专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20140249033A1 DC SQUID BASED RF MAGNETOMETER OPERATING AT A BANDWIDTH OF 200 MHZ AND HIGHER 有权
标题翻译：基于DC SQUID的RF磁力计在200MHz和更高的带宽下工作
公开(公告)号：US20140249033A1
公开(公告)日：2014-09-04
申请号：US14351374
申请日：2011-11-14
申请人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nesco Mario Lettsome, JR.
发明人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nesco Mario Lettsome, JR.
IPC分类号： G01R33/035
CPC分类号： G01R33/0356 , G01R33/035
摘要： An RF DC SQUID based magnetometer capable of sensing coherent magnetic fields up to 200 MHz and higher is developed which overcomes frequency limitations associated with noise signals due to transmission line delays between the SQUID circuit and readout electronics. The bandwidth limitations are overcome by superimposing the RF flux on the modulation flux to produce at the SQUID output a binary phase modulated RF voltage, which is processed to lock the static flux, and to control modulation regime by producing an AC bias for the RF flux. RF readout electronics based on a double lock-in technique (sequential demodulation of the RF SQUID voltage at the modulation flux frequency ωm and the RF flux frequency ωRF), yields a signal proportional to the product of amplitude and phase cosine of RF flux with linear dynamic range up to five orders in magnitude if compared to DC SQUID operated in traditional flux-locked loop regime.
摘要翻译：开发了能够感测高达200MHz及更高的相干磁场的基于RF DC SQUID的磁力计，其克服了由于SQUID电路和读出电子器件之间的传输线延迟而与噪声信号相关的频率限制。通过将RF通量叠加在调制通量上来克服带宽限制，以在SQUID输出处产生二进制相位调制RF电压，其被处理以锁定静态通量，并通过产生用于RF通量的AC偏置来控制调制方式。基于双重锁定技术（RF调制通量频率ωm的RF SQUID电压和RF通量频率ωRF的顺序解调）的射频读出电子产生与RF通量的幅度和相位余弦乘积成正比的信号与线性与传统磁链锁定环路中操作的DC SQUID相比，动态范围可达五级。

2. 发明授权

US09476951B2 DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz and higher 有权
标题翻译：基于DC SQUID的RF磁力计，工作频率为200 MHz及以上
公开(公告)号：US09476951B2
公开(公告)日：2016-10-25
申请号：US14351374
申请日：2011-11-14
申请人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nesco Mario Lettsome, Jr.
发明人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nesco Mario Lettsome, Jr.
IPC分类号： G01R33/035
CPC分类号： G01R33/0356 , G01R33/035
摘要： An RF DC SQUID based magnetometer capable of sensing coherent magnetic fields up to 200 MHz and higher is developed which overcomes frequency limitations associated with noise signals due to transmission line delays between the SQUID circuit and readout electronics. The bandwidth limitations are overcome by superimposing the RF flux on the modulation flux to produce at the SQUID output a binary phase modulated RF voltage, which is processed to lock the static flux, and to control modulation regime by producing an AC bias for the RF flux. RF readout electronics based on a double lock-in technique (sequential demodulation of the RF SQUID voltage at the modulation flux frequency ωm and the RF flux frequency ωRF), yields a signal proportional to the product of amplitude and phase cosine of RF flux with linear dynamic range up to five orders in magnitude if compared to DC SQUID operated in traditional flux-locked loop regime.
摘要翻译：开发了能够感测高达200MHz及更高的相干磁场的基于RF DC SQUID的磁力计，其克服了由于SQUID电路和读出电子器件之间的传输线延迟而与噪声信号相关的频率限制。通过将RF通量叠加在调制通量上来克服带宽限制，以在SQUID输出处产生二进制相位调制RF电压，其被处理以锁定静态通量，并通过产生用于RF通量的AC偏置来控制调制方式。基于双重锁定技术（RF调制通量频率ωm的RF SQUID电压和RF通量频率ωRF的顺序解调）的射频读出电子产生与RF通量的幅度和相位余弦乘积成正比的信号与线性与传统磁链锁定环路中操作的DC SQUID相比，动态范围可达五级。

