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111. 发明申请

US20110222065A1 Reflection characteristic measuring apparatus for sheet specimen, method of calibrating reflection characteristic measuring apparatus for sheet specimen, and calibration reference plate for use in calibration of reflection characteristic measuring apparatus for sheet specimen 有权
标题翻译：用于片材试样的反射特性测量装置，用于片材试样的校正反射特性测量装置的方法和用于片材试样的反射特性测量装置的校准的校准参考板
公开(公告)号：US20110222065A1
公开(公告)日：2011-09-15
申请号：US13111324
申请日：2011-05-19
申请人： Kenji IMURA
发明人： Kenji IMURA
IPC分类号： G01N21/55
CPC分类号： G01N21/55
摘要： A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
摘要翻译：提供了一种能够高速扫描片材试样表面的反射特性测量装置。反射特性测量装置包括一组照明和光接收系统，用于将照射光引导到由样本保持辊对保持的片材样本的表面上，并用于接收来自样品表面的反射光。照明和光接收系统测量所接收的反射光的光谱特性。照明和光接收系统设置在沿片材的纵向方向延伸的一维彩色样本阵列上，并沿与片材被传送方向相反的方向扫描一维阵列。

112. 发明申请

US20110019192A1 SPECTRAL CHARACTERISTIC MEASURING SYSTEM, SPECTRAL CHARACTERISTIC MEASURING INSTRUMENT, AND DATA PROCESSING DEVICE 有权
标题翻译：光谱特性测量系统，光谱特性测量仪器和数据处理设备
公开(公告)号：US20110019192A1
公开(公告)日：2011-01-27
申请号：US12934247
申请日：2009-03-16
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01J3/46
CPC分类号： G01J3/50 , G01J3/10 , G01J3/2803 , G01J3/501 , G01J3/502 , G01J3/524
摘要： An object of the present invention is to provide a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing apparatus, and a program, which make it possible to appropriately correct an influence of an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission, in a scanning type color measurement system or the like which sequentially measures many color samples 1n and in which a semiconductor light-emitting element such as an LED is used as a light source and a reference system is not provided.Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to thereby estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained. Spectral characteristics of the color sample are identified based on the spectral distribution of the reflected light or the transmitted light reflected by or transmitted through the color sample and the estimated spectral distribution.
摘要翻译：本发明的目的是提供一种光谱特性测量系统，光谱特征测量仪器，数据处理设备和程序，其可以适当地校正由温度升高引起的照明光变化的影响在扫描型色彩测量系统等中，由于发光而导致的半导体发光元件，其顺序地测量许多颜色样本1n，并且其中诸如LED的半导体发光元件用作光源和参考系统不提供。内插测量颜色样本之前和之后测量的照明光的光谱分布，从而估计获得彩色样本的光谱分布时的照明光的光谱分布。基于反射光的光谱分布或由颜色样本反射或透射的透射光的光谱分布和估计的光谱分布来识别颜色样本的光谱特性。

113. 发明授权

US07812969B2 Three-dimensional shape measuring apparatus 失效
标题翻译：三维形状测量仪
公开(公告)号：US07812969B2
公开(公告)日：2010-10-12
申请号：US11820972
申请日：2007-06-21
申请人： Koji Morimoto , Yoshihisa Abe , Shinichi Horita
发明人： Koji Morimoto , Yoshihisa Abe , Shinichi Horita
IPC分类号： G01B11/24
CPC分类号： G01B11/2545
摘要： A three-dimensional shape measuring apparatus includes a measuring section and a data integrating section. The measuring section has three-dimensional measurement dimensions, and measures a three-dimensional shape of a measurement object in a non-contact state. The measuring section measures a three-dimensional shape of a part of the measurement object multiple times by shifting the measurement dimensions to obtain multiple measurement data. The measurement dimensions are shifted in such a manner that at least portions of consecutive measurement dimensions by the shifting are lapped one over the other. The data integrating section integrates the multiple measurement data to obtain the three-dimensional shape of the measurement object. The data integrating section executes the data integration, using reliability information attributed to the respective measurement data.
摘要翻译：三维形状测量装置包括测量部分和数据积分部分。测量部具有三维测量尺寸，并且测量非接触状态下的测量对象的三维形状。测量部通过移动测量尺寸来测量测量对象的一部分的三维形状以获得多个测量数据。测量尺寸以这样的方式移动，使得通过移位的连续测量尺寸的至少一部分彼此重叠。数据积分部分集成了多个测量数据，以获得测量对象的三维形状。数据积分部使用归属于各测量数据的可靠性信息来执行数据积分。

