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    • 14. 发明申请
    • LITHOGRAPHIC APPARATUS AND METHOD FOR CALIBRATING THE SAME
    • 平台设备及其校准方法
    • US20090207422A1
    • 2009-08-20
    • US12426713
    • 2009-04-20
    • Erik Roelof LOOPSTRALeon Martin LEVASIERRene OESTERHOLT
    • Erik Roelof LOOPSTRALeon Martin LEVASIERRene OESTERHOLT
    • G01B11/14
    • G03F7/70775G03F7/70458G03F7/70516G03F9/7011G03F9/7019
    • A measurement system configured to measure a position of an object in a lithographic apparatus, includes at least three position detectors configured to detect the position of the object, the at least three position detectors each including a single or multi-dimensional optical encoder to provide at least six position values, the optical encoders being coupled to the object at different locations within a three dimensional coordinate system, wherein at least one position value is provided for each dimension of the three dimensional coordinate system, and wherein the measurement system is configured to calculate the position of the object within the three dimensional coordinate system from a subset of at least three of the six position values and to calculate an orientation of the object with respect to the three dimensional coordinate system from another subset of at least three of the six position values.
    • 被配置为测量光刻设备中的物体的位置的测量系统包括配置成检测物体的位置的至少三个位置检测器,所述至少三个位置检测器包括单个或多维光学编码器以提供在 至少六个位置值,所述光学编码器在三维坐标系内的不同位置处耦合到所述对象,其中为所述三维坐标系的每个维度提供至少一个位置值,并且其中所述测量系统被配置为计算 从六个位置值中的至少三个的子集的三维坐标系中的对象的位置,并且从六个位置中的至少三个的另一子集计算相对于三维坐标系的对象的取向 价值观。