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1. 发明申请

US20100181791A1 APPARATUS FOR AUTOMATED POSITIONING OF EDDY CURRENT TEST PROBE 有权
标题翻译： EDDY电流测试探头的自动定位装置
公开(公告)号：US20100181791A1
公开(公告)日：2010-07-22
申请号：US12687261
申请日：2010-01-14
申请人： Thomas O'Dell
发明人： Thomas O'Dell
IPC分类号： B25J5/00 , B66C1/54 , B25J11/00 , B25J9/00
CPC分类号： B66C1/54 , F22B37/005 , F22B37/006 , G01D11/30 , G01M5/0025 , G01M5/0033 , G01M5/0091 , G01N27/902 , Y10T29/5199
摘要： An apparatus for automated inspection and repair of a tube sheet. The apparatus has a rotating gripper pod, comprising at least one tube gripper, a sliding body portion containing the gripper pod; a housing portion comprising at least one tube gripper and a tool head coupling. The tool head coupling swapably attaches to a eddy current test probe and at least one kind of tube repair tool. Novel, auto-locking tube grippers are also disclosed. A serial bus connects electronic modules within the apparatus and also connects the apparatus to an external controller.
摘要翻译：一种用于管板自动检查和修理的装置。该装置具有旋转夹持器盒，其包括至少一个管夹持器，容纳夹持器盒的滑动体部分; 壳体部分，其包括至少一个管夹持器和工具头联接件。刀头联轴器可互换地连接到涡流测试探头和至少一种管修复工具。还公开了一种新型的自锁式管夹。串行总线连接设备内的电子模块，并将设备连接到外部控制器。

2. 发明申请

US20060181697A1 Circularly polarized light for optically inspecting workpieces 审中-公开
标题翻译：用于光学检查工件的圆偏振光
公开(公告)号：US20060181697A1
公开(公告)日：2006-08-17
申请号：US11112909
申请日：2005-04-22
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： G01N21/88
CPC分类号： G01N21/89 , G01N21/21
摘要： A method and apparatus for inspecting substrates in which a laser beam traces a path along the substrate surface. The laser beam is circularly polarized, e.g. by a quarter wave retarder. This permits inspecting the substrate with less sensitivity to scratch direction than if the laser beam were not circularly polarized.
摘要翻译：一种用于检查基板的方法和装置，其中激光束沿着基板表面沿着路径。激光束是圆偏振的。通过四分之一波长延迟器。这样就可以比没有圆偏振的激光束对刮擦方向的灵敏度更低的检测基板。

3. 发明申请

US20060153492A1 Test head for optically inspecting workpieces 有权
标题翻译：用于光学检查工件的测试头
公开(公告)号：US20060153492A1
公开(公告)日：2006-07-13
申请号：US11112172
申请日：2005-04-22
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： G02B6/12
CPC分类号： G01N21/47 , G01N21/8806 , G01N21/95 , G01N21/9501 , G01N21/9506 , G11B5/8404
摘要： An optical test head comprises a block of material with a plurality of optical paths extending therethrough. At least one of the optical paths is an input optical path for receiving laser light and holding a lens for focusing the laser light on a workpiece that is proximate the head. At least another of the optical paths is an output path for receiving light that is reflected off of the workpiece and providing that light to a detector. (In one embodiment, several detectors are provided to direct specularly reflected light, narrow angle scattered light, wide angle scattered light and back scattered light to associated detectors.) Other optical elements can be affixed within or to the block of material. The test head can be used without requiring the individual optical elements to be aligned or adjusted.
摘要翻译：光学测试头包括具有延伸穿过其中的多个光路的材料块。光路中的至少一个是用于接收激光并保持用于将激光聚焦在靠近头部的工件上的透镜的输入光路。至少另一个光路是用于接收从工件反射并将光提供给检测器的光的输出路径。（在一个实施例中，提供了几个检测器以将镜面反射光，窄角度散射光，广角散射光和背散射光引导到相关联的检测器。）其他光学元件可以固定在材料块内或附着到材料块中。可以使用测试头，而不需要对对准或调整各个光学元件。

