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1. 发明公开

US20230243900A1 DIAGNOSTIC DEVICE FOR THE CHARACTERIZATION OF ELECTROMAGNETIC MATERIAL PROPERTIES 审中-公开
公开(公告)号：US20230243900A1
公开(公告)日：2023-08-03
申请号：US17989253
申请日：2022-11-17
申请人： Government of the United States, as represented by the Secretary of the Air Force
发明人： Andrew J. Hamilton , James Park , Woo Yong Jang , Nathan E. Zechar
IPC分类号： G01R33/12 , G01R27/26
CPC分类号： G01R33/1223 , G01R27/2617 , G01R27/2694
摘要： The present invention relates to diagnostic device for the characterization of electromagnetic material properties and a method of making and using same. Unlike current diagnostic devices, the disclosed diagnostic device comprises a novel waveguide system and is suitable for the characterization of electromagnetic material properties such as permittivity, permeability, and the loss tangent of materials over a broad temperature and pressure range.

2. 发明申请

US20180284173A1 DIELECTRIC CONSTANT MEASUREMENT METHOD FOR POWDER IN POWDER-DISPERSED COMPOSITE MATERIAL 审中-公开
公开(公告)号：US20180284173A1
公开(公告)日：2018-10-04
申请号：US15766136
申请日：2016-10-13
申请人： SHIRAISHI KOGYO KAISHA, LTD.
发明人： Jusuke Hidaka , Kizuku Kushimoto
IPC分类号： G01R27/26
CPC分类号： G01N27/221 , G01N2033/0091 , G01R27/2605 , G01R27/2617
摘要： A method for measuring the relative dielectric constant of powder in a powder-dispersed composite material. A composite material is assumed as a cell combination in which unit cells having the same length a in each of an x-axis direction, a y-axis direction, and a z-axis direction are combined together and which has a length l in the x-axis direction, a length m in the y-axis direction, and a length n in the z-axis direction, each of the unit cells of the cell combination is considered to be constituted by a single powder element or a single medium element, the cell combination is created in which the powder element or the medium element is assigned to each of the unit cells in consideration of the number-based median particle diameter D50, the maximum diameter Dmax, the minimum diameter Dmin, and the geometric standard deviation σg.

3. 发明授权

US10073131B2 Apparatus and method for evaluating non-ceramic insulators with conformal probe 有权
公开(公告)号：US10073131B2
公开(公告)日：2018-09-11
申请号：US15067322
申请日：2016-03-11
申请人： ELECTRIC POWER RESEARCH INSTITUTE, INC.
发明人： Andrew John Phillips , J. Mark Major , Robert Carlton Lynch , Lester Ray Harrell
IPC分类号： H01H31/12 , G01R31/12 , G01R27/26 , H01B17/04
CPC分类号： G01R31/1263 , G01R27/2617 , H01B17/04
摘要： An apparatus for evaluating an electrical insulator includes: a frame having a base and a pair of spaced-apart resilient arms each having a distal end; and a flexible probe disposed between the arms, the flexible probe being generally U-shaped and having a pair of distal ends, each distal end of the probe being connected to a respective distal end of one of the arms.

4. 发明申请

US20180156748A1 PORTABLE DEVICE FOR MEASURING DIELECTRIC AND/OR MAGNETIC CHARACTERISTICS OF SAMPLES 审中-公开
公开(公告)号：US20180156748A1
公开(公告)日：2018-06-07
申请号：US15576414
申请日：2016-05-25
申请人： CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) , UNIVERSITE D'AIX MARSEILLE , ECOLE CENTRALE DE MARSEILLE
发明人： Pierre SABOUROUX
IPC分类号： G01N27/22 , G01N27/72
CPC分类号： G01N27/221 , G01N27/72 , G01R27/2617
摘要： A portable device includes first and second connectors capable of guiding an electromagnetic wave, a sample carrier installed between the first premier and second connectors and including a cavity housing a sample, an electronic module including an electromagnetic wave generator, and a processing system capable of analysing the electromagnetic wave exiting the second connector in order to deliver a first dielectric permittivity measurement and/or a second magnetic permeability measurement, a computer device including a control system capable of controlling the operation of the electronic module and of recovering each first or second measurement, and a portable container housing the first and second connectors, the sample carrier, the electronic module and the computer device.

