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    • 1. 发明申请
    • Clock Gater with Test Features and Low Setup Time
    • 具有测试功能和低设置时间的时钟控制器
    • US20100277219A1
    • 2010-11-04
    • US12836141
    • 2010-07-14
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • H03K17/687
    • H03K19/0016G01R31/31922G06F1/10G06F1/3237H03K17/687Y02D10/128
    • A clock gater circuit comprises a plurality of transistors having source-drain connections forming a stack between a first node and a supply node. A given logical state on the first node causes a corresponding logical state on an output clock of the clock gater circuit. In one embodiment, a first transistor of the plurality of transistors has a gate coupled to receive an enable input signal. A second transistor is connected in parallel with the first transistor, and has a gate controlled responsive to a test input signal to ensure that the output clock is generated even if the enable input signal is not in an enabled state. In another embodiment, the plurality of transistors comprises a first transistor having a gate controlled responsive to a clock input of the clock gater circuit and a second transistor having a gate controlled responsive to an output of a delay circuit. The delay circuit comprises at least one inverter, wherein an input of the delay circuit is the clock input, and wherein a first inverter of the delay circuit is coupled to receive a test input signal and is configured to force a first logical state on an output of the first inverter responsive to an assertion of the test input signal.
    • 时钟门电路包括多个具有在第一节点和供电节点之间形成堆叠的源极 - 漏极连接的晶体管。 第一节点上的给定逻辑状态在时钟门控电路的输出时钟上引起相应的逻辑状态。 在一个实施例中,多个晶体管中的第一晶体管具有耦合以接收使能输入信号的栅极。 第二晶体管与第一晶体管并联连接,并且响应于测试输入信号具有控制门,以确保即使使能输入信号不处于使能状态也能产生输出时钟。 在另一个实施例中,多个晶体管包括响应于时钟门电路电路的时钟输入的门控制的第一晶体管和响应于延迟电路的输出的具有门控制的第二晶体管。 所述延迟电路包括至少一个逆变器,其中所述延迟电路的输入是所述时钟输入,并且其中所述延迟电路的第一反相器被耦合以接收测试输入信号,并且被配置为在输出端上强制第一逻辑状态 所述第一逆变器响应于所述测试输入信号的断言。
    • 2. 发明申请
    • Clock Gater with Test Features and Low Setup Time
    • 具有测试功能和低设置时间的时钟控制器
    • US20080180159A1
    • 2008-07-31
    • US11627646
    • 2007-01-26
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • H03K17/687
    • H03K19/0016G01R31/31922G06F1/10G06F1/3237H03K17/687Y02D10/128
    • A clock gater circuit comprises a plurality of transistors having source-drain connections forming a stack between a first node and a supply node. A given logical state on the first node causes a corresponding logical state on an output clock of the clock gater circuit. In one embodiment, a first transistor of the plurality of transistors has a gate coupled to receive an enable input signal. A second transistor is connected in parallel with the first transistor, and has a gate controlled responsive to a test input signal to ensure that the output clock is generated even if the enable input signal is not in an enabled state. In another embodiment, the plurality of transistors comprises a first transistor having a gate controlled responsive to a clock input of the clock gater circuit and a second transistor having a gate controlled responsive to an output of a delay circuit. The delay circuit comprises at least one inverter, wherein an input of the delay circuit is the clock input, and wherein a first inverter of the delay circuit is coupled to receive a test input signal and is configured to force a first logical state on an output of the first inverter responsive to an assertion of the test input signal.
    • 时钟门电路包括多个具有在第一节点和供电节点之间形成堆叠的源极 - 漏极连接的晶体管。 第一节点上的给定逻辑状态在时钟门控电路的输出时钟上引起相应的逻辑状态。 在一个实施例中,多个晶体管中的第一晶体管具有耦合以接收使能输入信号的栅极。 第二晶体管与第一晶体管并联连接,并且响应于测试输入信号具有控制门,以确保即使使能输入信号不处于使能状态也能产生输出时钟。 在另一个实施例中,多个晶体管包括响应于时钟门电路电路的时钟输入的门控制的第一晶体管和响应于延迟电路的输出的具有门控制的第二晶体管。 所述延迟电路包括至少一个逆变器,其中所述延迟电路的输入是所述时钟输入,并且其中所述延迟电路的第一反相器被耦合以接收测试输入信号,并且被配置为在输出端上强制第一逻辑状态 所述第一逆变器响应于所述测试输入信号的断言。
    • 3. 发明授权
    • Clock gater with test features and low setup time
    • 时钟门控器具有测试功能和低设置时间
    • US07779372B2
    • 2010-08-17
    • US11627646
    • 2007-01-26
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • G06F17/50
    • H03K19/0016G01R31/31922G06F1/10G06F1/3237H03K17/687Y02D10/128
    • A clock gater circuit comprises a plurality of transistors having source-drain connections forming a stack between a first node and a supply node. A given logical state on the first node causes a corresponding logical state on an output clock of the clock gater circuit. In one embodiment, a first transistor of the plurality of transistors has a gate coupled to receive an enable input signal. A second transistor is connected in parallel with the first transistor, and has a gate controlled responsive to a test input signal to ensure that the output clock is generated even if the enable input signal is not in an enabled state. In another embodiment, the plurality of transistors comprises a first transistor having a gate controlled responsive to a clock input of the clock gater circuit and a second transistor having a gate controlled responsive to an output of a delay circuit. The delay circuit comprises at least one inverter, wherein an input of the delay circuit is the clock input, and wherein a first inverter of the delay circuit is coupled to receive a test input signal and is configured to force a first logical state on an output of the first inverter responsive to an assertion of the test input signal.
