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    • 12. 发明申请
    • Power Converter and Driving Method Thereof
    • 电源转换器及其驱动方法
    • US20090231894A1
    • 2009-09-17
    • US12258157
    • 2008-10-24
    • Sang-Cheol MoonGwan-Bon KooJin-Tae KimYoung-Bae Park
    • Sang-Cheol MoonGwan-Bon KooJin-Tae KimYoung-Bae Park
    • H02M7/04
    • H02M3/33507
    • In a power converter, a primary coil receives an input voltage, and a switch includes a first electrode, a second electrode coupled to the primary coil, and a control electrode. An output unit includes a secondary coil, and outputs an output voltage. The primary coil and the secondary coil form a transformer, and the input voltage is converted to the output voltage by the transformer. A controller receives a sensing voltage corresponding to a switch current flowing between the first electrode and the second electrode of the switch, detects a valley point of a voltage between the first electrode and the second electrode of the switch based on the sensing voltage, and transmits a control signal to the control electrode of the switch in accordance with the valley point,
    • 在功率转换器中,初级线圈接收输入电压,并且开关包括第一电极,耦合到初级线圈的第二电极和控制电极。 输出单元包括次级线圈,并输出输出电压。 初级线圈和次级线圈形成变压器,输入电压由变压器转换成输出电压。 控制器接收对应于在开关的第一电极和第二电极之间流动的开关电流的感测电压,基于感测电压检测开关的第一电极和第二电极之间的电压的谷点,并且传输 根据谷点向开关的控制电极施加控制信号,
    • 13. 发明申请
    • Frequency modulation device and switching mode power supply using the same
    • 调频装置和开关电源使用相同
    • US20090028235A1
    • 2009-01-29
    • US12220768
    • 2008-07-25
    • Young-Bae ParkGwan-Bon Koo
    • Young-Bae ParkGwan-Bon Koo
    • H03K7/08
    • H03K7/06
    • The present invention relates to a frequency modulation device and a switching mode power supply using the frequency modulation device. To prevent electromagnetic interference (EMI), it is required to slightly vary a switching operation frequency in an SMPS operation. In some embodiments, at least one first signal having a predetermined cycle is generated, a second signal corresponding to a level of a first signal is generated at a turn-off time of a switch, a first reference voltage having at least two different levels is generated according to the second signal, and an oscillator signal for increasing along a first slope during a first period and decreasing along a second slope during a second period between the first reference voltage and a second reference voltage having a level that is different from the first reference voltage is generated.
    • 本发明涉及使用该调频装置的频率调制装置和开关模式电源。 为了防止电磁干扰(EMI),需要在SMPS操作中稍微改变开关操作频率。 在一些实施例中,产生具有预定周期的至少一个第一信号,在开关的关断时间产生对应于第一信号的电平的第二信号,具有至少两个不同电平的第一参考电压是 根据第二信号生成的振荡器信号,以及振荡器信号,用于在第一周期期间沿着第一斜率增加,并且在第一参考电压和第二参考电压之间的第二周期期间沿着第二斜率减小,该第二参考电压具有与第一 产生参考电压。
    • 16. 发明申请
    • Thin film transistor array substrate, method for manufacturing the same and system for inspecting the substrate
    • 薄膜晶体管阵列基板及其制造方法以及检查基板的系统
    • US20050087770A1
    • 2005-04-28
    • US10986930
    • 2004-11-15
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • Hyang-Shik KongSung-Wook HuhYoung-Bae Park
    • G02F1/136H01L21/3213H01L21/77H01L21/84H01L27/12H01L27/13H01L29/73
    • G02F1/1362G02F1/13458G02F2001/136254H01L21/32134H01L21/32136H01L27/124H01L27/1255H01L27/1288
    • Disclosed is a thin film transistor substrate and a system for inspecting the same. The thin film transistor substrate comprises gate wiring formed on an insulation substrate and including gate lines, and gate electrodes and gate pads connected to the gate lines; a gate insulation layer covering the gate wiring; a semiconductor layer formed over the gate insulation layer; data wiring formed over the gate insulation layer and including data pads; a protection layer covering the data wiring; auxiliary pads connected to the data pads through contact holes formed in the protection layer; and a pad auxiliary layer formed protruding a predetermined height under the data pads. The inspection system for determining whether a thin film transistor substrate is defective, in which the thin film transistor substrate comprises gate wiring including gate lines, gate electrodes and gate pads, and data wiring including source electrodes and drain electrodes, includes a probe pin for contacting the gate pads or data pads and transmitting a corresponding signal, wherein a contact tip at a distal end of the probe pin for contacting the gate pads or the data pads is rounded, and a radius of the rounded contact tip is 2 μm or less, or the rounded contact tip is coated with gold (Au).
    • 公开了一种薄膜晶体管基板及其检查系统。 薄膜晶体管基板包括形成在绝缘基板上并包括栅极线的栅极布线,以及连接到栅极线的栅电极和栅极焊盘; 覆盖栅极布线的栅极绝缘层; 形成在所述栅绝缘层上的半导体层; 数据布线形成在栅极绝缘层上并包括数据焊盘; 覆盖数据线的保护层; 辅助焊盘通过形成在保护层中的接触孔连接到数据焊盘; 以及在数据焊盘下方突出预定高度形成的焊盘辅助层。 用于确定薄膜晶体管基板是否缺陷的检查系统,其中薄膜晶体管基板包括包括栅极线,栅电极和栅极焊盘的栅极布线,以及包括源电极和漏电极的数据布线,包括用于接触的探针 栅极焊盘或数据焊盘并传输相应的信号,其中用于接触栅极焊盘或数据焊盘的探针的远端处的接触尖端是圆形的,并且圆形接触尖端的半径为2μm或更小, 或圆形接触尖端涂有金(Au)。