5. 发明申请

US20170122992A1 FILM STRUCTURE AND ITS MEASURING METHOD, DISPLAY SUBSTRATE AND ITS MEASURING METHOD AND MANUFACTURING METHOD 审中-公开
公开(公告)号：US20170122992A1
公开(公告)日：2017-05-04
申请号：US15105594
申请日：2015-09-18
申请人： BOE TECHNOLOGY GROUP CO., LTD.
发明人： Yujun Zhang , Chao Liu
IPC分类号： G01R27/26
CPC分类号： G01R27/2617 , G01D5/24 , G01D5/2405 , G01R27/2605 , G02F1/1309
摘要： A film structure includes a first metal layer, a second metal layer, and an insulation layer located between the first metal layer and the second metal layer. In at least a portion of an edge region of the film structure, the first metal layer extends outwards relative to an edge of the insulation layer by a first predetermined length, and the insulation layer extends outwards relative to an edge of the second metal layer by a second predetermined length. In this way, when the film structure is measured, a fall value between the surface, adjacent to the second metal layer, of the insulation layer and the surface, adjacent to the insulation layer, of the first metal layer is measured by means of a motion trajectory of the measuring probe at the time of ascending or descending, thereby obtaining a more accurate thickness value of the insulation layer.

6. 发明授权

US09535026B2 Electrical capacitance volume tomography sensor for inspection of post-tensioned tendons 有权
标题翻译：用于检查后张力肌腱的电容体积层析成像传感器
公开(公告)号：US09535026B2
公开(公告)日：2017-01-03
申请号：US14564204
申请日：2014-12-09
申请人： Tech4Imaging LLC , Infrastructure Preservation Corporation
发明人： Qussai Marashdeh , Yousef Alghothani , Geoffrey Legg , Bill Seavey , Bradley Hunter
IPC分类号： G01N27/24 , G01R27/26 , G01N27/22
CPC分类号： G01N27/24 , G01N27/226 , G01R27/2617
摘要： The present invention provides a system and apparatus for inspecting tendons and cable stays in bridges and structures using multi-frequency excitation of an ECVT sensor.
摘要翻译：本发明提供一种用于使用ECVT传感器的多频激励来检查桥梁和结构中的腱和电缆支架的系统和装置。

7. 发明授权

US09170288B2 Dielectric elastomer self-sensing using plane approximation 有权
标题翻译：介质弹性体自感应使用平面近似
公开(公告)号：US09170288B2
公开(公告)日：2015-10-27
申请号：US13880336
申请日：2011-10-18
申请人： Benjamin Marc O'Brien , Todd Alan Gisby , Iain Alexander Anderson
发明人： Benjamin Marc O'Brien , Todd Alan Gisby , Iain Alexander Anderson
IPC分类号： H01L41/04 , G01R27/26
CPC分类号： G01R27/2617 , H01L41/042 , H02N2/062
摘要： The present invention provides a method for obtaining feedback parameters related to the state of a dielectric elastomer (DE). The method comprises introducing a small-scale oscillation to the voltage difference between electrodes of the DE, monitoring or repeatedly measuring several measurable electrical characteristics of the DE, deriving other relevant data from the measurements, deriving an equation for a plane of best fit through the relevant data when defined as orthogonal axes, and deriving the feedback parameters from coefficients of the plane equation. The method thus provides important feedback regarding the capacitance, leakage current and/or electrode resistance of the DE. Also disclosed are a computer program and a system adapted to perform the method.
摘要翻译：本发明提供一种获得与介电弹性体（DE）的状态相关的反馈参数的方法。该方法包括向DE的电极之间的电压差引入小规模振荡，监测或重复地测量DE的几个可测量的电特性，从测量中导出其他相关数据，通过该方法得出最佳拟合平面的方程式定义为正交轴的相关数据，以及从平面方程的系数导出反馈参数。因此，该方法提供关于DE的电容，漏电流和/或电极电阻的重要反馈。还公开了一种适于执行该方法的计算机程序和系统。

