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    • 91. 发明申请
    • Rotating docking station
    • 旋转坞站
    • US20050055487A1
    • 2005-03-10
    • US10654812
    • 2003-09-04
    • Toshiyuki TanakaHiroshi NakamuraMartin Riddiford
    • Toshiyuki TanakaHiroshi NakamuraMartin Riddiford
    • H05K5/02G06F1/16G06F13/00
    • G06F1/1632
    • A docking station useful for connecting a portable computing device to a network or other external device. The docking station includes a first supporting device having a first mounting surface and connector thereon to support and electrically connect to a portable computing device. The first mounting surface is rotationally mounted to a base, and slightly inclined with respect to the underside of the base. Such configuration allows the portable computing device to lie substantially horizontal and to be rotated about a substantially vertical axis. The docking station further includes a second supporting device having a second mounting surface to support the first supporting device thereon. The second mounting surface is mounted on a base, and is significantly inclined with respect to its base. Such configuration allows the portable computing device to lie substantially vertical and to be rotated about a substantially horizontal axis.
    • 用于将便携式计算设备连接到网络或其他外部设备的坞站。 对接站包括第一支撑装置,其具有第一安装表面和连接器,以支撑并电连接到便携式计算装置。 第一安装表面旋转地安装到基座上,并相对于底座的下侧略微倾斜。 这种配置允许便携式计算设备基本上水平地并且围绕基本垂直的轴线旋转。 对接站还包括具有第二安装表面以在其上支撑第一支撑装置的第二支撑装置。 第二安装表面安装在基座上,并且相对于其底部显着倾斜。 这种配置允许便携式计算设备基本上垂直并且围绕基本上水平的轴线旋转。
    • 96. 发明授权
    • Nonvolatile semiconductor memory
    • 非易失性半导体存储器
    • US06809365B2
    • 2004-10-26
    • US10212060
    • 2002-08-06
    • Hiroshi NakamuraKenichi Imamiya
    • Hiroshi NakamuraKenichi Imamiya
    • H01L27108
    • H01L27/11526G11C11/5621G11C16/0483G11C16/26H01L27/115H01L27/11529H01L2924/0002H01L2924/00
    • In an EEPROM consisting of a NAND cell in which a plurality of memory cells are connected in series, the control gate voltage Vread of the memory cell in a block selected by the data read operation is made different from the each of the voltages Vsg1, Vsg2 of the select gate of the select transistor in the selected block so as to make it possible to achieve a high speed reading without bringing about the breakdown of the insulating film interposed between the select gate and the channel of the select transistor. The high speed reading can also be made possible in the DINOR cell, the AND cell, NOR cell and the NAND cell having a single memory cell connected thereto, if the control gate voltage of the memory cell is made different from the voltage of the select gate of the select transistor.
    • 在由多个存储单元串联连接的NAND单元组成的EEPROM中,通过数据读取操作选择的块中的存储单元的控制栅极电压Vread与电压Vsg1,Vsg2 在所选择的块中选择晶体管的选择栅极,从而使得可以实现高速读取,而不会导致插入在选择栅极和选择晶体管的沟道之间的绝缘膜的击穿。 如果使存储器单元的控制栅极电压与选择的电压不同,则也可以在DINOR单元,AND单元,NOR单元和与其连接的单个存储单元的NAND单元中实现高速读数。 选择晶体管的栅极。