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热词
    • 9. 发明授权
    • Test pin assembly for circuit board tester
    • 电路板测试仪的测试针组件
    • US4935696A
    • 1990-06-19
    • US438734
    • 1989-11-17
    • Paul M. DiPerna
    • Paul M. DiPerna
    • G01R1/073
    • G01R1/07378
    • Apparatus for testing the electrical integrity of printed circuit boards under test (BUTs), each BUT having a plurality of downwardly directed accessible nodes, the apparatus including support apparatus for removably supporting the BUT, test circuitry including a plurality of upwardly directed channel nodes below the support apparatus, connection apparatus for electrically connecting the channel nodes to the BUT nodes, the connection apparatus comprising a universal board carrying probes in a universal grid pattern, means to activate selective probes, and a translator board to make electrical connection between upper and lower conductors in different patterns.
    • 用于测试被测试印刷电路板(BUT)的电气完整性的设备,每个BUT具有多个向下可导向的可接近节点,该装置包括用于可移除地支撑BUT的支撑装置,测试电路包括多个向下定向的通道节点, 支撑装置,用于将通道节点电连接到BUT节点的连接装置,所述连接装置包括通用板,其承载通用网格图案中的探针,激活选择性探针的装置和转换板,以在上导体和下导体之间进行电连接 在不同的模式。