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    • 1. 发明授权
    • SRAM with embedded ROM
    • SRAM带嵌入式ROM
    • US08995178B1
    • 2015-03-31
    • US14069192
    • 2013-10-31
    • Jianan YangBrad J. GarniMark W. Jetton
    • Jianan YangBrad J. GarniMark W. Jetton
    • G11C11/00G11C11/412H01L27/11
    • G11C11/412G11C14/0054G11C17/12H01L27/1104
    • An integrated circuit includes first and second memory cells including a first pull-up transistor each having a body tie coupled to respective first and second well bias voltages. Drain electrodes of the first and second pull-up transistors are coupled to a first true bit line and a first complementary bit line, respectively. A second memory cell includes first and second pull-up transistors each having a body tie coupled to the second and first well bias voltages, respectively. Drain electrodes of the first and second pull-up transistors are coupled to a second true bit line and a second complementary bit line, respectively. The first well bias voltage is lower than the second well bias voltage during a Read-Only Memory (ROM) mode, and the first well bias voltage is the same as the second well bias voltage during a Static Random Access Memory (SRAM) mode.
    • 集成电路包括第一和第二存储器单元,其包括第一上拉晶体管,每个第一上拉晶体管具有耦合到相应的第一和第二阱偏置电压的主体带。 第一和第二上拉晶体管的漏极分别耦合到第一真位线和第一互补位线。 第二存储器单元包括分别具有耦合到第二阱偏置电压和第一阱偏置电压的主体带的第一和第二上拉晶体管。 第一和第二上拉晶体管的漏极电极分别耦合到第二真位线和第二互补位线。 在只读存储器(ROM)模式期间,第一阱偏置电压低于第二阱偏置电压,并且在静态随机存取存储器(SRAM)模式期间,第一阱偏置电压与第二阱偏置电压相同。
    • 2. 发明申请
    • SINGLE-EVENT LATCH-UP PREVENTION TECHNIQUES FOR A SEMICONDUCTOR DEVICE
    • 用于半导体器件的单事件闭锁预防技术
    • US20140027810A1
    • 2014-01-30
    • US13560010
    • 2012-07-27
    • Jianan YangJames D. BurnettBrad J. GarniThomas W. ListonHuy Van Pham
    • Jianan YangJames D. BurnettBrad J. GarniThomas W. ListonHuy Van Pham
    • H01L27/06G06F17/50
    • H01L27/06H01L27/0921
    • A technique for addressing single-event latch-up (SEL) in a semiconductor device includes determining a location of a parasitic silicon-controlled rectifier (SCR) in an integrated circuit design of the semiconductor device. In this case, the parasitic SCR includes a parasitic pnp bipolar junction transistor (BJT) and a parasitic npn BJT. The technique also includes incorporating a first transistor between a first power supply node and an emitter of the parasitic pnp BJT in the integrated circuit design. The first transistor includes a first terminal coupled to the first power supply node, a second terminal coupled to the emitter of the parasitic pnp BJT, and a control terminal. The first transistor is not positioned between a base of the pnp BJT and the first power supply node. The first transistor limits current conducted by the parasitic pnp bipolar junction transistor following an SEL.
    • 用于在半导体器件中寻址单事件闩锁(SEL)的技术包括在半导体器件的集成电路设计中确定寄生硅控整流器(SCR)的位置。 在这种情况下,寄生SCR包括寄生pnp双极结型晶体管(BJT)和寄生npnBJT。 该技术还包括在集成电路设计中在第一电源节点和寄生pnp BJT的发射极之间并入第一晶体管。 第一晶体管包括耦合到第一电源节点的第一端子,耦合到寄生pnp BJT的发射极的第二端子和控制端子。 第一晶体管不位于pnp BJT的基极和第一电源节点之间。 第一晶体管限制了在SEL之后由寄生pnp双极结晶体传导的电流。
    • 4. 发明授权
    • Single event latch-up prevention techniques for a semiconductor device
    • 半导体器件的单事件闭锁预防技术
    • US08685800B2
    • 2014-04-01
    • US13560010
    • 2012-07-27
    • Jianan YangJames D. BurnettBrad J. GarniThomas W. ListonHuy Van Pham
    • Jianan YangJames D. BurnettBrad J. GarniThomas W. ListonHuy Van Pham
    • H01L21/332
    • H01L27/06H01L27/0921
    • A technique for addressing single-event latch-up (SEL) in a semiconductor device includes determining a location of a parasitic silicon-controlled rectifier (SCR) in an integrated circuit design of the semiconductor device. In this case, the parasitic SCR includes a parasitic pnp bipolar junction transistor (BJT) and a parasitic npn BJT. The technique also includes incorporating a first transistor between a first power supply node and an emitter of the parasitic pnp BJT in the integrated circuit design. The first transistor includes a first terminal coupled to the first power supply node, a second terminal coupled to the emitter of the parasitic pnp BJT, and a control terminal. The first transistor is not positioned between a base of the pnp BJT and the first power supply node. The first transistor limits current conducted by the parasitic pnp bipolar junction transistor following an SEL.
    • 用于在半导体器件中寻址单事件闩锁(SEL)的技术包括在半导体器件的集成电路设计中确定寄生硅控整流器(SCR)的位置。 在这种情况下,寄生SCR包括寄生pnp双极结型晶体管(BJT)和寄生npnBJT。 该技术还包括在集成电路设计中在第一电源节点和寄生pnp BJT的发射极之间并入第一晶体管。 第一晶体管包括耦合到第一电源节点的第一端子,耦合到寄生pnp BJT的发射极的第二端子和控制端子。 第一晶体管不位于pnp BJT的基极和第一电源节点之间。 第一晶体管限制了在SEL之后由寄生pnp双极结晶体传导的电流。
    • 6. 发明授权
    • Circuit and method of writing a toggle memory
    • 写入切换存储器的电路和方法
    • US06693824B2
    • 2004-02-17
    • US10186141
    • 2002-06-28
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBrad J. Garni
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBrad J. Garni
    • G11C1100
    • G11C11/16G11C2207/2263
    • A magnetoresistive random access memory is operated in a toggle fashion so that its logic state is flipped from its current state to the alternate state when written. This provides for a more consistent and reliable programming because the magnetic transitional energy states during the toggle operation are stable. In a write situation, however, this does mean that the state of the cell must be read and compared to the desired state of the cell before the cell is flipped. If the cell is already in the desired logic state, then it should not be written. This read time penalty before writing is reduced by beginning the write process while reading and then aborting the write step if the cell is already in the desired state. The write can actually begin on the cell and be aborted without adversely effecting the state of the cell.
    • 磁阻随机存取存储器以触发方式操作,使得其写入时其逻辑状态从其当前状态翻转到备用状态。 这提供了更一致和可靠的编程,因为在切换操作期间的磁过渡能量状态是稳定的。 然而,在写入情况下,这意味着在单元被翻转之前,单元格的状态必须被读取并与单元格的期望状态进行比较。 如果单元已经处于所需的逻辑状态,则不应写入。 写入前的读取时间损失通过在读取时开始写入处理而减少,然后在单元格已经处于所需状态时中止写入步骤。 写入实际上可以在单元格上开始并被中止,而不会不利地影响单元的状态。