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    • 4. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06785172B2
    • 2004-08-31
    • US10325931
    • 2002-12-23
    • Yoshiki Kobayashi
    • Yoshiki Kobayashi
    • G11C700
    • G11C29/32G11C2029/3202G11C2207/104
    • In a semiconductor memory device according to the present invention, which allows a memory cell array unit and a memory circuit internal logic unit to be tested independently of each other, a first test circuit unit TCi1 to which an address signal a″, a scan-in signal SIN, a scan select signal SS and a shift clock signal SCLK are input, outputs an address signal a′″ and a scan-out signal SiOUT1. The address signal a′″ is input to the memory cell array unit MCA and a column selector CS, whereas the scan-out signal SiOUT1 is input to a second test circuit unit TCi2. The second test circuit unit TCi2, to which the scan-out signal SiOUT1, the scan select signal SS, a write control signal WCTRL and a scan clock signal SCLK are input, outputs at a scan-out signal SOUT. The first test circuit unit and the second test circuit unit each achieve a parallel/serial conversion function.
    • 在根据本发明的半导体存储器件中,允许独立地测试存储单元阵列单元和存储器电路内部逻辑单元的第一测试电路单元TCi1,地址信号a“,扫描 输入信号SIN,扫描选择信号SS和移位时钟信号SCLK,输出地址信号a“和扫描输出信号SiOUT1。 地址信号a“”被输入到存储单元阵列单元MCA和列选择器CS,而扫描输出信号SiOUT1被输入到第二测试电路单元TCi2。 扫描输出信号SiOUT1,扫描选择信号SS,写控制信号WCTRL和扫描时钟信号SCLK被输入的第二测试电路单元TCi2以扫描输出信号SOUT输出。 第一测试电路单元和第二测试电路单元各自实现并行/串行转换功能。
    • 8. 发明申请
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US20060048029A1
    • 2006-03-02
    • US11206948
    • 2005-08-19
    • Yoshiki Kobayashi
    • Yoshiki Kobayashi
    • G01R31/28
    • G01R31/318572
    • The number of S-FFs in a scan-path is decreased by half and a test time needed is decreased. An I/O terminal 1A is connected to a scan-path 31-3m and a combination circuit 2 via a selector 5A and an output of the scan-path 31-3m is connected to an I/O terminal 1B via a selector 6A and a tri-state buffer 7A. The I/O terminal 1B is connected to a scan-path 3m+1-3n and to the combination circuit 2 via a selector 5B and the output of the scan-path 3m+1-3n is connected to the I/O terminal 1A via a selector 6B and tri-state buffer 7B. When testing, the tri-state buffers are turned off and test-data are supplied by connecting the I/O terminal 1A, 1B to the scan-path 31-3m, 3m+1-3n respectively. Thereafter, output signals of the combination circuit is applied to each S-FF 3, and the test data are read out from the I/O terminal 1A, 1B by turning on the each tri-state buffer 7A, 7B.
