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    • 91. 发明授权
    • Stand-off pad for supporting a wafer on a substrate support chuck
    • 用于在基板支撑卡盘上支撑晶片的支撑垫
    • US06217655B1
    • 2001-04-17
    • US08791941
    • 1997-01-31
    • Ananda H. KumarShamouil ShamouilianHyman J. LevinsteinVijay Parkhe
    • Ananda H. KumarShamouil ShamouilianHyman J. LevinsteinVijay Parkhe
    • B05C1300
    • H01L21/6833H01L21/6875
    • A stand-off pad, and method of fabricating the same, for supporting a workpiece in a spaced apart relation to a workpiece support chuck. More specifically, the wafer stand-off pad is fabricated of a polymeric material, such as polyimide, which is disposed upon the support surface of the chuck. The stand-off pad maintains a wafer, or other workpiece, in a spaced apart relation to the support surface of the chuck. The distance between the underside surface of the wafer and the chuck is defined by the thickness of the stand-off pad. This distance should be larger than the expected diameter of contaminant particles that may lie on the surface of the chuck. In this manner, the contaminant particles do not adhere to the underside of the wafer during processing and the magnitude of the chucking voltage is maintained between the workpiece and the chuck.
    • 支撑垫及其制造方法,用于以与工件支撑卡盘间隔开的关系支撑工件。 更具体地说,晶片支座由诸如聚酰亚胺的聚合材料制成,其设置在卡盘的支撑表面上。 支座将保持晶片或其它工件与卡盘的支撑表面间隔开。 晶片的下表面和卡盘之间的距离由支座的厚度限定。 该距离应大于可能位于卡盘表面上的污染物颗粒的预期直径。 以这种方式,污染物颗粒在处理期间不粘附到晶片的下侧,并且夹持电压的幅度保持在工件和卡盘之间。
    • 95. 发明授权
    • Diffusion isolation layer for maskless cladding process
    • 用于无掩模包层工艺的扩散隔离层
    • US4582722A
    • 1986-04-15
    • US666954
    • 1984-10-30
    • Lester W. HerronAnanda H. KumarRobert W. Nufer
    • Lester W. HerronAnanda H. KumarRobert W. Nufer
    • H01L23/12C23C10/04H01L21/388H01L21/48H05K1/03H05K1/09H05K3/24B05D3/12B05D5/12C23C14/00
    • H01L21/4846C23C10/04H05K3/246H01L2924/0002H05K1/0306H05K1/092H05K2201/0317H05K2203/025H05K2203/0743H05K3/048
    • Disclosed is a maskless metal cladding process for plating an existing metallurgical pattern by utilizing a protective layer to isolate those areas of underlying metallurgy on which additional metal plating is not desired. The layer acts as an isolation barrier to protect the underlying metallurgy from deposition and subsequent diffusion of the heavy metal (e.g., gold) overlay. The composition of the protective layer is selected as one having sufficient mechanical integrity to withstand process handling and support the gold overlay and having the thermal integrity to withstand the high temperatures reached during metal sputtering and diffusion processes. The isolation barrier layer has an organic component as a binder which thermally decomposes, either in a heating step before metal deposition or during the diffusion cycle, leaving no carbonaceous residue but leaving an inert, inorganic standoff to support the metal. After diffusion of the metal, the remaining inorganic standoff layer, overlying metal and any undiffused metal remaining on the non-patterned substrate is easily removed by a standard technique, such as ultrasonics.
    • 公开了一种无掩模金属包覆工艺,用于通过利用保护层来电镀现有的冶金图案,以隔离不期望附加金属镀覆的下方冶金的那些区域。 该层用作隔离屏障,以保护底层冶金不沉积和随后扩散重金属(例如,金)覆盖层。 保护层的组成选择为具有足够的机械完整性的组合物,以承受工艺处理并支撑金覆层并具有耐热金属溅射和扩散过程中达到的高温的热完整性。 隔离阻挡层具有作为粘合剂的有机组分,其在金属沉积之前的加热步骤或扩散循环期间热分解,不留下含碳残留物,而留下惰性的无机支架以支撑金属。 在金属扩散之后,剩余的无机隔离层,覆盖的金属和残留在非图案化衬底上的任何未扩散的金属都可以通过诸如超声波的标准技术容易地去除。
    • 98. 发明授权
    • Thin film floating zone metal coating technique
    • 薄膜浮区金属涂层技术
    • US4501768A
    • 1985-02-26
    • US359445
    • 1982-03-18
    • Ananda H. Kumar
    • Ananda H. Kumar
    • H01L23/12B23K35/00C04B41/51C04B41/88C23C26/02H01L21/48H05K3/04H05K3/14H05K3/24B05D3/02B05D3/12B05D5/00
    • H01L21/48B23K35/001C04B41/51C04B41/88H05K3/246H05K1/0306H05K3/048H05K3/143H05K3/244
    • A method of coating or cladding existing metallurgical features of a dielectric substrate by sequentially blanket coating the substrate, inclusive of the metal features, with discrete levels of diverse metals forming alloy systems exhibiting a minimum in the liquidus curve, followed by heating the substrate to a temperature (T.sub.H) at or slightly above the lowest liquidus temperature in the phase diagram of the alloy system and below the melting points of the metal components. During heating to temperature, the metals interdiffuse forming a range of compositions changing with time to form liquid alloys which moves to the substrate surface where it wets and bonds to the metallic features while dewetting the bar substrate surface portions. On cooling the non-adhering portions the alloy can be suitably removed from the substrate surface, as by ultrasonic action, leaving an alloy of the metals strongly bonded only to the pre-existing metallurgical features.
    • 通过顺序地将包括金属特征在内的基片覆盖成不同金属的不同金属,形成在液相线曲线中表现出最小的合金系统,然后将基底加热到 在合金系统的相图中低于或略高于最低液相温度的温度(TH),低于金属组分的熔点。 在加热到温度期间,金属相互扩散形成随时间变化的组成范围,以形成液体合金,该液体合金移动到基底表面,在其上润湿并粘合到金属特征上,同时使条形基底表面部分变湿。 在冷却非粘合部分时,合金可以通过超声波作用从衬底表面适当地去除,使金属的合金牢固地结合到仅存在的冶金特征上。