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    • 91. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08076732B2
    • 2011-12-13
    • US12491728
    • 2009-06-25
    • Reika IchiharaMasato Koyama
    • Reika IchiharaMasato Koyama
    • H01L21/8238
    • H01L27/092H01L21/823842H01L29/4966H01L29/518H01L29/6659
    • A semiconductor device includes pMISFET and nMIS formed on the semiconductor substrate. The pMISFET includes, on the semiconductor substrate, first source/drain regions, a first gate dielectric formed therebetween, first lower and upper metal layers stacked on the first gate dielectric, a first upper metal layer containing at least one metallic element belonging to groups IIA and IIIA. The nMISFET includes, on the semiconductor substrate, second source/drain regions, second gate dielectric formed therebetween, a second lower and upper metal layers stacked on the second gate dielectric and the second upper metal layer substantially having the same composition as the first upper metal layer. The first lower metal layer is thicker than the second lower metal layer, and the atomic density of the metallic element contained in the first gate dielectric is lower than the atomic density of the metallic element contained in the second gate dielectric.
    • 半导体器件包括在半导体衬底上形成的pMISFET和nMIS。 pMISFET在半导体衬底上包括第一源极/漏极区域,在其间形成的第一栅极电介质,堆叠在第一栅极电介质上的第一下部和上部金属层,包含至少一种属于IIA族金属元素的第一上部金属层 和IIIA。 nMISFET在半导体衬底上包括第二源极/漏极区域,在其间形成的第二栅极电介质,堆叠在第二栅极电介质上的第二下部和上部金属层,以及基本上具有与第一上部金属相同的组成的第二上部金属层 层。 第一下金属层比第二下金属层厚,并且包含在第一栅极电介质中的金属元素的原子密度低于包含在第二栅极电介质中的金属元素的原子密度。
    • 93. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20090321844A1
    • 2009-12-31
    • US12491728
    • 2009-06-25
    • Reika IchiharaMasato Koyama
    • Reika IchiharaMasato Koyama
    • H01L27/092H01L21/8238
    • H01L27/092H01L21/823842H01L29/4966H01L29/518H01L29/6659
    • A semiconductor device includes pMISFET and nMIS formed on the semiconductor substrate. The pMISFET includes, on the semiconductor substrate, first source/drain regions, a first gate dielectric formed therebetween, first lower and upper metal layers stacked on the first gate dielectric, a first upper metal layer containing at least one metallic element belonging to groups IIA and IIIA. The nMISFET includes, on the semiconductor substrate, second source/drain regions, second gate dielectric formed therebetween, a second lower and upper metal layers stacked on the second gate dielectric and the second upper metal layer substantially having the same composition as the first upper metal layer. The first lower metal layer is thicker than the second lower metal layer, and the atomic density of the metallic element contained in the first gate dielectric is lower than the atomic density of the metallic element contained in the second gate dielectric.
    • 半导体器件包括在半导体衬底上形成的pMISFET和nMIS。 pMISFET在半导体衬底上包括第一源极/漏极区域,在其间形成的第一栅极电介质,堆叠在第一栅极电介质上的第一下部和上部金属层,包含至少一个属于IIA族金属元素的第一上部金属层 和IIIA。 nMISFET在半导体衬底上包括第二源极/漏极区域,在其间形成的第二栅极电介质,堆叠在第二栅极电介质上的第二下部和上部金属层,以及基本上具有与第一上部金属相同的组成的第二上部金属层 层。 第一下金属层比第二下金属层厚,并且包含在第一栅极电介质中的金属元素的原子密度低于包含在第二栅极电介质中的金属元素的原子密度。
    • 98. 发明授权
    • Method of and device for controlling pulse width modulation inverter
    • 控制脉宽调制逆变器的方法和装置
    • US6088246A
    • 2000-07-11
    • US98643
    • 1998-06-17
    • Miho OkuyamaMasato Koyama
    • Miho OkuyamaMasato Koyama
    • H02M7/48H02M7/5395H02P27/08H02M1/12
    • H02M7/5395H02M7/53873H02M1/44H02M2007/53876
    • A method of controlling a pulse width modulation or PWM inverter apparatus that generates and controls AC output voltages with PWM control, comprises the steps of: generating a reference voltage vector for setting the AC output voltages; and changing timing of the generation of the AC output voltages during a predetermined period of time determined by a carrier signal at predetermined intervals determined by the carrier signal without changing the pulse widths of the AC output voltages determined by the PWM control so that a vector representing the averages of instantaneous amplitudes of the AC output voltages for a predetermined period of time agrees with the reference voltage vector, and so that the spectra of high-frequency components of each of the AC output voltages are spread out over a predetermined wide range of frequencies.
    • 一种通过PWM控制来产生和控制AC输出电压的脉宽调制或PWM逆变器装置的控制方法,包括以下步骤:产生用于设定交流输出电压的参考电压矢量; 以及在由载波信号确定的预定间隔由载波信号确定的预定时段期间改变AC输出电压的产生的定时,而不改变由PWM控制确定的AC输出电压的脉冲宽度,使得代表 AC输出电压在预定时间段内的瞬时幅度的平均值与参考电压矢量一致,并且使得每个AC输出电压的高频分量的频谱在预定的宽频率范围内展开 。
    • 99. 发明授权
    • Control device of induction motor
    • 电感电机的控制装置
    • US5247237A
    • 1993-09-21
    • US928052
    • 1992-08-11
    • Masato KoyamaAkira Imanaka
    • Masato KoyamaAkira Imanaka
    • H02P27/06H02H7/08
    • H02H7/0833H02P21/08H02P21/22H02P31/00
    • An object of the invention is to provide a control device of an induction motor where an inverter circuit can be protected from overcurrent by stable current limitation operation not only at steady operation but also at rapid acceleration/deceleration or at regenerative braking. A current component calculation circuit calculates a first current component from primary current detected by a current detector and output frequency. A correction frequency calculation circuit calculates a frequency correction value using a current limit value and the first current component according to prescribed function calculation. A subtractor subtracts the frequency correction value from a primary frequency command value. A voltage component calculation circuit calculates a primary voltage component command value according to the subtracted output. A primary voltage command calculation circuit calculates a primary voltage command value of the induction motor from the subtracted output and the primary voltage component command value and outputs it to a voltage conversion circuit.
    • 本发明的目的是提供一种感应电动机的控制装置,其中不仅在稳定运行时,而且在快速加速/减速或再生制动下,通过稳定的电流限制操作可以防止逆变器电路的过流。 电流分量计算电路根据电流检测器检测到的一次电流和输出频率来计算第一电流分量。 校正频率计算电路根据规定的功能计算,使用电流限制值和第一电流分量来计算频率校正值。 减法器从主频率指令值中减去频率校正值。 电压分量计算电路根据相减输出来计算一次电压分量指令值。 一次电压指令计算电路从减法输出和一次电压分量指令值计算感应电机的一次电压指令值,并将其输出到电压转换电路。