    • 扫描路径中的S-FF的数量减少一半,所需的测试时间减少。 I / O端子1A通过选择器5A连接到扫描路径3&lt; 1&gt;&lt; 3&gt;和组合电路2, 路径3通过选择器6A和三态缓冲器7A将I / O端子1B连接到I / O端子1B。I / O端子1 B通过选择器5B连接到扫描路径3&lt; m + 1&gt; - &lt; N&gt;和组合电路2,并且扫描路径3的输出< 通过选择器6B和三态缓冲器7B连接到I / O端子1A。当测试时,三态缓冲器 被关闭,并且通过将I / O端子1A,1B连接到扫描路径3 3 3, 分别为m + 1 + 3 。 此后,组合电路的输出信号被施加到每个S-FF 3,并且通过接通每个三态缓冲器7A,7B从I / O端子1A,1B读出测试数据。
    • 9. 发明授权
    • Processing unit for a computer and a computer system incorporating such a processing unit
    • 用于计算机的处理单元和包含这种处理单元的计算机系统
    • US06216236B1
    • 2001-04-10
    • US09188903
    • 1998-11-10
    • Takeshi MiyaoManabu AraokaTomoaki NakamuraMasayuki TanjiShigenori KanekoKoji MasuiSaburou IijimaNobuyasu KanekawaShinichiro KanekawaYoshiki KobayashiHiroaki FukumaruKatsunori Tagiri
    • Takeshi MiyaoManabu AraokaTomoaki NakamuraMasayuki TanjiShigenori KanekoKoji MasuiSaburou IijimaNobuyasu KanekawaShinichiro KanekawaYoshiki KobayashiHiroaki FukumaruKatsunori Tagiri
    • G06F1134
    • G06F11/187G06F11/1064G06F11/141G06F11/1604G06F11/1641G06F11/1666G06F11/1679G06F11/18G06F11/181G06F11/184G06F11/185G06F11/20G06F11/2007G06F11/2028G06F11/203G06F11/2035G06F11/2043G06F12/0833G11C29/74
    • A computer system has a plurality of processing units (2-1,2-2,2-n) connected via one or more system buses (1-1,1-2). Each processing unit (2-1,2-2,2-n) has three or more processors (20-1,20-2,20-3) on a common support board (PL) and controlled by a common clock unit (1000). The three processors (20-1,20-2,20-3) perform the same operation and a fault in a processor (20-1,20-2, 20-3) is detected by comparison of the operations of the three processors (20-1,20-2,20-3). If one processor (20-1,20-2,20-3) fails, the operation can continue in the other two processors (20-1,20-2,20-3) of the processing unit (2-1,2-2,2-n), at least temporarily, before replacement of the entire processing unit (2-1,2-2, 2-n). Furthermore, the processing unit (2-1,2-2,2-n) may have a plurality of clocks (A,B) within the clock unit (1000), with a switching arrangement so that the processors (20-1,20-2,20-n) normally receive clock pulses from a main clock (A), but receive pulses from an auxiliary clock (B) if the main clock (A) fails. Switching between the main and auxiliary clock (A,B) involves comparison of the pulse duration from the clocks (A,B). Additionally, a plurality of cache memories (220,221) may be connected in common to the processors (20-1,20-2,20-3), so that failure of one cache memory (220,221) permits the processing unit (2-1,2-2,2-n) to continue to operate using the other cache memory (220,221). Coherence of the contents of the cache memories (220,221) may be achieved by direct comparison, and a comparison method can also be used to invalidate data in an internal cache memory (2020-1,2020-2,2020-3) of a processor (20-1,20-2,20-3) which differs from that in the external cache memory (220,221). Coherence of protocols may also ensure that data in caches (220,221) of the different processor units (2-1,2-2,2-n) are always correct.
    • 计算机系统具有经由一个或多个系统总线(1-1,1-2)连接的多个处理单元(2-1,2-2,2-n)。 每个处理单元(2-1,2-2,2-n)在公共支撑板(PL)上具有三个或更多个处理器(20-1,20-2,20-3),并由公共时钟单元 1000)。 三个处理器(20-1,20-2,20-3)执行相同的操作,并且通过比较三个处理器(20-1,20-2,20-3)的操作来检测处理器(20-1,20-2,20-3)中的故障 (20-1,20-2,20-3)。 如果一个处理器(20-1,20-2,20-3)失败,则可以在处理单元的其他两个处理器(20-1,20-2,20-3)中继续操作(2-1,2 -2,2-n),至少暂时在更换整个处理单元(2-1,2-2,2-n)之前。 此外,处理单元(2-1,2-2,2-n)可以在时钟单元(1000)内具有多个时钟(A,B),具有切换装置,使得处理器(20-1, 20-2,20-n)通常从主时钟(A)接收时钟脉冲,但是如果主时钟(A)发生故障,则从辅助时钟(B)接收脉冲。 在主时钟和辅助时钟(A,B)之间切换涉及从时钟(A,B)的脉冲持续时间的比较。 另外,多个高速缓冲存储器(220,221)可以共同地连接到处理器(20-1,20-2,20-3),使得一个高速缓冲存储器(220,221)的故障允许处理单元(2-1 ,2