3. 发明授权

US09529035B2 Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer 有权
标题翻译：使用基于DC鱿鱼的RF磁强计对电子设备中的开放缺陷进行定位的方法和系统
公开(公告)号：US09529035B2
公开(公告)日：2016-12-27
申请号：US14351396
申请日：2011-11-14
申请人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nicholas Eric Gagliolo
发明人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nicholas Eric Gagliolo
IPC分类号： G01R31/08 , G01N27/82 , G01R33/035 , G01R31/308 , G01R31/315
CPC分类号： G01R31/088 , G01N27/82 , G01R31/08 , G01R31/308 , G01R31/315 , G01R33/0356
摘要： Non-destructive localization of open defects in electronic devices is performed with a DC SQUID based RF magnetometer capable of sensing coherent magnetic fields up to 200 MHz and higher. RF magnetic fields (or RF current) images are correlated to conductive paths layout of the electronic device, and the open defect is pinpointed at a location of RF current disappearance on the current image. The bandwidth limitations associated with transmission line delays between SQUID circuit and readout electronic, as well as with near-field coupling between different parts of the measurement scheme, are overcome by superimposing the RF flux emanating from device under study on the modulation flux to produce at the SQUID output a binary phase modulated RF voltage, which is processed to lock the static flux, and to control modulation regime by producing an AC bias for the RF flux. RF readout electronics is based on a double lock-in through sequential demodulation of the RF component of the output SQUID voltage at the modulation flux frequency ωm and the RF flux frequency ωRF.
摘要翻译：使用能够感测高达200MHz及更高的相干磁场的基于DC SQUID的RF磁力计来执行电子设备中的开放缺陷的非破坏性定位。 RF磁场（或RF电流）图像与电子设备的导电路径布局相关，并且在当前图像上的RF电流消失的位置处精确定位开放缺陷。与SQUID电路和读出电子之间的传输线延迟相关的带宽限制以及测量方案的不同部分之间的近场耦合被克服，将从研究设备发出的RF通量叠加在调制通量上，以产生 SQUID输出二进制相位调制RF电压，其被处理以锁定静态通量，并且通过产生用于RF通量的AC偏置来控制调制方式。 RF读出电路基于通过对调制通量频率ωm和RF通量频率ωRF的输出SQUID电压的RF分量的顺序解调的双重锁定。

4. 发明申请

US20140253111A1 METHOD AND SYSTEM FOR LOCALIZATION OF OPEN DEFECTS IN ELECTRONIC DEVICES WITH A DC SQUID BASED RF MAGNETOMETER 有权
标题翻译：使用基于DC SQUID的RF磁力计在电子设备中定位开路缺陷的方法和系统
公开(公告)号：US20140253111A1
公开(公告)日：2014-09-11
申请号：US14351396
申请日：2011-11-14
申请人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nicholas Eric Gagliolo
发明人： Antonio Orozco , Vladimir V. Talanov , Alfred Benjamin Cawthorne, III , Nicholas Eric Gagliolo
IPC分类号： G01R31/08 , G01N27/82
CPC分类号： G01R31/088 , G01N27/82 , G01R31/08 , G01R31/308 , G01R31/315 , G01R33/0356
摘要： Non-destructive localization of open defects in electronic devices is performed with a DC SQUID based RF magnetometer capable of sensing coherent magnetic fields up to 200 MHz and higher. RF magnetic fields (or RF current) images are correlated to conductive paths layout of the electronic device, and the open defect is pinpointed at a location of RF current disappearance on the current image. The bandwidth limitations associated with transmission line delays between SQUID circuit and readout electronic, as well as with near-field coupling between different parts of the measurement scheme, are overcome by superimposing the RF flux emanating from device under study on the modulation flux to produce at the SQUID output a binary phase modulated RF voltage, which is processed to lock the static flux, and to control modulation regime by producing an AC bias for the RF flux. RF readout electronics is based on a double lock-in through sequential demodulation of the RF component of the output SQUID voltage at the modulation flux frequency ωm and the RF flux frequency ωRF.
摘要翻译：使用能够感测高达200MHz及更高的相干磁场的基于DC SQUID的RF磁力计来执行电子设备中的开放缺陷的非破坏性定位。 RF磁场（或RF电流）图像与电子设备的导电路径布局相关，并且在当前图像上的RF电流消失的位置处精确定位开放缺陷。与SQUID电路和读出电子之间的传输线延迟相关的带宽限制以及测量方案的不同部分之间的近场耦合被克服，将从研究设备发出的RF通量叠加在调制通量上，以产生 SQUID输出二进制相位调制RF电压，其被处理以锁定静态通量，并且通过产生用于RF通量的AC偏置来控制调制方式。 RF读出电路基于通过对调制通量频率ωm和RF通量频率ωRF的输出SQUID电压的RF分量的顺序解调的双重锁定。

