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    • 7. 发明授权
    • Group III-V semiconductor light emitting devices with reduced piezoelectric fields and increased efficiency
    • 具有降低的压电场和提高效率的III-V族III族半导体发光器件
    • US06229151B1
    • 2001-05-08
    • US09162708
    • 1998-09-29
    • Tetsuya TakeuchiNorihide YamadaHiroshi AmanoIsamu Akasaki
    • Tetsuya TakeuchiNorihide YamadaHiroshi AmanoIsamu Akasaki
    • H01L2906
    • H01L33/32B82Y20/00H01L33/16H01L33/18H01L33/24H01S5/021H01S5/0213H01S5/3201H01S5/3202H01S5/343H01S5/34333
    • An optical semiconductor device having a plurality of GaN-based semiconductor layers containing a strained quantum well layer in which the strained quantum well layer has a piezoelectric field that depends on the orientation of the strained quantum well layer when the quantum layer is grown. In the present invention, the strained quantum well layer is grown with an orientation at which the piezoelectric field is less than the maximum value of the piezoelectric field strength as a function of the orientation. In devices having GaN-based semiconductor layers with a wurtzite crystal structure, the growth orientation of the strained quantum well layer is tilted at least 1° from the {0001} direction of the wurtzite crystal structure. In devices having GaN-based semiconductor layers with a zincblende crystal structure, the growth orientation of the strained quantum well layer is tilted at least 1° from the {111} direction of the zincblende crystal structure. In the preferred embodiment of the present invention, the growth orientation is chosen to minimize the piezoelectric field in the strained quantum well layer.
    • 一种具有多个GaN基半导体层的光半导体器件,其含有应变量子阱层,其中应变量子阱层具有取决于量子层生长时应变量子阱层的取向的压电场。 在本发明中,应变量子阱层以压电场小于压电场强度的最大值作为取向的方向生长。 在具有纤锌矿晶体结构的GaN基半导体层的器件中,应变量子阱层的生长方向从纤锌矿晶体结构的{0001}方向倾斜至少1°。 在具有锌辉石晶体结构的GaN基半导体层的器件中,应变量子阱层的生长取向从闪锌矿晶体结构的{111}方向倾斜至少1°。 在本发明的优选实施例中,选择生长方向以最小化应变量子阱层中的压电场。