4. 发明申请

US20060152714A1 Test head for optically inspecting workpieces 有权
标题翻译：用于光学检查工件的测试头
公开(公告)号：US20060152714A1
公开(公告)日：2006-07-13
申请号：US11113258
申请日：2005-04-23
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： G01N21/88
CPC分类号： G01N21/94 , G01N21/21 , G01N21/55 , G01N21/9506 , G01N2021/8411
摘要： An optical test apparatus comprises a first: a) a motor that rotates a spindle which in turn rotates a workpiece such as a magnetic disk substrate; b) an upper test head comprising a laser for providing an upper laser beam to the upper surface of the workpiece, an upper lens for receiving light reflected from the upper surface, and an upper detector for generating an electrical signal indicative of the received light; and c) a lower test head comprising a lower laser providing a laser beam to the lower surface of the workpiece, a lower lens for receiving light reflected from the lower surface and a lower detector for generating an electrical signal indicative of the received light. The path of the lower laser beam is displaced from a radial direction of the workpiece in a manner that permits the lower lens to be placed closer to the laser spot than if the lower laser beam was not displaced.
摘要翻译：一种光学测试装置，包括：第一：a）旋转主轴的电动机，该主轴又使诸如磁盘基板的工件旋转; b）上测试头，包括用于向工件的上表面提供上激光束的激光器，用于接收从上表面反射的光的上透镜和用于产生指示所接收的光的电信号的上检测器; 以及c）下测试头，其包括向工件的下表面提供激光束的下激光器，用于接收从下表面反射的光的下透镜和用于产生指示接收光的电信号的下检测器。下激光束的路径从工件的径向位移，使得下透镜放置得比激光光束更靠近激光光束，而不是下位激光束被移动。

5. 发明授权

US5595768A Laser disk texturing apparatus 失效
标题翻译：激光盘纹理装置
公开(公告)号：US5595768A
公开(公告)日：1997-01-21
申请号：US552185
申请日：1995-11-02
申请人： David Treves , Hong Fu , Thomas O'Dell
发明人： David Treves , Hong Fu , Thomas O'Dell
IPC分类号： B23K26/00 , B23K26/38 , G11B5/84
CPC分类号： G11B5/8404 , Y10S425/81
摘要： Reflection of a generated radiation beam (e.g., laser) from a disk substrate during radiation-induced texturing such that the reflection interferes with the generated radiation beam is eliminated as follows: the beam path of the laser beam is passed through focusing optics to focus the beam to a spot on the substrate surface; the beam path is offset from the center of the focusing optics so that the focusing optics bend the beam path, and further so that the beam is angled from normal to the surface of the disk, for example by between 2 and 5 degrees; and that portion of the beam reflected by the disk surface is blocked by appropriate means prior to its impinging upon the source of the generated radiation beam.
摘要翻译：在辐射引起的纹理化期间从盘基底产生的辐射束（例如，激光）的反射消除如下：激光束的光束路径通过聚焦光学元件聚焦光束到基板表面上的一个点; 光束路径偏离聚焦光学器件的中心，使得聚焦光学器件弯曲光束路径，并且进一步使得光束从法向盘的表面成角度，例如在2度和5度之间; 并且由光盘表面反射的光束的该部分在其撞击所产生的辐射束的光源之前被适当的装置阻挡。

6. 发明授权

US5948288A Laser disk texturing apparatus 失效
标题翻译：激光盘纹理装置
公开(公告)号：US5948288A
公开(公告)日：1999-09-07
申请号：US654452
申请日：1996-05-28
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： B23K26/067 , B23K26/08 , G11B5/82 , G11B5/84
CPC分类号： G11B5/8404 , B23K26/0619 , B23K26/067 , B23K26/0823 , G11B5/82
摘要： Formation of laser texture features simultaneously on the target surfaces of each side of magnetic recording disk is facilitated by optical and mechanical components permitting excellent balance of optical power between each target surface, excellent matching of the radial position of laser texture features between each target surface, and excellent focusing of laser beams on each target surface. Polarization of the source laser beam may be used to controllably balance and direct a single source beam into individual beam paths for each target surface. Handling, automation complexity, and manufacturing time is thereby reduced.
摘要翻译：通过光学和机械部件，在每个目标表面之间的光学功率的平衡良好，每个目标表面之间的激光纹理特征的径向位置的优异匹配，可以在磁记录盘的每一侧的目标表面上同时形成激光纹理特征，并且激光束在每个目标表面上的优异聚焦。源激光束的极化可以用于可控地平衡并将单个源光束引导到每个目标表面的各个光束路径中。从而减少处理，自动化复杂性和制造时间。

