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    • 13. 发明申请
    • ANTI-FUSE MEMORY ULTILIZING A COUPLING CHANNEL AND OPERATING METHOD THEREOF
    • 防失真存储器可以实现一个耦合通道及其操作方法
    • US20130010518A1
    • 2013-01-10
    • US13413626
    • 2012-03-06
    • Hau-Yan LuHsin-Ming ChenChing-Sung Yang
    • Hau-Yan LuHsin-Ming ChenChing-Sung Yang
    • G11C17/00H01L27/088
    • H01L27/11206H01L23/5252H01L2924/0002H01L2924/00
    • An anti-fuse memory with coupling channel is provided. The anti-fuse memory includes a substrate of a first conductive type, a doped region of a second conductive type, a coupling gate, a gate dielectric layer, an anti-fuse gate, and an anti-fuse layer. The substrate has an isolation structure. The doped region is disposed in the substrate. A channel region is defined between the doped region and the isolation structure. The coupling gate is disposed on the substrate between the doped region and the isolation structure. The coupling gate is adjacent to the doped region. The gate dielectric layer is disposed between the coupling gate and the substrate. The anti-fuse gate is disposed on the substrate between the coupling gate and the isolation structure. The anti-fuse gate and the coupling gate have a space therebetween. The anti-fuse layer is disposed between the anti-fuse gate and the substrate.
    • 提供具有耦合通道的反熔丝存储器。 反熔丝存储器包括第一导电类型的衬底,第二导电类型的掺杂区域,耦合栅极,栅极介电层,反熔丝栅极和反熔丝层。 衬底具有隔离结构。 掺杂区域设置在衬底中。 在掺杂区域和隔离结构之间限定沟道区域。 耦合栅极设置在掺杂区域和隔离结构之间的衬底上。 耦合栅极与掺杂区域相邻。 栅极电介质层设置在耦合栅极和衬底之间。 反熔丝栅极设置在耦合栅极和隔离结构之间的衬底上。 反熔丝栅极和耦合栅极之间具有间隔。 反熔丝层设置在反熔丝栅极和衬底之间。
    • 14. 发明申请
    • Non-volatile memory structure and method for manufacturing the same
    • 非易失性存储器结构及其制造方法
    • US20120223381A1
    • 2012-09-06
    • US13191424
    • 2011-07-26
    • Hau-Yan LuHsin-Ming ChenChing-Sung Yang
    • Hau-Yan LuHsin-Ming ChenChing-Sung Yang
    • H01L21/336H01L29/792
    • H01L29/792H01L29/40117H01L29/42344H01L29/66833
    • A non-volatile memory structure is disclosed. LDD regions may be optionally formed through an ion implantation using a mask for protection of a gate channel region of an active area. Two gates are apart from each other and disposed on an isolation structure on two sides of a middle region of the active area, respectively. The two gates may be each entirely disposed on the isolation structure or partially to overlap a side portion of the middle region of the active area. A charge-trapping layer and a dielectric layer are formed between the two gates and on the active area to serve for a storage node function. They may be further formed onto all sidewalls of the two gates to serve as spacers. Source/drain regions are formed through ion implantation using a mask for protection of the gates and the charge-trapping layer.
    • 公开了一种非易失性存储器结构。 可以通过使用用于保护有源区的栅极沟道区的掩模的离子注入任选地形成LDD区。 两个门彼此分开并且分别设置在有源区域的中间区域的两侧上的隔离结构上。 两个门可以各自完全设置在隔离结构上,或者部分地与有效区域的中间区域的侧部重叠。 在两个门之间和有源区域上形成电荷俘获层和电介质层,用于存储节点功能。 它们可以进一步形成在两个门的所有侧壁上,用作间隔物。 通过使用用于保护栅极和电荷俘获层的掩模的离子注入形成源/漏区。