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    • 92. 发明授权
    • Mechanism of monitoring unit of electric rotating machinery and monitoring method of electric rotating machinery
    • 电动旋转机械监控单元机构及电动旋转机械监控方法
    • US08308354B2
    • 2012-11-13
    • US12444311
    • 2006-10-05
    • Takeshi WatanabeYuji Yao
    • Takeshi WatanabeYuji Yao
    • G01J5/00G01K13/00
    • G01J5/0003G01J5/0096G01J5/061G01J5/08G01J5/0846G01J5/0893G01J5/60G01J2005/0077H02K11/20H02K11/25H02P6/00
    • A mechanism of a monitoring unit of an electric rotating machinery covered in a housing that intercepts photoelectron transmission, the mechanism has: a monitoring window penetrating a part of the housing and configured to allow passage of photoelectrons and not to allow passage of gas; a camera arranged outside the monitoring window and configured to receive radiated photoelectron generated in the housing and passing through the monitoring window and to generate image data from the radiated photoelectron; and a computing unit configured to process the image data. The computing unit has reference image data storage means for storing image data resulting from blackbody radiation occurring in a reference state in the housing, as reference image data, and temperature calculating means for comparing the image data with the reference image data, thereby to calculate the temperature in the housing.
    • 一种覆盖在壳体中的电动旋转机械的监视单元,其拦截光电子传输,该机构具有:穿过壳体的一部分并被配置为允许光电子通过并且不允许气体通过的监视窗口; 布置在所述监视窗口外部并且被配置为接收在所述壳体中产生并穿过所述监视窗口并且从所述辐射光电子产生图像数据的辐射光电子的照相机; 以及被配置为处理图像数据的计算单元。 计算单元具​​有参考图像数据存储装置,用于存储由外壳中以参考状态发生的黑体辐射而产生的图像数据作为参考图像数据,以及用于将图像数据与参考图像数据进行比较的温度计算装置, 房屋温度
    • 94. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN APPARATUS, DATA PROCESSING METHOD THEREOF, AND CONTROL PROGRAM THEREOF
    • 半导体集成电路设计装置及其数据处理方法及其控制程序
    • US20120096421A1
    • 2012-04-19
    • US13262759
    • 2010-04-21
    • Yoshihiro OnoTakeshi WatanabeNaoshi DoiItsuki YamadaTsuneo Tsukagoki
    • Yoshihiro OnoTakeshi WatanabeNaoshi DoiItsuki YamadaTsuneo Tsukagoki
    • G06F17/50
    • G06F17/5031
    • A semiconductor integrated circuit design apparatus (100) includes a delay analysis unit (102) which analyzes a static delay in respective paths of a semiconductor integrated circuit, a noise generation unit (104) which generates noise information based on a predetermined noise definition, a voltage fluctuation level analysis unit (106) which analyzes a voltage fluctuation level of the semiconductor integrated circuit when the noise is applied based on the noise information, and a timing verification unit (108) which makes the delay analysis unit (102) analyze the static delay based on the analyzed voltage fluctuation level, to verify timing for operation of the semiconductor integrated circuit based on a result of the static delay analysis, wherein the noise generation unit (104) generates noise information on noise applied at predetermined application timing, and the timing verification unit (108) verifies the timing for each noise applied with the predetermined application timing.
