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    • 123. 发明授权
    • Trilayer resist scheme for gate etching applications
    • 栅极蚀刻应用的三层抗蚀剂方案
    • US08084825B2
    • 2011-12-27
    • US12245946
    • 2008-10-06
    • Nicholas C. FullerTimothy J. DaltonYing Zhang
    • Nicholas C. FullerTimothy J. DaltonYing Zhang
    • H01L29/78H01L27/088H01L20/10
    • H01L21/32139H01L21/0332H01L21/28123
    • A trilayer resist (TLR) patterning scheme is provided to enable gate conductors, particularly polySi gate conductors, with critical dimensions (CDs) of less than 40 nm and minimal LER and LWR. In accordance with the present invention, the inventive patterning scheme utilizes an organic/inorganic/organic multilayer stack instead of an organic layer used in the prior art. The top organic layer of the inventive TLR is a photoresist material such as a 193 nm photoresist that is located atop an antireflective coating (ARC), which is also comprised of an organic material. The middle inorganic layer of the TLR comprises any oxide layer such as, for example, a low temperature (less than or equal to 250° C.) chemical vapor deposited (CVD) oxide, an oxide derived from TEOS (tetraethylorthosilicate), silicon oxide, a silane oxide, or a Si-containing ARC material. The bottom organic layer of the TLR comprises any organic layer such as, for example, a Near Frictionless Carbon (NFC), a diamond-like carbon, a thermosetting polyarylene ether.
    • 提供三层抗蚀剂(TLR)图案化方案,以使栅极导体,特别是多晶硅栅极导体,临界尺寸(CD)小于40nm,最小LER和LWR。 根据本发明,本发明的图案化方案利用有机/无机/有机多层堆叠代替现有技术中使用的有机层。 本发明TLR的顶部有机层是诸如193nm光致抗蚀剂的光致抗蚀剂材料,其位于抗反射涂层(ARC)的顶部,抗反射涂层也由有机材料构成。 TLR的中间无机层包括任何氧化物层,例如化学气相沉积(CVD)的低温(小于或等于250℃),源自TEOS(原硅酸四乙酯),氧化硅 ,硅烷氧化物或含Si的ARC材料。 TLR的底部有机层包括任何有机层,例如近无摩擦碳(NFC),类金刚石碳,热固性聚亚芳基醚。