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    • 92. 发明申请
    • Flip-Chip Light Emitting Diodes and Method of Manufacturing Thereof
    • 倒装芯片发光二极管及其制造方法
    • US20080121914A1
    • 2008-05-29
    • US11632279
    • 2005-07-12
    • Tae-Yeon SeongJune-O SongKyoung-Kook KimWoong-Ki Hong
    • Tae-Yeon SeongJune-O SongKyoung-Kook KimWoong-Ki Hong
    • H01L33/00H01L21/329
    • H01L33/405H01L33/32
    • Provided are a flip-chip nitride-based light emitting device having an n-type clad layer, an active layer and a p-type clad layer sequentially stacked thereon, comprising a reflective layer formed on the p-type clad layer and at least one transparent conductive thin film layer made up of transparent conductive materials capable of inhibiting diffusion of materials constituting the reflective layer, interposed between the p-type clad layer and reflective layer; and a process for preparing the same. In accordance with the flip-chip nitride-based light emitting device of the present invention and a process for preparing the same, there are provided advantages such as improved ohmic contact properties with the p-type clad layer, leading to increased wire bonding efficiency and yield upon packaging the light emitting device, capability to improve luminous efficiency and life span of the device due to low specific contact resistance and excellent current-voltage properties.
    • 提供了一种倒装芯片氮化物基发光器件,其具有依次层叠在其上的n型覆盖层,有源层和p型覆盖层,包括形成在p型覆盖层上的反射层和至少一个 透明导电薄膜层,其由能够抑制构成反射层的材料的扩散的透明导电材料构成,插入在p型覆盖层和反射层之间; 及其制备方法。 根据本发明的倒装氮化物基发光器件及其制备方法,提供了与p型覆盖层的欧姆接触特性提高的优点,从而提高引线接合效率, 在包装发光器件时的产量,由于低比接触电阻和优异的电流 - 电压特性,能够提高器件的发光效率和寿命。
    • 94. 发明授权
    • Flip-chip light emitting diode and method of manufacturing the same
    • 倒装芯片发光二极管及其制造方法
    • US07358541B2
    • 2008-04-15
    • US11002797
    • 2004-12-03
    • Tae-yeon SeongJune-o SongDong-seok Leem
    • Tae-yeon SeongJune-o SongDong-seok Leem
    • H01L29/22H01L29/227H01L33/00
    • H01L33/405H01L33/0095
    • Provided are a flip-chip light emitting diode (FCLED) and a method of manufacturing the same. The provided FCLED is formed by sequentially depositing an n-type cladding layer, an active layer, a p-type cladding layer, and a reflective layer on a substrate. The reflective layer is formed of the alloy of silver to which a solute element is added. According to the provided FCLED and the method of manufacturing the same, a thermal stability is improved to improve an ohmic contact characteristic to a p-type cladding layer, thus a wire bonding efficiency and a yield are improved when packaging the provided FCLED. In addition, the light emitting efficiency and the lifespan of the provided FCLED are improved due to a low specific-contact resistance and an excellent current-voltage characteristic.
    • 提供了一种倒装芯片发光二极管(FCLED)及其制造方法。 所提供的FCLED通过在衬底上依次沉积n型包覆层,有源层,p型包覆层和反射层而形成。 反射层由添加溶质元素的银合金形成。 根据提供的FCLED及其制造方法,改善了热稳定性以提高p型包覆层的欧姆接触特性,从而在包装所提供的FCLED时提高了引线接合效率和收率。 此外,由于具有低的比接触电阻和优异的电流 - 电压特性,提供的FCLED的发光效率和寿命得到改善。
    • 97. 发明授权
    • Metal thin film with ohmic contact for light emit diodes
    • 金属薄膜与欧姆接触发光二极管
    • US06169297A
    • 2001-01-02
    • US09213735
    • 1998-12-17
    • Ja Soon JangHyo Keun KimSeong Ju ParkTae Yeon SeongHeung Kyu Jang
    • Ja Soon JangHyo Keun KimSeong Ju ParkTae Yeon SeongHeung Kyu Jang
    • H01L3300
    • H01L33/40H01L33/32
    • A metal thin film with an ohmic contact for light emit diodes and a method of producing such a film are disclosed. The metal thin film has a p-type gallium nitride (GaN) semiconductor layer. Nickel (Ni), platinum (Pt) and gold (Au) layers are deposited on the GaN semiconductor layer in a way such that the gold layer forms a top layer, with either one of the platinum and nickel layers being selectively used as an inter-diffusion barrier between metal layers. The inter-diffusion barrier may be formed by depositing platinum between the nickel and gold layers, thus forming an Ni/Pt/Au metal thin film, or formed by depositing nickel between the platinum and gold layers, thus forming an Pt/Ni/Au metal thin film. In the method, a GaN semiconductor is washed so as to be free from carbide and oxide layers. The Ni, Pt and Au layers are formed on the GaN semiconductor layer through a vacuum deposition process at 5×10−5-2×10−1 torr. The GaN semiconductor, having the metal thin film, is heat treated for 30 seconds-3 hours and at 250-1,000° C., and under nitrogen or argon ambient.
    • 公开了一种用于发光二极管的欧姆接触的金属薄膜及其制造方法。 金属薄膜具有p型氮化镓(GaN)半导体层。 镍(Ni),铂(Pt)和金(Au)层以这样的方式沉积在GaN半导体层上,使得金层形成顶层,铂层和镍层中的任一层选择性地用作间隙 金属层之间的扩散屏障。 互扩散势垒可以通过在镍层和金层之间沉积铂而形成,从而形成Ni / Pt / Au金属薄膜,或者通过在铂层和金层之间沉积镍形成,从而形成Pt / Ni / Au 金属薄膜。 在该方法中,洗涤GaN半导体以便不含碳化物和氧化物层。 Ni,Pt和Au层通过真空沉积工艺在5×10 -5 -2×10 -1乇上形成在GaN半导体层上。 具有金属薄膜的GaN半导体在氮气或氩气环境下进行热处理30秒-3小时和250-1,000℃。