114. 发明申请

US20100103407A1 Optical characteristic measuring apparatus 有权
标题翻译：光学特性测量仪器
公开(公告)号：US20100103407A1
公开(公告)日：2010-04-29
申请号：US12589410
申请日：2009-10-22
申请人： Kenji Imura
发明人： Kenji Imura
IPC分类号： G01N21/00
CPC分类号： G01N21/25 , G01N21/64
摘要： An optical characteristic measuring apparatus of the invention includes a sequentially-readable charge storage sensor array having a plurality of light receiving elements. Irradiation of first illumination light and second illumination light is controlled in such a manner that a period for irradiating the second illumination light onto a sample containing a fluorescent material is included in an integration period of each of the light receiving elements for receiving a wavelength component of fluoresced light from the sample in measuring an optical characteristic of the sample. The optical characteristic measuring apparatus having the above arrangement enables to accurately measure the optical characteristics of samples containing a fluorescent material in a short time by scanning the samples.
摘要翻译：本发明的光学特性测量装置包括具有多个光接收元件的顺序可读电荷存储传感器阵列。控制第一照明光和第二照明光的照射，使得将用于将第二照明光照射到含有荧光材料的样品的周期包括在用于接收波长成分的每个光接收元件的积分期间在测量样品的光学特性时，来自样品的荧光发光。具有上述结构的光学特性测量装置能够通过扫描样品来在短时间内精确地测量含有荧光材料的样品的光学特性。

115. 发明授权

US07705983B2 Wavelength displacement correcting system 有权
标题翻译：波长位移校正系统
公开(公告)号：US07705983B2
公开(公告)日：2010-04-27
申请号：US12020797
申请日：2008-01-28
申请人： Kenji Imura , Takeshi Matsumoto
发明人： Kenji Imura , Takeshi Matsumoto
IPC分类号： G01J3/28
CPC分类号： G01J3/18 , G01J3/02 , G01J3/027 , G01J3/28 , G01J3/2803 , G01J2003/2866
摘要： A wavelength displacement correcting system and method where a monochromatic beam from an LED is incident through an incident slit of a spectral device and is diffracted on a diffraction grating to form a dispersed light image. Information relating to the dispersed light image is outputted and a wavelength displacement is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width is calculated, using the calculated wavelength displacement amount of the beam, and the calculated wavelength displacement amounts of at least two diffracted beams.
摘要翻译：一种波长位移校正系统和方法，其中来自LED的单色光束通过光谱器件的入射狭缝入射并衍射在衍射光栅上以形成分散的光图像。输出与分散的光图像相关的信息，并且使用与恒定电流对应的正向电压值和正向电压初始值来计算波长位移。使用至少两个衍射光束的输出值和相对于分散光图像的衍射光束输出初始值来计算至少两个衍射光束的波长位移量。使用计算出的波束位移量和至少两个衍射光束的计算波长位移量来计算色散宽度。

116. 发明申请

US20100067004A1 Spectral characteristic measuring apparatus, method for calibrating spectral characteristic measuring apparatus, and spectral characteristic measuring system 有权
标题翻译：光谱特征测量装置，用于校准光谱特征测量装置的方法和光谱特征测量系统
公开(公告)号：US20100067004A1
公开(公告)日：2010-03-18
申请号：US12584207
申请日：2009-09-01
申请人： Yoshiyuki Nagashima , Yasushi Gotto , Kazuya Kiyoi
发明人： Yoshiyuki Nagashima , Yasushi Gotto , Kazuya Kiyoi
IPC分类号： G01J3/28
CPC分类号： G01J3/28 , G01J3/02 , G01J3/0208 , G01J3/027 , G01J3/10
摘要： A spectral characteristic measuring apparatus includes: an illuminating section for irradiating illumination light onto a sample; a spectral section for separating light from the sample irradiated with the illumination light into light rays in accordance with wavelengths; a light receiving section including a plurality of light receiving elements for receiving the light rays separated by the spectral section in accordance with wavelengths, and converting the received light rays into electrical output signals; and a storing section for storing a combined central wavelength of each of the light receiving elements calculated in advance based a spectral intensity distribution of the illumination light.
摘要翻译：光谱特性测量装置包括：用于将照明光照射到样品上的照明部分; 用于将照射光的样品的光根据波长分离成光线的光谱部分; 光接收部分，包括多个光接收元件，用于接收根据波长由光谱部分分离的光线，并将接收的光线转换成电输出信号; 以及存储部，其基于照明光的光谱强度分布，预先计算出的各光接收元件的组合中心波长。

117. 发明申请

US20090201292A1 Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor 有权
标题翻译：用于三维处理器中三维数据显示的三维处理器和方法
公开(公告)号：US20090201292A1
公开(公告)日：2009-08-13
申请号：US12322963
申请日：2009-02-10
申请人： Yoshihisa Abe , Toshio Kawano
发明人： Yoshihisa Abe , Toshio Kawano
IPC分类号： G06T15/50
CPC分类号： G01B11/25
摘要： A method is provided for controlling display of three-dimensional data in a three-dimensional processor that processes three-dimensional data indicating three-dimensional position coordinates of each point on a surface of an object to be measured, the three-dimensional data being obtained by projecting measurement light onto the object and receiving measurement light reflected from the object. The method includes obtaining reliability data that are an index of reliability of three-dimensional data of said each point, enabling a user to adjust a threshold for defining a range of the reliability, and displaying, on a screen of a display, three-dimensional data corresponding to reliability falling within a range defined by the threshold adjusted by the user with the three-dimensional data displayed distinguishably from different three-dimensional data.
摘要翻译：提供了一种用于控制三维处理器中的三维数据的显示的方法，该三维处理器处理指示待测物体的表面上的每个点的三维位置坐标的三维数据，获得的三维数据通过将测量光投射到物体上并接收从物体反射的测量光。该方法包括获得作为所述每个点的三维数据的可靠性的索引的可靠性数据，使得用户能够调整用于定义可靠性的范围的阈值，并且在显示器的屏幕上显示三维与由用户调整的阈值所限定的范围内的可靠度相对应的数据与由不同的三维数据可区分地显示的三维数据相对应的数据。

