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    • 11. 发明授权
    • Structure of wheel rim cover
    • 轮辋盖结构
    • US07314255B2
    • 2008-01-01
    • US11230475
    • 2005-09-21
    • Ming-Fang Wang
    • Ming-Fang Wang
    • B60B7/12
    • B60B7/10
    • The invention structure of wheel rim cover includes: a cover body whose disc surface has a plurality of spokes separated by openings; many fasteners are set on an outer edge of a rearward end hole of each opening. The fasteners are grouped surrounding the end hole of a same opening, and are jointly supported by a spring ring. The whole cover body can make use of the fasteners to latch on the end hole of the opening of a targeted wheel rim to fasten the cover body on the wheel rim.
    • 轮缘盖的发明结构包括:盖体,其盘表面具有由开口分开的多个辐条; 许多紧固件设置在每个开口的后端孔的外边缘上。 紧固件分组围绕相同开口的端​​孔,并且由弹簧环共同支撑。 整个盖体可以利用紧固件锁定在目标轮缘的开口的端孔上,以将盖体固定在轮缘上。
    • 13. 发明授权
    • Process for integration of a high dielectric constant gate insulator layer in a CMOS device
    • 在CMOS器件中集成高介电常数栅极绝缘体层的工艺
    • US06914313B2
    • 2005-07-05
    • US10696007
    • 2003-10-29
    • Ming-Fang WangChien-Hao ChenLiang-Gi YaoShih-Chang Chen
    • Ming-Fang WangChien-Hao ChenLiang-Gi YaoShih-Chang Chen
    • H01L21/8238H01L29/76
    • H01L21/823857H01L21/823807H01L21/823814H01L29/665Y10S257/90
    • A CMOS device structure, and a method of fabricating the CMOS device, featuring a gate insulator layer comprised of a high k metal oxide layer, has been developed. The process features formation of recessed, heavily doped source/drain regions, and of vertical, polysilicon LDD spacers, prior to deposition of the high k metal oxide layer. Removal of a silicon nitride shape, previously used as a mask for definition of the recessed regions, which in turn are used for accommodation of the heavily doped source/drain regions, provides the space to be occupied by the high k metal oxide layer. The integrity of the high k, gate insulator layer, butted by the vertical polysilicon spacers, and overlying a channel region provided by the non-recessed portion of the semiconductor substrate, is preserved via delayed deposition of the metal oxide layer, performed after high temperature anneals such as the activation anneal for heavily doped source/drain regions, as well as the anneal used for metal silicide formation.
    • 已经开发了CMOS器件结构,以及制造具有由高k金属氧化物层构成的栅极绝缘体层的CMOS器件的方法。 在沉积高k金属氧化物层之前,该工艺特征是形成凹陷的,重掺杂的源极/漏极区域以及垂直的多晶硅LDD间隔物。 先前用作凹陷区域的掩模的氮化硅形状的去除,其又用于重掺杂源极/漏极区域的适应,提供了由高k金属氧化物层占据的空间。 通过延迟沉积金属氧化物层,在高温下进行保存,通过垂直多晶硅间隔物对接的高k栅极绝缘体层的完整性,并覆盖由半导体衬底的非凹陷部分提供的沟道区域 退火如重掺杂源极/漏极区的激活退火,以及用于金属硅化物形成的退火。
    • 14. 发明授权
    • Wheel cover having rotating wing plate
    • 轮盖有旋翼板
    • US06702396B1
    • 2004-03-09
    • US10350029
    • 2003-01-24
    • Ming-Fang Wang
    • Ming-Fang Wang
    • B60B704
    • B60B7/20
    • A wheel cover. The wheel cover includes engraved holes with special shapes on a circular disc of the wheel cover, latch members on the backside of the wheel cover, and the latch members define a diameter of an area on the wheel cover for embedding the steel wheel. A turning disc is disposed on the wheel cover. An axle is disposed on the axle and pivotally coupled to a bearing on the wheel cover. A wing plate is defined on the turning disc, and the wing plate rotates independently from the wheel cover when the vehicle is moving.
    • 轮罩。 轮盖包括在轮盖的圆盘上具有特殊形状的雕刻孔,在轮盖的后侧上的闩锁构件,并且闩锁构件限定轮盖上的用于嵌入钢轮的区域的直径。 转盘被设置在车轮罩上。 轴设置在轴上并且枢转地联接到轮罩上的轴承。 翼板限定在转盘上,当车辆移动时,翼板独立于车轮罩旋转。
    • 17. 发明授权
    • Process for integration of a high dielectric constant gate insulator layer in a CMOS device
    • 在CMOS器件中集成高介电常数栅极绝缘体层的工艺
    • US07393766B2
    • 2008-07-01
    • US11119951
    • 2005-05-02
    • Ming-Fang WangChien-Hao ChenLiang-Gi YaoShih-Chang Chen
    • Ming-Fang WangChien-Hao ChenLiang-Gi YaoShih-Chang Chen
    • H01L21/425
    • H01L21/823857H01L21/823807H01L21/823814H01L29/665Y10S257/90
    • A CMOS device structure, and a method of fabricating the CMOS device, featuring a gate insulator layer comprised of a high k metal oxide layer, has been developed. The process features formation of recessed, heavily doped source/drain regions, and of vertical, polysilicon LDD spacers, prior to deposition of the high k metal oxide layer. Removal of a silicon nitride shape, previously used as a mask for definition of the recessed regions, which in turn are used for accommodation of the heavily doped source/drain regions, provides the space to be occupied by the high k metal oxide layer. The integrity of the high k, gate insulator layer, butted by the vertical polysilicon spacers, and overlying a channel region provided by the non-recessed portion of the semiconductor substrate, is preserved via delayed deposition of the metal oxide layer, performed after high temperature anneals such as the activation anneal for heavily doped source/drain regions, as well as the anneal used for metal silicide formation.
    • 已经开发了CMOS器件结构,以及制造具有由高k金属氧化物层构成的栅极绝缘体层的CMOS器件的方法。 在沉积高k金属氧化物层之前,该工艺特征是形成凹陷的,重掺杂的源极/漏极区域以及垂直的多晶硅LDD间隔物。 先前用作凹陷区域的掩模的氮化硅形状的去除,其又用于重掺杂源极/漏极区域的适应,提供了由高k金属氧化物层占据的空间。 通过延迟沉积金属氧化物层,在高温下进行保存,通过垂直多晶硅间隔物对接的高k栅极绝缘体层的完整性,并覆盖由半导体衬底的非凹陷部分提供的沟道区域 退火如重掺杂源极/漏极区的激活退火,以及用于金属硅化物形成的退火。