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    • 17. 发明授权
    • Probe card and method for producing the same
    • 探针卡及其制作方法
    • US07248064B2
    • 2007-07-24
    • US11287455
    • 2005-11-28
    • Dai-Gil LeeSeong-Su KimByung-Chul KimDong-Chang Park
    • Dai-Gil LeeSeong-Su KimByung-Chul KimDong-Chang Park
    • G01R31/02
    • G01R3/00G01R1/06711G01R1/07342Y10T29/49117Y10T29/49151Y10T29/49204
    • A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly.
    • 探针卡用于通过探针卡与目标测试对象的每个电极焊盘的同时接触来对目标测试对象进行目视测试。 探针卡包括多个由导线线组成的探针,并且具有弯曲的可弹性变形的接触部分以与目标测试对象的电极焊盘接触。 接触部分沿同一方向定向并且彼此平行地延伸。 探针卡还包括用于固定固定探针的一个端部的第一绝缘块,用于固定地固定探针的另一个端部的第二绝缘块和用于保持第一和第二绝缘块的安装板, 探针的接触部分向外突出。