    • 时钟门电路包括多个具有在第一节点和供电节点之间形成堆叠的源极 - 漏极连接的晶体管。 第一节点上的给定逻辑状态在时钟门控电路的输出时钟上引起相应的逻辑状态。 在一个实施例中,多个晶体管中的第一晶体管具有耦合以接收使能输入信号的栅极。 第二晶体管与第一晶体管并联连接,并且响应于测试输入信号具有控制门,以确保即使使能输入信号不处于使能状态也能产生输出时钟。 在另一个实施例中,多个晶体管包括响应于时钟门电路电路的时钟输入的门控制的第一晶体管和响应于延迟电路的输出的具有门控制的第二晶体管。 所述延迟电路包括至少一个逆变器,其中所述延迟电路的输入是所述时钟输入,并且其中所述延迟电路的第一反相器被耦合以接收测试输入信号,并且被配置为在输出端上强制第一逻辑状态 所述第一逆变器响应于所述测试输入信号的断言。
    • 4. 发明授权
    • Clock gater with test features and low setup time
    • 时钟门控器具有测试功能和低设置时间
    • US08341578B2
    • 2012-12-25
    • US12836141
    • 2010-07-14
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • Brian J. CampbellShaishav DesaiEdgardo F. KlassPradeep R. TrivediSridhar Narayanan
    • G06F17/50
    • H03K19/0016G01R31/31922G06F1/10G06F1/3237H03K17/687Y02D10/128
    • A clock gater circuit comprises a plurality of transistors having source-drain connections forming a stack between a first node and a supply node. A given logical state on the first node causes a corresponding logical state on an output clock of the clock gater circuit. In one embodiment, a first transistor of the plurality of transistors has a gate coupled to receive an enable input signal. A second transistor is connected in parallel with the first transistor, and has a gate controlled responsive to a test input signal to ensure that the output clock is generated even if the enable input signal is not in an enabled state. In another embodiment, the plurality of transistors comprises a first transistor having a gate controlled responsive to a clock input of the clock gater circuit and a second transistor having a gate controlled responsive to an output of a delay circuit. The delay circuit comprises at least one inverter, wherein an input of the delay circuit is the clock input, and wherein a first inverter of the delay circuit is coupled to receive a test input signal and is configured to force a first logical state on an output of the first inverter responsive to an assertion of the test input signal.
    • 时钟门电路包括多个具有在第一节点和供电节点之间形成堆叠的源极 - 漏极连接的晶体管。 第一节点上的给定逻辑状态在时钟门控电路的输出时钟上引起相应的逻辑状态。 在一个实施例中,多个晶体管中的第一晶体管具有耦合以接收使能输入信号的栅极。 第二晶体管与第一晶体管并联连接,并且响应于测试输入信号具有控制门,以确保即使使能输入信号不处于使能状态也能产生输出时钟。 在另一个实施例中,多个晶体管包括响应于时钟门电路电路的时钟输入的门控制的第一晶体管和响应于延迟电路的输出的具有门控制的第二晶体管。 所述延迟电路包括至少一个逆变器,其中所述延迟电路的输入是所述时钟输入,并且其中所述延迟电路的第一反相器被耦合以接收测试输入信号,并且被配置为在输出端上强制第一逻辑状态 所述第一逆变器响应于所述测试输入信号的断言。
    • 8. 发明授权
    • Cache optimizations using multiple threshold voltage transistors
    • 使用多个阈值电压晶体管的缓存优化
    • US08102728B2
    • 2012-01-24
    • US12419605
    • 2009-04-07
    • Brian J. CampbellGreg M. HessHang Huang
    • Brian J. CampbellGreg M. HessHang Huang
    • G11C8/00
    • G11C7/12G11C8/08G11C11/417
    • In one embodiment, a memory circuit includes one or more memory cells that include transistors having a first nominal threshold voltage, and interface circuitry such as word line drivers and bit line control circuitry that includes one or more transistors having a second nominal threshold voltage that is lower than the first nominal threshold voltage. For example, the word line driver circuit may be driven by signals from a lower voltage domain than the memory circuit's voltage domain. Lower threshold voltage transistors may be used for those signals, in some embodiments. Similarly, lower threshold voltage transistors may be used in the write data driver circuits. Other bit line control circuits may include lower threshold voltage transistors to permit smaller transistors to be used, which may reduce power and integrated circuit area occupied by the memory circuits.
    • 在一个实施例中,存储器电路包括一个或多个存储单元,其包括具有第一标称阈值电压的晶体管,以及诸如字线驱动器和位线控制电路的接口电路,其包括具有第二标称阈值电压的一个或多个晶体管, 低于第一标称阈值电压。 例如,字线驱动器电路可以由比存储器电路的电压域更低的电压域的信号来驱动。 在一些实施例中,下阈值电压晶体管可用于那些信号。 类似地,在写入数据驱动器电路中可以使用较低阈值电压晶体管。 其它位线控制电路可以包括较低阈值电压晶体管,以允许使用更小的晶体管,这可以降低由存储器电路占用的功率和集成电路面积。