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    • 91. 发明授权
    • System and method for data backup in communication devices
    • 通信设备中数据备份的系统和方法
    • US08250038B2
    • 2012-08-21
    • US12846841
    • 2010-07-30
    • Jun Li
    • Jun Li
    • G06F7/00G06F17/00
    • G06F17/30
    • A system and method automatically backup unsaved data in a communication device if a back cover of the communication device is removed. An identifier of an application of the communication device is received. Based on the received identifier, an application corresponding to the received identifier is registered. If the back cover of the communication device is removed, a save signal is sent to the registered application and the unsaved data of the registered application is saved to a storage unit of the communication device.
    • 如果通信设备的后盖被去除,系统和方法会自动备份通信设备中未保存的数据。 接收通信设备的应用的标识符。 基于所接收的标识符,登记与接收到的标识符相对应的应用。 如果通信设备的后盖被去除,则将保存信号发送到已注册的应用,并且将已注册的应用的未保存的数据保存到通信设备的存储单元。
    • 95. 发明申请
    • Simulated X-Ray Diffraction Spectra for Analysis of Crystalline Materials
    • 模拟X射线衍射光谱分析结晶材料
    • US20120130694A1
    • 2012-05-24
    • US12953080
    • 2010-11-23
    • Deepak SrivastavaSang YangJun Li
    • Deepak SrivastavaSang YangJun Li
    • G06G7/48
    • G06F19/00H01M10/00H01M10/0525
    • Methods and computer programs to quantify defects in an experimentally synthesized material for use in a battery are provided. A method includes an operation for obtaining spectra of the experimentally synthesized material. Further, defected structures of a crystalline structure are created via simulation, and spectra of the defected structures are obtained via simulation. In another method operation, the spectra of the experimentally synthesized material is compared to the spectra of the defected structures obtained via simulation, and if the spectra of the experimentally synthesized material is substantially equal to the spectra of the defected structures obtained via simulation then the defects in the experimentally synthesized material are quantified according to the defects in the defected structures.
    • 提供了用于量化用于电池的实验合成材料中的缺陷的方法和计算机程序。 一种方法包括获得实验合成材料的光谱的操作。 此外,通过模拟产生晶体结构的缺陷结构,并且通过模拟获得缺陷结构的光谱。 在另一种方法操作中,将实验合成材料的光谱与通过模拟获得的缺陷结构的光谱进行比较,并且如果实验合成材料的光谱基本上等于通过模拟获得的缺陷结构的光谱,则缺陷 在实验合成材料中根据缺陷结构的缺陷量化。