118. 发明授权

US07549586B2 Optical measurement system and sample optical property management method 有权
标题翻译：光学测量系统和样品光学性能管理方法
公开(公告)号：US07549586B2
公开(公告)日：2009-06-23
申请号：US11166883
申请日：2005-06-24
申请人： Koji Watanabe , Toru Kobayashi , Masao Nakamuro , Naoki Sagisaka
发明人： Koji Watanabe , Toru Kobayashi , Masao Nakamuro , Naoki Sagisaka
IPC分类号： G06K7/10
CPC分类号： G06K17/00 , G01J3/02 , G01J3/0264 , G01J3/0272 , G01N21/25 , G01N21/85 , G06K2017/0077
摘要： An optical measurement system which manages whether an optical property of a sample falls within a predetermined management range. The optical measurement system has a measuring device for measuring the optical property value of the inspected sample, a reader for reading an attribute identification information of an identification tag attached to the sample, and a storage section for storing optical property management information concerning a plurality of kinds of samples each in a manner corresponding to attribute identification information of each sample. A controller in the optical measurement system reads out from the storage section the optical property management information corresponding to the attribute identification information of the sample read by said reader, and compares the optical property management information with the optical property value of the sample, and then determines whether the optical property value falls within an allowable range in the optical property management information.
摘要翻译：一种光学测量系统，其管理样品的光学性质是否在预定的管理范围内。光学测量系统具有用于测量检查样品的光学特性值的测量装置，用于读取附于样品的识别标签的属性识别信息的读取器，以及用于存储关于多个各种样品各自以与每个样品的属性识别信息相对应的方式。光学测量系统中的控制器从存储部分读出与所述读取器读取的样品的属性识别信息相对应的光学性质管理信息，并将光学性质管理信息与样品的光学性质值进行比较，然后确定光学特性值是否在光学性质管理信息的容许范围内。

119. 发明申请

US20090079984A1 Optical characteristic measuring apparatus 有权
标题翻译：光学特性测量仪器
公开(公告)号：US20090079984A1
公开(公告)日：2009-03-26
申请号：US12284432
申请日：2008-09-22
申请人： Tomohiro Fukamizu , Yoshiyuki Nagashima , Katsutoshi Tsurutani , Shinji Shimizu
发明人： Tomohiro Fukamizu , Yoshiyuki Nagashima , Katsutoshi Tsurutani , Shinji Shimizu
IPC分类号： G01J3/46
CPC分类号： G01J3/50 , G01J3/02 , G01J3/0278 , G01J3/504 , G01N21/57 , G01N2021/575 , G01N2021/8427
摘要： An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured.
摘要翻译：本发明的光学特性测量装置被配置成使得来自待测物体的反射光中的镜面反射光分量被接收，并且基于所接收的光量检测装置的抖动。具有上述结构的光学特性测量装置能够精确地测量被测量物体的光学特性，而不需要提供机械开关等装置，而不依赖于被测量物体的形状。

120. 发明授权

US07508522B2 Reflected light measuring apparatus and reflected light measuring method 有权
标题翻译：反射光测量装置和反射光测量方法
公开(公告)号：US07508522B2
公开(公告)日：2009-03-24
申请号：US11047970
申请日：2005-01-31
申请人： Yutaka Kadowaki , Shu Morikawa , Jun Matsumoto , Naoki Kimura , Shinji Yamamoto
发明人： Yutaka Kadowaki , Shu Morikawa , Jun Matsumoto , Naoki Kimura , Shinji Yamamoto
IPC分类号： G01N21/55
CPC分类号： G01N21/55
摘要： A reflected light measuring apparatus including an illumination system and a light receiving system which receives reflected light from a measuring area of an object illuminated with measuring light projected from the illumination system. The illumination system projects the measuring light with a prescribed angular width onto each point in the measuring area. The illumination system and the light receiving system project the measuring light onto the measuring area and receive the reflected light via a telecentric optical system.
摘要翻译：一种反射光测量装置，包括照明系统和光接收系统，其接收来自从照明系统投射的测量光照射的物体的测量区域的反射光。照明系统将测量光以规定的角度宽度投射到测量区域的每个点上。照明系统和光接收系统将测量光投射到测量区域上，并通过远心光学系统接收反射光。

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