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    • 95. 发明授权
    • Sensing against a reference cell
    • 检测参考细胞
    • US08125831B2
    • 2012-02-28
    • US12955419
    • 2010-11-29
    • Frankie F. RoohparvarVishal Sarin
    • Frankie F. RoohparvarVishal Sarin
    • G11C16/06
    • G11C11/5642G11C16/28
    • Memory devices, bulk storage devices, and methods of operating memory are disclosed, such as those adapted to process and generate analog data signals representative of data values of two or more bits of information. Programming of such memory devices can include programming to a target threshold voltage within a range representative of the desired bit pattern. Reading such memory devices can include generating an analog data signal indicative of a threshold voltage of a target memory cell. The target memory cell can be sensed against a reference cell includes a dummy string of memory cells connected to a target string of memory cells, and, such as by using a differential amplifier to sense a difference between a reference cell and the target cell. This may allow a wider range of voltages to be used for data states.
    • 公开了存储器件,大容量存储器件和操作存储器的方法,诸如适于处理和产生表示两个或更多位信息的数据值的模拟数据信号的那些。 这种存储器件的编程可以包括在表示期望的位模式的范围内对目标阈值电压进行编程。 读取这样的存储器件可以包括产生指示目标存储器单元的阈值电压的模拟数据信号。 可以相对于参考单元感测目标存储器单元,包括连接到存储器单元的目标串的存储器单元的虚拟串,并且例如通过使用差分放大器来感测参考单元和目标单元之间的差异。 这可能允许更广泛的电压范围用于数据状态。
    • 96. 发明授权
    • Mitigation of data corruption from back pattern and program disturb in a non-volatile memory device
    • 缓解非易失性存储设备中的后台模式和程序干扰造成的数据损坏
    • US08107296B2
    • 2012-01-31
    • US12912027
    • 2010-10-26
    • Vishal SarinJung-Sheng HoeiFrankie F. Roohparvar
    • Vishal SarinJung-Sheng HoeiFrankie F. Roohparvar
    • G11C16/04
    • G11C16/3418
    • In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations.
    • 在所公开的实施例之一中,使用写入算法来消除由于存储器单元中的反向图案效应,单元到单元电容耦合和程序干扰引起的错误。 要编程的原始数据在存储器单元的初始编程操作之前被调整。 然后在另一个编程操作中将原始数据编程到存储器单元中。 在替代实施例中,读取调整权重数据值与存储器单元的每个串联串相关联。 权重数据值用于补偿在初始字线读取期间读取的数据。 在每次读取和读取调整之后更新权重数据值,使得在随后的读取操作中使用经调整的权重数据值。
    • 99. 发明申请
    • MEMORY CONTROLLER SELF-CALIBRATION FOR REMOVING SYSTEMIC INFLUENCE
    • 内存控制器自动校准,用于删除系统影响
    • US20110305090A1
    • 2011-12-15
    • US13217492
    • 2011-08-25
    • Frankie F. RoohparvarVishal SarinJung-Sheng Hoei
    • Frankie F. RoohparvarVishal SarinJung-Sheng Hoei
    • G11C16/10
    • G11C16/10G11C16/04G11C16/20G11C29/028G11C29/12005G11C29/50G11C29/50004G11C2029/5004
    • Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read.
    • 通过向所选择的单元写入电压来执行存储器控制器的自校准。 对所选单元格周围的相邻单元进行编程。 在每个相邻的编程操作之后,读取所选择的单元上的电压,以确定由例如浮动栅极到浮置栅极耦合的系统偏移引起的任何电压变化。 这些变化被平均并存储在表中作为用于调整由偏移表示的存储器的特定区域中的编程电压或读取电压的偏移。 通过在不同温度下写入单元格并在不同温度读取来确定温度的自校准方法,以生成写入路径和读取路径的温度偏移表。 这些偏移表用于在编程期间和读取期间调整与系统温度相关的偏移。
    • 100. 发明申请
    • PROGRAMMING ERROR CORRECTION CODE INTO A SOLID STATE MEMORY DEVICE WITH VARYING BITS PER CELL
    • 将错误修正代码编入固态状态存储器件,其中每个单元有不同的位数
    • US20110289387A1
    • 2011-11-24
    • US13195977
    • 2011-08-02
    • Frankie F. RoohparvarVishal SarinJung S. Hoei
    • Frankie F. RoohparvarVishal SarinJung S. Hoei
    • G06F11/10
    • G06F11/1076G06F11/1072G11C29/12005
    • Memory devices that, in a particular embodiment, receive and transmit analog data signals representative of bit patterns of two or more bits such as to facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming error correction code (ECC) and metadata into such memory devices includes storing the ECC and metadata at different bit levels per cell based on an actual error rate of the cells. The ECC and metadata can be stored with the data block at a different bit level than the data block. If the area of memory in which the block of data is stored does not support the desired reliability for the ECC and metadata at a particular bit level, the ECC and metadata can be stored in other areas of the memory array at different bit levels.
    • 在特定实施例中,存储设备接收和发送表示两个或多个位的位模式的模拟数据信号,以便于相对于传送指示各个位的数据信号的设备的数据传输速率的增加。 编程错误校正码(ECC)和元数据到这种存储器设备中包括基于单元的实际错误率将ECC和元数据存储在每个小区的不同比特级。 ECC和元数据可以与数据块存储在与数据块不同的位级别。 如果其中存储数据块的存储器区域不支持在特定位级别的ECC和元数据的期望的可靠性,则ECC和元数据可以以不同的位电平存储在存储器阵列的其他区域中。