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    • 2. 发明授权
    • System and method for improved LBIST power and run time
    • 改善LBIST功率和运行时间的系统和方法
    • US07716546B2
    • 2010-05-11
    • US11866787
    • 2007-10-03
    • Hien Minh LeRobert Christopher DixonLuis Carlos MedinaTung Nguyen Pham
    • Hien Minh LeRobert Christopher DixonLuis Carlos MedinaTung Nguyen Pham
    • G01R31/28G06F11/00
    • G06F11/27
    • A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets.A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.
    • 一种用于改进逻辑内置自检(LBIST)的方法包括:由LBIST控制器将多个控制信号组提供给包括多个LBIST卫星模块的LBIST域。 多个LBIST卫星模块中的每一个接收多个控制信号组中的一个。 LBIST控制器通过多个控制信号组来交织每个LBIST卫星模块的LBIST信道扫描和LBIST序列操作。 测试系统包括包括多个LBIST卫星模块的逻辑内置自测(LBIST)域。 LBIST控制器耦合到LBIST域并向LBIST域提供多个控制信号组,其中多个LBIST卫星模块中的每一个接收多个控制信号组中的一个。 LBIST控制器通过多个控制信号组来交织每个LBIST卫星模块的LBIST信道扫描操作。
    • 3. 发明申请
    • System and Method for Improved LBIST Power and Run Time
    • 改进LBIST功率和运行时间的系统和方法
    • US20090094496A1
    • 2009-04-09
    • US11866787
    • 2007-10-03
    • Hien Minh LeRobert Christopher DixonLuis Carlos MedinaTung Nguyen Pham
    • Hien Minh LeRobert Christopher DixonLuis Carlos MedinaTung Nguyen Pham
    • G06F11/25
    • G06F11/27
    • A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets.A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.
    • 一种用于改进逻辑内置自检(LBIST)的方法包括:由LBIST控制器将多个控制信号组提供给包括多个LBIST卫星模块的LBIST域。 多个LBIST卫星模块中的每一个接收多个控制信号组中的一个。 LBIST控制器通过多个控制信号组来交织每个LBIST卫星模块的LBIST信道扫描和LBIST序列操作。 测试系统包括包括多个LBIST卫星模块的逻辑内置自测(LBIST)域。 LBIST控制器耦合到LBIST域并向LBIST域提供多个控制信号组,其中多个LBIST卫星模块中的每一个接收多个控制信号组中的一个。 LBIST控制器通过多个控制信号组来交织每个LBIST卫星模块的LBIST信道扫描操作。
    • 4. 发明授权
    • Signal identification method and apparatus for analogue electrical systems
    • 模拟电气系统的信号识别方法和装置
    • US07266463B2
    • 2007-09-04
    • US11126120
    • 2005-05-10
    • Robert Christopher DixonJohn Wayne HartfielHein Minh LeTung Nguyen Pham
    • Robert Christopher DixonJohn Wayne HartfielHein Minh LeTung Nguyen Pham
    • G01R19/00
    • G01R31/3167G01R31/31924
    • An apparatus, a method, and a computer program product are provided for identifying signals in analogue electrical systems. The ID select signals that control the timing of this signal identification circuit comprise sequential numbers that count up and identify a corresponding signal. The signals to be identified are located on a group of input/output (I/O) pins. One multiplexer (first) selects a specific I/O pin in response to the ID select signals. An isolated voltage source is connected to this multiplexer and provides the selected signal to another multiplexer (second). The second multiplexer switches from this isolated voltage source to ground potential in response to the ID select signals. The isolated voltage source floats at the DC level of the selected I/O driver pin. Therefore, by connecting to the selected signal's I/O pin and the output of the second multiplexer, the selected signal can be identified and then probed.
    • 提供了用于识别模拟电气系统中的信号的装置,方法和计算机程序产品。 控制该信号识别电路的定时的ID选择信号包括向上计数并识别相应信号的顺序号码。 要识别的信号位于一组输入/输出(I / O)引脚上。 一个多路复用器(第一)响应于ID选择信号选择一个特定的I / O引脚。 隔离电压源连接到该多路复用器,并将所选择的信号提供给另一个多路复用器(第二)。 响应于ID选择信号,第二多路复用器从该隔离电压源切换到接地电位。 隔离电压源浮动在所选I / O驱动器引脚的直流电平上。 因此,通过连接到所选信号的I / O引脚和第二多路复用器的输出,可以识别所选择的信号,然后探测。