    • 半导体集成电路设计装置(100)包括分析半导体集成电路的各个路径中的静态延迟的延迟分析单元(102),基于预定噪声定义产生噪声信息的噪声生成单元(104) 电压波动电平分析单元(106),其基于噪声信息分析施加了噪声时的半导体集成电路的电压波动水平;以及定时验证单元(108),其使得所述延迟分析单元(102)分析静态 基于所分析的电压波动水平的延迟,基于静态延迟分析的结果来验证半导体集成电路的操作的定时,其中,噪声产生单元(104)产生关于在预定应用定时处施加的噪声的噪声信息,并且 定时验证单元(108)根据预定的应用定时验证每个噪声的定时。
    • 95. 发明授权
    • Image processing device that adjusts specific color of color image
    • 调整彩色图像特定颜色的图像处理装置
    • US08144982B2
    • 2012-03-27
    • US11492005
    • 2006-07-25
    • Yasunari YoshidaMasaki KondoTakeshi Watanabe
    • Yasunari YoshidaMasaki KondoTakeshi Watanabe
    • G06K9/00
    • H04N1/62H04N1/628
    • An adjusting portion adjusts values of lightness, chroma, and hue. A change-amount setting portion sets an amount of change for each of lightness, chroma, and hue. A weighting-curve storing portion stores weighting curves for each of lightness, chroma, and hue. A weighting-factor determining portion determines, based on the weighting curves, weighting factors for the values of lightness, chroma, and hue. A specific-color-index determining portion determines a specific color index by multiplying each of the weighting factors determined by the weighting-factor determining portion. An adjustment-amount determining portion determines an adjustment amount by multiplying, by the specific color index, the amount of change set by the change-amount setting portion, and determines adjusted values of lightness, chroma, and hue based on the adjustment amount. An adjusted-color-image obtaining portion obtains an adjusted color image based on the adjusted values.
    • 调整部分调节亮度,色度和色调的值。 变化量设定部设定亮度,色度,色调各自的变化量。 权重曲线存储部分存储亮度,色度和色调中的每一个的加权曲线。 权重因子确定部分基于加权曲线确定亮度,色度和色相值的加权因子。 特定颜色索引确定部分通过乘以由加权因子确定部分确定的每个加权因子来确定特定颜色索引。 调整量确定部分通过根据特定颜色指数乘以由变化量设置部分设置的变化量来确定调整量,并且基于调整量确定亮度,色度和色调的调整值。 经调整后的彩色图像获取部分根据调整后的值获得调整后的彩色图像。
    • 97. 发明申请
    • OPERATION ANALYZING METHOD, OPERATION ANALYZING APPARATUS, OPERATION ANALYZING PROGRAM, AND OPERATION ANALYZING SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUITS
    • 操作分析方法,操作分析设备,操作分析程序和半导体集成电路操作分析系统
    • US20110296369A1
    • 2011-12-01
    • US13062263
    • 2009-10-27
    • Takumi OkamotoTakeshi WatanabeItsuki YamadaNaoshi DoiTsuneo Tsukagoshi
    • Takumi OkamotoTakeshi WatanabeItsuki YamadaNaoshi DoiTsuneo Tsukagoshi
    • G06F11/22
    • G01R31/2848G06F17/5036
    • An operation analyzing apparatus (100) for semiconductor integrated circuits according to this exemplary embodiment includes a simulation analyzing unit (140), and the simulation analyzing unit (140) includes: a semiconductor characteristics extracting unit (110) that extracts the inductances L, resistances R, and capacitances C of a board, a package, and a semiconductor integrated circuit, from the semiconductor integrated circuit mounted on the board via the package; an individual network generating unit (111) that generates individual networks of the extracted inductance L, resistance R, and capacitance C with respect to each of said semiconductor substrate, said package, and said semiconductor integrated circuit; an integrated network generating unit (112) that generates an integrated network by integrating all of the generated individual networks; and an operation simulation running unit (113) that performs an operation simulation of the semiconductor integrated circuit by inserting a test noise pattern to an arbitrary position in the generated integrated network.
    • 根据本实施方式的半导体集成电路的动作分析装置(100)具有模拟分析部(140),所述模拟分析部(140)具备:提取电感L,电阻 R和电容C,从安装在板上的半导体集成电路经由封装形成的板,封装和半导体集成电路; 单个网络生成单元(111),其针对所述半导体衬底,所述封装和所述半导体集成电路中的每一个产生提取的电感L,电阻R和电容C的各个网络; 集成网络生成单元(112),其通过集成所有生成的各个网络来生成集成网络; 以及通过将测试噪声模式插入到所生成的集成网络中的任意位置来执行半导体集成电路的操作模拟的操作模拟运行单元(113)。