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    • 111. 发明授权
    • Light-amount detecting device, light source device, optical scanning unit and image forming apparatus
    • 光量检测装置,光源装置,光扫描装置和图像形成装置
    • US08081203B2
    • 2011-12-20
    • US12039405
    • 2008-02-28
    • Kensuke MasudaTomohiro NakajimaSatoru ItohDaisuke IchiiMasahiro SoedaYoshinori Hayashi
    • Kensuke MasudaTomohiro NakajimaSatoru ItohDaisuke IchiiMasahiro SoedaYoshinori Hayashi
    • B41J2/435B41J27/00
    • G02B26/124G03G15/0435G03G15/326
    • A light-amount detecting device includes: a light source which emits a light beam; a branching optical element which divides the light beam emitted from the light source into a first light beam traveling in a predetermined direction and a second light beam traveling in a direction different to the predetermined direction; a light-condensing element which condenses the second light beam; a light-receiving element having a light-receiving surface which receives the second light beam condensed by the light-condensing element; and a detector which detects a light-amount of the second light beam received by the light-receiving element, and at least one of a direction of reflected light of the second light beam reflected from the light-receiving surface of the light-receiving element and spread of the reflected light of the second light beam reflected from the light-receiving surface of the light-receiving element is adjusted to control a light-amount of the reflected light of the second light beam returning to the light source.
    • 光量检测装置包括:发射光束的光源; 分光光学元件,其将从光源发射的光束分成沿预定方向行进的第一光束和沿与所述预定方向不同的方向行进的第二光束; 冷凝所述第二光束的聚光元件; 具有受光面的光接收元件,所述光接收表面接收由所述聚光元件会聚的所述第二光束; 以及检测器,其检测由光接收元件接收的第二光束的光量,以及从受光元件的受光面反射的第二光束的反射光的方向中的至少一个 并且调节从光接收元件的光接收表面反射的第二光束的反射光的扩展,以控制返回到光源的第二光束的反射光的光量。
    • 115. 发明申请
    • Image Analysis System and Image Analysis Program
    • 图像分析系统和图像分析程序
    • US20100142852A1
    • 2010-06-10
    • US12531123
    • 2008-03-10
    • Hiroshi FujitaToshiaki NakagawaYoshinori Hayashi
    • Hiroshi FujitaToshiaki NakagawaYoshinori Hayashi
    • G06K9/36
    • G06T7/593G06T2207/10012G06T2207/10024G06T2207/20012G06T2207/20021G06T2207/30041
    • There is provided an image analysis system which captures image data of an arbitrary pair of a first image RI and a second image LI among images obtained by color-photographing a single object from different positions into an analysis computer, wherein the computer includes corresponding point extraction means for assigning a weighing factor to a pixel information value based on the contrast size of the pixel information value in each of a first local area ROI1 set around an arbitrary reference point in RI and second local areas ROI2s at which scanning is performed on LI, calculating the similarity between ROI1 and ROI2s, and extracting a corresponding point which corresponds to the reference point from a ROI2 having the highest similarity, and depth information calculating means for calculating depth information of the object based on coordinates of the reference point and the corresponding point.
    • 提供了一种图像分析系统,其捕获通过将单个对象从不同位置彩色拍摄而获得的图像中的任意一对第一图像RI和第二图像LI的图像数据,其中所述计算机包括相应的点提取 用于基于在RI中的任意参考点周围设置的第一局部区域ROI1和对LI执行扫描的第二局部区域ROI2中的每一个中的像素信息值的对比度大小将像素信息值分配给像素信息值的装置, 计算ROI1和ROI2之间的相似度,以及从具有最高相似度的ROI2提取与参考点对应的对应点,以及深度信息计算装置,用于基于参考点和对应点的坐标来计算对象的深度信息 。
    • 118. 发明申请
    • WAFER CONTAINING CASSETTE INSPECTION DEVICE AND METHOD
    • 包含CASSETTE检测装置的方法和方法
    • US20100074514A1
    • 2010-03-25
    • US12517145
    • 2007-12-04
    • Yoshinori HayashiHideki MoriTakeki Kogawa
    • Yoshinori HayashiHideki MoriTakeki Kogawa
    • G06K9/00
    • G06T7/001G06T2207/30108
    • To provide a wafer containing cassette inspection device capable of expressing external view attributes such as shapes of respective inspection object portions of water containing cassettes of different types under the same condition without changing imaging conditions for each of the types. A wafer containing cassette inspection device includes an imaging device (61) and a processing unit (50) which processes an image signal from the imaging device (61). The processing unit (50) includes: reference image generation means (S1, S2) which generates reference image information according to the image signal corresponding to a reference body (20) from the imaging device (61); image-to-be-inspected information generation means (S11) which generates image-to-be-inspected information according to the image signal corresponding to the inspection object portions in the wafer containing cassette (10) from the imaging device (61); image correction means (S12) which performs a process for obtaining a predetermined image from the reference image information on the image-to-be inspected information so as to generate corrected image information; and means (S14) which generates external view attribute information expressing external view attributes of the inspection object portions according to the corrected image information.