8. 发明授权

US09035659B2 Apparatus and method for measuring the dissipation factor of an insulator 有权
标题翻译：用于测量绝缘体的耗散因数的装置和方法
公开(公告)号：US09035659B2
公开(公告)日：2015-05-19
申请号：US13806919
申请日：2011-06-22
申请人： Stefano Rolli , Gianpaolo De Robertis , Stefano Serra , Gian Carlo Montanari
发明人： Stefano Rolli , Gianpaolo De Robertis , Stefano Serra , Gian Carlo Montanari
IPC分类号： G01R27/26 , G01R31/12
CPC分类号： G01R27/2694 , G01R27/2617 , G01R31/12
摘要： An apparatus (1) for measuring the loss factor of an insulator (2) for medium or high voltages, equipped with a tap adapter (3) forming a point for picking up an electrical signal (4), comprises a reference capacitor (9) having a first electrode (10), which can be connected to the tap adapter (3), and a second electrode (11); a first voltage detection module (12) operatively connected to the first electrode (10) of the reference capacitor (9) for detecting a signal representative of the voltage applied to the reference capacitor (9); a generator module connected to the first electrode (10) of the reference capacitor (9) in order to inject a direct electric current into the insulator.
摘要翻译：一种用于测量中等或高压的绝缘体（2）的损耗因子的装置（1），其配备有形成用于拾取电信号（4）的点的分接头（3），包括参考电容器（9）具有能够连接到分接头适配器（3）的第一电极（10）和第二电极（11）; 第一电压检测模块（12），可操作地连接到参考电容器（9）的第一电极（10），用于检测代表施加到参考电容器（9）的电压的信号; 连接到参考电容器（9）的第一电极（10）的发生器模块，以便将直流电注入绝缘体。

9. 发明授权

US08994386B2 Method and device for measuring permittivity and/or permeability 有权
标题翻译：测量介电常数和/或渗透率的方法和装置
公开(公告)号：US08994386B2
公开(公告)日：2015-03-31
申请号：US13256294
申请日：2010-03-02
申请人： Ludovic Fourneaud , Laurent Dussopt
发明人： Ludovic Fourneaud , Laurent Dussopt
IPC分类号： G01R27/26 , G01N22/00
CPC分类号： G01R27/2617 , G01N22/00
摘要： The invention relates to a method for measuring the permittivity and/or perviousness of a sample of a nonconductive material, said method comprising: a) measuring a value representative of an admittance Ytestco, b) measuring a value representative of an admittance Ytestcc only from the amplitude and the phase of the electromagnetic waves reflected onto an interface between the sample and the end of a second waveguide having at least one conductive web separated from a conductive sheath by a layer of dielectric material, said second waveguide also including a short circuit between the central web and the sheath at the interface with the sample, and c) calculating the permittivity of the sample from the values representative of the admittances Ytestco and Ytestcc and/or calculating the perviousness of the sample from the values representative of the admittances Ytestco and Ytestcc.
摘要翻译：本发明涉及一种用于测量非导电材料的样品的介电常数和/或渗透性的方法，所述方法包括：a）测量代表导纳Ytestco的值，b）仅测量代表导纳Ytestcc的值，振幅和反射到样品与第二波导的端部之间的界面上的电磁波的相位，该第二波导具有通过介电材料层与导电护套分开的至少一个导电网，所述第二波导还包括在中心网和与样品接口的护套，以及c）从代表导体Ytestco和Ytestcc的值中计算样品的介电常数和/或从代表导体的测试值Ytestco和Ytestcc计算样品的透视度。

10. 发明授权

US07812621B2 Measuring apparatus and method for measuring a surface capacitance of an insulating film 有权
标题翻译：用于测量绝缘膜的表面电容的测量装置和方法
公开(公告)号：US07812621B2
公开(公告)日：2010-10-12
申请号：US12664840
申请日：2008-07-31
申请人： Katsunori Makihara , Seiichi Miyazaki , Seiichiro Higashi
发明人： Katsunori Makihara , Seiichi Miyazaki , Seiichiro Higashi
IPC分类号： G01R27/26 , G01R31/26
CPC分类号： G01R27/2617 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A measuring unit applies a dc voltage causing an inversion layer to be formed on an interface between a semiconductor substrate and an insulating film to the semiconductor substrate while changing a change speed of a level of the dc voltage, and measures a current flowing through the insulating film. An arithmetic unit obtains a straight line showing a relationship between the current flowing through the insulating film and the change speed of the dc voltage on the basis of a relationship between the current measured by the measuring unit and the dc voltage, and calculates a slope of the obtained straight line as surface capacitance of the insulating film. The arithmetic unit calculates permittivity of the insulating film on the basis of the calculated surface capacitance, an area of contact between a probe and the insulating film and a thickness of the insulating film.
摘要翻译：测量单元在改变直流电压电平的变化速度的同时，向半导体衬底施加导致形成在半导体衬底和绝缘膜之间的界面上的反型层的直流电压，并测量流过绝缘体的电流电影。算术单元根据由测量单元测得的电流和直流电压之间的关系，获得表示流过绝缘膜的电流与直流电压的变化速度之间的关系的直线，并且计算斜率所获得的直线作为绝缘膜的表面电容。算术单元根据计算出的表面电容，探针和绝缘膜之间的接触面积和绝缘膜的厚度来计算绝缘膜的介电常数。

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