5. 发明授权

US06680617B2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method 失效
标题翻译：用于材料的复介电常数和制造方法的局部测量的孔径探针
公开(公告)号：US06680617B2
公开(公告)日：2004-01-20
申请号：US10266611
申请日：2002-10-09
申请人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
发明人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
IPC分类号： G01R2704
CPC分类号： G01Q60/22 , G01R27/2617 , Y10T29/49002 , Y10T29/49007 , Y10T29/49117
摘要： A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study.
摘要翻译：用于非破坏性测定材料和近场光学显微镜的复介电常数的探针基于在电介质基底构件上产生的平衡的多导体传输线结构，其将探测场限制在材料中明确定义的采样体积内正在研究中

6. 发明授权

US07362108B2 Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe 失效
标题翻译：使用近场微波探针测量蚀刻电介质结构中侧壁损伤的方法和系统
公开(公告)号：US07362108B2
公开(公告)日：2008-04-22
申请号：US11249705
申请日：2005-10-14
申请人： Vladimir V. Talanov , Andrew R. Schwartz , Andre Scherz
发明人： Vladimir V. Talanov , Andrew R. Schwartz , Andre Scherz
IPC分类号： G01R27/04 , G01R35/00 , G01R27/26 , G01R31/26
CPC分类号： G01Q60/22 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： By using techniques for near field probes to measure dielectric values of blanket films, the measure of the sidewall damage of the patterned structure is calculated. The interaction between the near field probe and the etched structure is modeled to obtain the model total capacitance. The near field microwave probe is calibrated on a set of blanket films with different thicknesses, and the dielectric constant of the etched trench structure is calculated using the measured frequency shift and calibration parameters. The measured capacitance is further calculated for the etched trench structure using the dielectric constant and the total thickness of the etched trench structure. The effective dielectric constant of the structure under study is extracted where the model capacitance is equal to the measured capacitance. The measure of the sidewall damage is further calculated using the effective dielectric constant.
摘要翻译：通过使用近场探针的技术来测量覆盖膜的介电值，计算图案化结构的侧壁损伤的测量。模拟了近场探针和蚀刻结构之间的相互作用以获得模型总电容。近场微波探头在一组不同厚度的橡皮布膜上进行校准，并使用测量的频移和校准参数计算蚀刻沟槽结构的介电常数。使用介电常数和蚀刻沟槽结构的总厚度进一步计算蚀刻沟槽结构的测量电容。提取所研究结构的有效介电常数，其中模型电容等于测得的电容。使用有效介电常数进一步计算侧壁损伤的测量。

7. 发明授权

US06959481B2 Apertured probes for localized measurements of a material's complex permittivity and fabrication method 失效
标题翻译：用于材料的复介电常数和制造方法的局部测量的孔径探针
公开(公告)号：US06959481B2
公开(公告)日：2005-11-01
申请号：US10392918
申请日：2003-03-21
申请人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
发明人： Robert L. Moreland , Hans M. Christen , Vladimir V. Talanov , Andrew R. Schwartz
IPC分类号： G01R27/06 , G01N22/00 , G01Q10/00 , G01Q60/18 , G01Q60/22 , G01Q60/46 , G01Q70/16 , G01R1/06 , G01R27/26 , H01S4/00
CPC分类号： G01Q60/22 , G01R27/2617 , Y10T29/49002 , Y10T29/49007 , Y10T29/49117
摘要： A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study. A method for manufacturing dielectric support member based probes includes anisotropically depositing a 50-100 Å thick underlayer of Cr, Ni, W or Ta onto the dielectric support member, anisotropically depositing conductive material onto the Cr, Ni, W or Ta underlayer, and removing the unwanted conductive material at the sides of the dielectric support member to electrically isolate the created conductive strips.
摘要翻译：用于非破坏性测定材料和近场光学显微镜的复介电常数的探针基于在电介质基底构件上产生的平衡的多导体传输线结构，其将探测场限制在材料中明确定义的采样体积内正在研究中用于制造基于电介质支撑元件的探针的方法包括将各向异性地沉积50-100厚的Cr，Ni，W或Ta的底层到电介质支撑件上，各向异性地将导电材料沉积到Cr，Ni，W或Ta底层上，在电介质支撑构件的侧面处的不需要的导电材料以电隔离所产生的导电条。

