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    • 11. 发明申请
    • PT1-2 PULL TAB
    • PT1-2拉杆
    • US20110253719A1
    • 2011-10-20
    • US12613549
    • 2009-11-06
    • GABE CHERIAN
    • GABE CHERIAN
    • B65D17/34
    • B65D51/22B65D17/4012B65D2517/0014B65D2517/0073B65D2517/0079Y10S220/906
    • The invention covers a number of alternative improvements to the prior art pull-tab used to open container such as soda cans. One improvement is by forming the nose of the pull tab at a certain angle to the body of the tab, thus allowing the user to tilt the tab thus lifting the pull tip higher and providing more room for the user to insert the finger tip under the pull tip thus making it easier to open the container. Another improvement is by rotating the pull tab a certain angle and making it follow a caming surface thus lifting the pull tip and again providing more room to insert the finger tip and making it easier to open the container.
    • 本发明涵盖了用于打开诸如苏打水罐的容器的现有技术拉片的许多替代改进。 一个改进是通过将拉片的鼻部以一定的角度形成到突片的主体上,从而允许使用者倾斜拉片,从而更高地提升拉头,并为使用者提供更多的空间,以将指尖插入在 拉尖,从而更容易打开容器。 另一个改进是通过使拉片旋转一定角度并使其跟随一个凸轮表面,从而提升拉尖,并且再次提供更多的空间来插入指尖并且使得容易打开容器。
    • 13. 发明申请
    • S&P3 CWW2 CONNECTORS WITH WIPE
    • S&P3 CWW2连接器与WIPE
    • US20090181560A1
    • 2009-07-16
    • US12395700
    • 2009-03-01
    • GABE CHERIAN
    • GABE CHERIAN
    • H05K1/02H05K1/00
    • H01L23/49811G01R1/0466G01R1/07357H01L23/49555H01L2924/00013H01L2924/0002H01L2924/3011H01R12/52H01R12/714H01R12/89H01R13/2421H01R13/2435H05K7/1069Y10T29/49147Y10T29/49151Y10T29/49204Y10T29/49208Y10T29/49218Y10T29/49222H01L2224/29099H01L2924/00
    • The present invention relates generally to interconnections between electrical and electronic devices, such as integrated circuit packages, chips, wafers, substrates or printed circuit boards or similar electronic devices.The invention relates more specifically to springs, used to make connections to electrical elements and to applications of such springs in connectors or interconnection devices. More particularly the springs can be located adjacent to each other on small effective center distances to accommodate high-density electronic devices.Furthermore, the invention relates to connectors that comprise combs that are used in conjunction with such springs, to create and to control the wiping or scrubbing action, which can promote good electrical connection. Moreover, the invention uses such combs that are thermally matched to the electronic devices to improve the performance during thermal cycling procedures.Finally, this invention describes a number of connectors, test heads and test probes that utilize the above springs and combs.
    • 本发明一般涉及电气和电子设备之间的互连,例如集成电路封装,芯片,晶片,基板或印刷电路板或类似的电子设备。 本发明更具体地涉及用于连接电气元件的弹簧以及这种弹簧在连接器或互连装置中的应用。 更具体地,弹簧可以以小的有效中心距离彼此相邻,以适应高密度电子设备。 此外,本发明涉及包括与这种弹簧结合使用的梳子的连接器,以产生并控制擦拭或擦洗动作,这可以促进良好的电连接。 此外,本发明使用与电子设备热匹配的这种梳子来改善热循环过程中的性能。 最后,本发明描述了许多使用上述弹簧和梳子的连接器,测试头和测试探头。
    • 17. 发明申请
    • MP3 MICRO PROBE
    • US20070210816A1
    • 2007-09-13
    • US11752942
    • 2007-05-24
    • Gabe Cherian
    • Gabe Cherian
    • G01R31/02
    • G01R1/0735
    • Described are methods of using probes, for making electrical contact to high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has been made. This is to create the desired wipe or scrub. The second group includes probes that operate on the principle of suction cups. When the probe is pushed against the device under test, the probe working tips stretch outwardly and create the desirable wipe or scrub. Described also are the probes themselves that are used for the above methods. In this divisional application, the emphasis is on the first group.
    • 描述了使用探针,用于与高密度芯片或类似电子器件进行电接触的方法。 两组探头被覆盖。 第一组包括在进行初始接触之后横向移动平行于被测设备的接触垫表面的探针。 这是为了创造所需的擦拭或擦洗。 第二组包括按吸盘原理操作的探头。 当探头被推到被测设备上时,探头工作尖端向外伸展并产生理想的擦拭或擦洗。 还描述了用于上述方法的探针本身。 在这个分案申请中,重点是第一组。