structure is disposed against contact locations of a contact surface. The electronic structure is moved towards the contact surface permitting the tip structure to penetrate into the surface of the electrical contact location thereon and to move, wipe, or vibrate across the surface thereof as the shaped elongated electrical conductor flexes as a result of being compressed by the movement of the electronic structure toward the contact surface.
    • 探针或电连接器包括具有多个电接触位置的表面的基底。 成形细长的电导体具有联接到电接触位置之一的第一端和其第二端,其突出远离电接触位置并穿过材料片中的孔。 片材被设置成与衬底的表面间隔开。 在细长电导体的第二端,有一个尖端结构,其大于该材料片中的孔。 尖端结构具有其尖端部分。 尖端结构设置成抵靠接触表面的接触位置。 电子结构朝向接触表面移动,允许尖端结构穿过其中的电接触位置的表面并且随着成形细长电导体由于被...的压缩而弯曲而在其表面上移动,擦拭或振动 电子结构向接触表面移动。