7. 发明授权

US08746089B2 Apparatus for automated positioning of eddy current test probe 有权
标题翻译：用于涡流探头自动定位的装置
公开(公告)号：US08746089B2
公开(公告)日：2014-06-10
申请号：US12687261
申请日：2010-01-14
申请人： Thomas O'Dell
发明人： Thomas O'Dell
IPC分类号： F22B37/10 , B25J11/00 , B25J15/00 , G01M99/00
CPC分类号： B66C1/54 , F22B37/005 , F22B37/006 , G01D11/30 , G01M5/0025 , G01M5/0033 , G01M5/0091 , G01N27/902 , Y10T29/5199
摘要： An apparatus for automated inspection and repair of a tube sheet. The apparatus has a rotating gripper pod, comprising at least one tube gripper, a sliding body portion containing the gripper pod; a housing portion comprising at least one tube gripper and a tool head coupling. The tool head coupling swapably attaches to a eddy current test probe and at least one kind of tube repair tool. Novel, auto-locking tube grippers are also disclosed. A serial bus connects electronic modules within the apparatus and also connects the apparatus to an external controller.
摘要翻译：一种用于管板自动检查和修理的装置。该装置具有旋转夹持器盒，其包括至少一个管夹持器，容纳夹持器盒的滑动体部分; 壳体部分，其包括至少一个管夹持器和工具头联接件。刀头联轴器可互换地连接到涡流测试探头和至少一种管修复工具。还公开了一种新型的自锁式管夹。串行总线连接设备内的电子模块，并将设备连接到外部控制器。

8. 发明申请

US20060153525A1 Robotic system for optically inspecting workpieces 有权
标题翻译：用于光学检查工件的机器人系统
公开(公告)号：US20060153525A1
公开(公告)日：2006-07-13
申请号：US11112190
申请日：2005-04-22
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： H04N5/91
CPC分类号： G05B19/41875 , G01N21/9506 , G05B2219/32218 , Y02P90/22 , Y02P90/28
摘要： A manufacturing cell for inspecting workpieces such as magnetic disk substrates comprises an input conveyor for providing workpieces to be tested, one or more testers for inspecting the workpieces, and three or more output receptacles for receiving tested workpieces. One or more robotic arms move the workpieces from the input conveyor to the tester and from the tester to one of the output receptacles depending upon the results of the test performed by the tester. The output receptacles include a pass receptacle, a reject receptacle, and at least an additional receptacle for workpieces that are to be re-worked or studied further. If the additional receptacle is full, workpieces that would otherwise be provided to the additional bin are placed in the reject receptacle. The reject receptacle is very large, so that it is rarely filled to capacity, and it is rarely necessary to shut down the manufacturing cell to replace the reject receptacle.
摘要翻译：用于检查诸如磁盘基板的工件的制造单元包括用于提供待测试的工件的输入输送机，用于检查工件的一个或多个测试器以及用于接收测试的工件的三个或更多个输出插座。根据测试仪进行的测试结果，一个或多个机器人手臂将工件从输入输送机移动到测试仪，并从测试仪移动到输出容器之一。输出插座包括通孔插座，拒收容器，以及用于进一步重新加工或研究的工件的至少一个附加插座。如果附加的容器已满，则否则将提供给附加箱的工件放置在废品容器中。废料容器非常大，因此很少装满容量，很少需要关闭制造单元以更换废品容器。

9. 发明申请

US20060153440A1 Test head for optically inspecting workpieces 有权
标题翻译：用于光学检查工件的测试头
公开(公告)号：US20060153440A1
公开(公告)日：2006-07-13
申请号：US11112536
申请日：2005-04-22
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： G06K9/00 , G01N21/88
CPC分类号： G01N21/8901 , G01N21/9506
摘要： Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for detecting reflected laser light. The directions of the laser beams are selected so as to reduce or prevent cross-talk interference between the upper and lower test heads.
摘要翻译：用于同时光学检查工件的顶表面和底表面的装置包括上和下测试头，每个头包括至少一个激光器，用于提供扫描其相关联的工件表面的激光束和用于检测反射激光的至少一个检测器。选择激光束的方向以减少或防止上下测试头之间的串扰干扰。

10. 发明申请

US20060181698A1 Method and apparatus for selectively providing data from a test head to a processor 有权
标题翻译：用于从测试头向处理器选择性地提供数据的方法和装置
公开(公告)号：US20060181698A1
公开(公告)日：2006-08-17
申请号：US11113260
申请日：2005-04-23
申请人： David Treves , Thomas O'Dell
发明人： David Treves , Thomas O'Dell
IPC分类号： G01N21/88
CPC分类号： G01N21/8851
摘要： An optical test head comprises one or more detectors for providing output signals indicative of the condition of a workpiece surface. Data from these detectors are stored in one or more memories only when the data from the detectors satisfy one or more conditions (e.g. the data exceed than a particular threshold). The data are then passed from the one or more memories to an electrical circuit for processing. In addition, location information is stored in one or more memories and passed on to the electrical circuit when the data from the detectors satisfy the one or more conditions.
摘要翻译：光学测试头包括一个或多个检测器，用于提供表示工件表面状态的输出信号。只有当来自检测器的数据满足一个或多个条件（例如数据超过特定阈值）时，来自这些检测器的数据才被存储在一个或多个存储器中。然后将数据从一个或多个存储器传递到用于处理的电路。此外，当来自检测器的数据满足一个或多个条件时，位置信息被存储在一个或多个存储器中并被传递到电路。

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