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    • 91. 发明授权
    • Method for etch fabrication of iridium-based electrode structures
    • 铱基电极结构的蚀刻制造方法
    • US6143191A
    • 2000-11-07
    • US966796
    • 1997-11-10
    • Thomas H. BaumFrank Dimeo, Jr.
    • Thomas H. BaumFrank Dimeo, Jr.
    • C23F1/12C23F4/00H01L21/02H01L21/3213B44C1/22
    • H01L28/60C23F1/12C23F4/00H01L21/32136
    • A method of forming an iridium-based electrode structure on a substrate, from an iridium-containing precursor thereof which is decomposed to deposit iridium on the substrate. The iridium-based material is formed on the substrate in a desired environment, e.g., an oxidizing ambient environment which may for example contain an oxidizing gas such as oxygen, ozone, air, or nitrogen oxide, or alternatively a reducing environment containing a reducing agent such as H.sub.2, CO or NH.sub.3. The iridium deposited on the substrate is contacted with an etching reagent such as halogen-based etch species (e.g., Cl.sub.2, Br.sub.2, F.sub.2, CCl.sub.4, Si.sub.2 F.sub.6, SiCl.sub.4, NF.sub.3, C.sub.2 F.sub.6, SF.sub.6, or CF.sub.4) formed by exposing halogen to light, laser radiation, plasma, or ion beam, or alternatively with XeF.sub.2, for sufficient time and under sufficient conditions to etch the deposited iridium-based material and form the etched iridium-based electrode structure. The electrode structure may then have a dielectric or ferroelectric material deposited thereon, for fabrication of thin film capacitor semiconductor devices such as DRAMs, FeRAMs, hybrid systems, smart cards and communication systems.
    • 由基于铱的前体形成基于铱的电极结构的方法,该方法被分解以在基板上沉积铱。 铱基材料在期望的环境中形成在基底上,例如氧化周围环境,其可以例如包含氧化气体,例如氧气,臭氧,空气或氮氧化物,或者可选地,含有还原剂的还原环境 如H2,CO或NH3。 沉积在基板上的铱与蚀刻剂接触,例如通过将卤素暴露于光而形成的卤素基蚀刻物质(例如,Cl2,Br2,F2,CCl4,Si2F6,SiCl4,NF3,C2F6,SF6或CF4) 激光辐射,等离子体或离子束,或者与XeF2交替,足够的时间和足够的条件下蚀刻沉积的基于铱的材料并形成蚀刻的基于铱的电极结构。 然后,电极结构可以具有沉积在其上的电介质或铁电材料,用于制造诸如DRAM,FeRAM,混合系统,智能卡和通信系统的薄膜电容器半导体器件。