    • 提供能够在不改变每种类型的成像条件的情况下,在相同条件下,能够表现出含有不同类型的盒的水的各个检查对象部分的形状的外部视图属性的外观视图属性的晶片容纳盒检查装置。 含晶片的盒检查装置包括处理来自成像装置(61)的图像信号的成像装置(61)和处理单元(50)。 处理单元(50)包括:根据与成像装置(61)对应于参考体(20)的图像信号产生参考图像信息的参考图像生成装置(S1,S2)。 图像检查信息生成装置(S11),根据与来自成像装置(61)的晶片容纳盒(10)中的检查对象部分对应的图像信号,生成被检查图像信息; 图像校正装置(S12),其从所述参考图像信息执行用于获得预定图像的处理,用于生成校正图像信息; 以及根据校正图像信息生成表示检查对象部分的外部视图属性的外部视图属性信息的装置(S14)。
    • 119. 发明申请
    • Visual Inspection System
    • 目视检查系统
    • US20090304258A1
    • 2009-12-10
    • US12086086
    • 2006-12-05
    • Yoshinori HayashiHideki Mori
    • Yoshinori HayashiHideki Mori
    • G06K9/00
    • G01N21/9503G01N21/9501H04N9/045
    • [Problems] To provide a visual inspection system able to greatly suppress the increase of the amount of processing and detect scratches or other defects of the surface of an object being inspected by a suitable resolution and able to judge the state of formation of films on that object surface.[Means for Solution] A system having an imaging unit 20 provided with a plurality of line sensors 22R, 22G, and 22B differing in color sensitivity characteristics and a processing unit 50, the processing unit 50 having a pixel data acquiring means (S14) acquiring pixel density data from a density signal from a reference line sensor by a first pixel density and pixel density data from density signals from the line sensors other than the reference line sensor by a second pixel density lower than the first pixel density and generating information showing the state of the object surface based on the pixel density data acquired by the first pixel density and the pixel density data acquired by the second pixel density.
    • [问题]提供一种目视检查系统,其能够大大地抑制加工量的增加,并且通过适当的分辨率检测被检查物体的表面的划痕或其他缺陷,并且能够判断该膜的形成状态 物体表面。 [解决方案]具有成像单元20的系统,该成像单元20设置有不同颜色灵敏度特性的多个线传感器22R,22G和22B以及处理单元50,处理单元50具有像素数据获取装置(S14) 来自来自参考线传感器的浓度信号的像素密度数据和来自不同于参考线传感器的线传感器的密度信号的像素密度数据,其比第一像素密度低的第二像素密度,并且产生显示 基于由第一像素密度获取的像素密度数据和通过第二像素密度获取的像素密度数据的对象表面的状态。
    • 120. 发明授权
    • Optical scanning device and image forming apparatus
    • 光学扫描装置和图像形成装置
    • US07623280B2
    • 2009-11-24
    • US12107379
    • 2008-04-22
    • Makoto HirakawaYoshinori HayashiDaisuke Ichii
    • Makoto HirakawaYoshinori HayashiDaisuke Ichii
    • G02B26/08
    • G02B26/124
    • An optical scanning device includes a light source configured to emit light beams, a deflector to deflect the light beams emitted from the light source, a first optical assembly which is positioned upon a light path of the light beams traveling from the light source to the deflector and which forms an image with the light beams emitted from the light source in a sub scanning direction in a vicinity of the deflector, and a second optical assembly to form the image upon a surface to be scanned with the light beams deflected by the deflector. A principal ray of two of the light beams incident to the first optical assembly, which are located at each respective terminus in the sub scanning direction, are set so as to advance so as either to remain mutually parallel to or converge with one another after passing through the first optical assembly.
    • 光学扫描装置包括被配置为发射光束的光源,用于使从光源发射的光束偏转的偏转器,位于从光源传播到导流板的光束的光路上的第一光学组件 并且在偏转器附近以副扫描方向形成从光源发射的光束的图像,以及第二光学组件,用于在被偏转器偏转的光束的待扫描表面上形成图像。 入射到第一光学组件的两个光束的主射线位于副扫描方向上的每个相应的末端,被设置为前进,以便在通过后保持彼此相互平行或相互会聚 通过第一光学组件。