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91. 发明授权

US06966784B2 Flexible cable interconnect assembly 有权
标题翻译：柔性电缆互连组件
公开(公告)号：US06966784B2
公开(公告)日：2005-11-22
申请号：US10742501
申请日：2003-12-19
申请人： Koenraad F. Van Schuylenbergh , Armin R. Völkel , Thomas H. DiStefano , Michel A. Rosa , David K. Fork , Eugene M. Chow , Meng H. Lean
发明人： Koenraad F. Van Schuylenbergh , Armin R. Völkel , Thomas H. DiStefano , Michel A. Rosa , David K. Fork , Eugene M. Chow , Meng H. Lean
IPC分类号： H05K1/14 , H01B11/00 , H01R12/00 , H01R12/04 , H05K3/32 , H05K3/36
CPC分类号： H01R12/78 , H05K1/147 , H05K3/323 , H05K3/361 , H05K3/365 , H05K2201/044 , H05K2201/09845
摘要： A data transmission interconnect assembly (e.g., a router) capable of transmission speeds in excess of 40 Gbps in which a line-card is detachably coupled to a backplane using flexible flat cables that are bent to provide a continuous, smooth curve between the connected boards, and connected by a connection apparatus that employs cable-to-cable interface members that are transparent to the transmitted signal waves. Microspring contact structures are formed on the cables, or on a contact structure pressed against the cables, to provide interface arrangements that are smaller than a wavelength of the transmitted signal. A connector apparatus uses a cam mechanism to align the cables, and then to press a contact structure, having micro spring interface members formed thereon, against the cables. An alterative contact structure uses anisotropic conductive film.
摘要翻译：能够传输速度超过40Gbps的数据传输互连组件（例如，路由器），其中线卡可以使用柔性扁平电缆可拆卸地耦合到背板，弯曲以在连接的板之间提供连续的平滑曲线并且通过采用对所发送的信号波透明的电缆到电缆接口部件的连接装置连接。微电缆接触结构形成在电缆上或按压在电缆上的接触结构上，以提供小于传输信号的波长的接口布置。连接器装置使用凸轮机构对准电缆，然后将形成有微弹簧接口构件的接触结构压靠在电缆上。替代接触结构使用各向异性导电膜。

92. 发明授权

US06912082B1 Integrated driver electronics for MEMS device using high voltage thin film transistors 失效
标题翻译：使用高压薄膜晶体管的MEMS器件的集成驱动器电路
公开(公告)号：US06912082B1
公开(公告)日：2005-06-28
申请号：US10799237
申请日：2004-03-11
申请人： JengPing Lu , Eugene M. Chow , Jackson H. Ho , Chinnwen Shih
发明人： JengPing Lu , Eugene M. Chow , Jackson H. Ho , Chinnwen Shih
IPC分类号： B81B3/00 , B81B7/02 , H01L27/12 , H01L29/786 , G02B26/00
CPC分类号： H01L27/1203 , B81B2203/0118 , B81C1/00246 , B81C2203/0735 , H01L29/78624
摘要： An apparatus integrating electrostatically actuated MEMS devices and high voltage driver (actuator) electronics on a single substrate, where the driver electronics utilize offset-gate high voltage thin-film transistors (HVTFTs) that facilitate the transmission of high actuating voltages using relatively low control voltages, thereby facilitating the formation of large arrays of electrostatically-actuated MEMS devices. The driver circuit is arranged such that the high actuating voltage is applied to an actuating electrode of the actuated MEMS device and drain electrode of the HVTFT when the HVTFT is turned off, thereby minimizing dielectric breakdown. When the HVTFT is turned on in response to the relatively low control voltage, the high actuating voltage is discharged to ground from the drain (offset) electrode to the source (not offset) electrode.
摘要翻译：在单个基板上集成静电致动MEMS器件和高电压驱动器（致动器）电子器件的设备，其中驱动器电子器件利用偏移栅极高电压薄膜晶体管（HVTFT），其利用相对低的控制电压来促进高致动电压的传输，从而有助于形成大阵列的静电致动MEMS装置。驱动器电路布置成使得当HVTFT关闭时，高致动电压被施加到致动的MEMS器件的致动电极和HVTFT的漏电极，从而使电介质击穿最小化。当HVTFT响应于相对较低的控制电压而导通时，高致动电压从漏极（偏移）电极到源极（非偏移）电极被放电到地。

93. 发明授权

US06668628B2 Scanning probe system with spring probe 失效
标题翻译：用弹簧探头扫描探针系统
公开(公告)号：US06668628B2
公开(公告)日：2003-12-30
申请号：US10112215
申请日：2002-03-29
申请人： Thomas Hantschel , Eugene M. Chow , David K. Fork
发明人： Thomas Hantschel , Eugene M. Chow , David K. Fork
IPC分类号： G01B900
CPC分类号： G01Q70/10 , G01Q70/06 , G01Q70/16 , G01R1/06727 , Y10S977/873
摘要： Scanning probe systems, which include scanning probe microscopes (SPMs), atomic force microscope (AFMs), or profilometers, are disclosed that use cantilevered spring (e.g., stressy metal) probes formed on transparent substrates. When released, a free end bends away from the substrate to form the cantilevered spring probe, which has an in-plane or out-of-plane tip at its free end. The spring probe is mounted in a scanning probe system and is used to scan or otherwise probe a substrate surface. A laser beam is directed through the transparent substrate onto the probe to measure tip movement during scanning or probing. Other detection schemes can also be used (e.g., interferometry, capacitive, piezoresistive). The probes are used for topography, electrical, optical and thermal measurements. The probes also allow an SPM to operate as a depth gauge.
摘要翻译：公开了扫描探针系统，其包括扫描探针显微镜（SPM），原子力显微镜（AFM）或轮廓仪，其使用形成在透明基底上的悬臂弹簧（例如，应力金属）探针。当释放时，自由端从基板弯曲以形成悬臂弹簧探针，其在其自由端具有平面内或平面外的尖端。弹簧探针安装在扫描探针系统中，用于扫描或以其他方式探测衬底表面。激光束通过透明基板被引导到探头上，以在扫描或探测期间测量尖端移动。也可以使用其他检测方案（例如，干涉测量，电容式，压阻式）。探头用于地形，电气，光学和热测量。探头还允许SPM作为深度计操作。

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