8. 发明授权

US06856140B2 System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes 失效
标题翻译：使用近场微波探针对材料的复介电常数进行定量测量的系统和方法
公开(公告)号：US06856140B2
公开(公告)日：2005-02-15
申请号：US10412295
申请日：2003-04-14
申请人： Vladimir V. Talanov , Robert L. Moreland , Andrew R. Schwartz , Hans M. Christen
发明人： Vladimir V. Talanov , Robert L. Moreland , Andrew R. Schwartz , Hans M. Christen
IPC分类号： G01R27/06 , G01N22/00 , G01Q10/00 , G01Q60/18 , G01Q60/22 , G01Q60/46 , G01Q70/16 , G01R27/04
CPC分类号： G01Q60/22
摘要： A method for measuring a material's complex permittivity is provided where a near-field microwave probe is positioned a predetermined distance from a first and a second standard sample for measuring a relative resonant frequency shift of the near-field microwave probe for standard samples. Based on measurements, calibration coefficients are calculated. A relative resonant frequency shift of the near-field microwave probe for a sample under study is measured by fast frequency sweep technique while the distance between the tip of the probe and the sample under the study is maintained nominally at the distance between the tip of the probe and each standard sample during a calibration procedure by a shear-force based distance control mechanism. Also, the change in the quality factor of the probe for unloaded and loaded resonator is measured. The dielectric constant of the sample under study is calculated using the resonant frequency shift and the change in the quality factor of the near-field microwave probe for the sample under study and the calibration coefficients obtained during the calibration procedure.
摘要翻译：提供了一种用于测量材料的复介电常数的方法，其中近场微波探针位于与用于标准样品的近场微波探针的相对共振频移的第一和第二标准样本预定距离处。基于测量，计算校准系数。通过快速扫频技术测量用于所研究的样品的近场微波探针的相对共振频移，同时探针尖端与研究下的样品之间的距离标称地保持在探头和每个标准样品在校准过程中通过基于剪切力的距离控制机制。此外，测量了用于无负载和负载的谐振器的探头的品质因数的变化。使用研究中的样品的谐振频率偏移和近场微波探针的质量因子的变化以及校准过程中获得的校准系数来计算正在研究的样品的介电常数。

9. 发明授权

US11417821B2 Superconductor ground plane patterning geometries that attract magnetic flux 有权
公开(公告)号：US11417821B2
公开(公告)日：2022-08-16
申请号：US16296007
申请日：2019-03-07
申请人： Anna Y. Herr , Vladimir V. Talanov , Quentin P. Herr
发明人： Anna Y. Herr , Vladimir V. Talanov , Quentin P. Herr
IPC分类号： H01L39/14 , H01L39/08 , H01L39/24 , H01L27/18
摘要： Superconducting integrated circuit layouts are proofed against the detrimental effects of stray flux by designing and fabricating them to have one or more ground planes patterned in the x-y plane with a regular grid of low-aspect-ratio flux-trapping voids. The ground plane(s) can be globally patterned with such voids and thousands or more superconducting circuit devices and wires can thereafter be laid out so as not to intersect or come so close to the voids that the trapped flux would induce supercurrents in them, thus preventing undesirable coupling of flux into circuit elements. Sandwiching a wire layer between patterned ground planes permits wires to be laid out even closer to the voids. Voids of successively smaller maximum dimension can be concentrically stacked in pyramidal fashion in multiple ground plane layers having different superconductor transition temperatures, increasing the x-y area available for device placement and wire-up.

10. 发明授权

US10591952B1 Clock distribution resonator system 有权
公开(公告)号：US10591952B1
公开(公告)日：2020-03-17
申请号：US16352558
申请日：2019-03-13
申请人： Joshua A. Strong , Max E. Nielsen , Vladimir V. Talanov , Temitope Olumuyiwa Ogunnika
发明人： Joshua A. Strong , Max E. Nielsen , Vladimir V. Talanov , Temitope Olumuyiwa Ogunnika
IPC分类号： G06F1/10 , G06F1/12
摘要： One embodiment includes a clock distribution resonator system. The system includes a clock source configured to generate a clock signal having a predefined wavelength, and a main transmission line coupled to the clock source to propagate the clock signal and comprising a first predetermined length defined as a function of the wavelength of the clock signal. The system also includes a plurality of transmission line branches each coupled to the main transmission line to propagate the clock signal. Each of the plurality of transmission line branches includes a second predetermined length different from the first predetermined length. The system further includes a plurality of clock distribution networks coupled to the respective plurality of transmission line branches and being configured to provide the clock signal to each of a plurality of circuits to provide clock synchronization for the associated plurality of circuits.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式