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1. 发明授权

US08670117B2 Inspection apparatus 有权
标题翻译：检验仪器
公开(公告)号：US08670117B2
公开(公告)日：2014-03-11
申请号：US13295707
申请日：2011-11-14
申请人： Jong-Kyu Hong , Monn-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
发明人： Jong-Kyu Hong , Monn-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/956 , G01N2021/8829 , G01N2021/95638
摘要： An inspection apparatus includes a work stage part, an optical module, and an optical module moving part. The work stage part receives a board. The work stage part includes work stages disposed in parallel. The optical module includes a projecting part disposed over the board, an image capturing part disposed at a side portion of the projecting part to receive the grating pattern light and capture a reflection image, and an optical path changing part changing a path of the grating pattern light and guiding the grating pattern light to the image capturing part so that the grating pattern light is downwardly incident into the image capturing part. The optical module moving part is disposed over and coupled to the optical module to move the optical module. Thus, time may be reduced and a space may be secured, required for inspecting a board.
摘要翻译：检查装置包括工作台部件，光学部件和光学部件移动部件。工作阶段部分收到董事会。工作台部分包括平行布置的工作台。光学模块包括设置在板上的突出部分，设置在突出部分的侧部处以接收光栅图案光并捕获反射图像的图像捕获部分，以及改变光栅图案的路径的光路改变部分光并且将光栅图案光引导到图像捕获部分，使得光栅图案光向下入射到图像捕获部分中。光学模块移动部件设置在光学模块上并耦合到光学模块以移动光学模块。因此，可以减少时间并且可以确保检查板所需的空间。

2. 发明申请

US20080071409A1 HANDLER 审中-公开
标题翻译：处理器
公开(公告)号：US20080071409A1
公开(公告)日：2008-03-20
申请号：US11857712
申请日：2007-09-19
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： H01L21/68
CPC分类号： G01R31/2893 , G01R31/2867
摘要： A handler is provided, including a chamber in which to-be-tested packaged chips contained in a test tray are connected to sockets of a test board, an exchanging unit exchanging the test trays with the chamber; a transferring unit transferring the test tray containing the to-be-tested packaged chips from the exchanging unit to the chamber, and transferring the test tray containing tested packaged chips from the chamber to the exchanging unit, a picker removing the tested packaged chips from the test tray staying in the exchanging unit and putting the to-be-tested packaged chips into the test tray staying in the exchanging unit; and an inserting unit including a pusher pushing the test tray to connect the to-be-tested packaged chips to the sockets of the test board, a pusher driving unit driving the pusher, a sensor sensing an amount of pressure applied by the pusher to the test tray; and a controller controlling the pusher driving unit to enable the pusher to apply a proper amount of pressure to the test tray.
摘要翻译：提供处理器，包括一个室，其中容纳在测试托盘中的待测试的封装芯片连接到测试板的插座，交换单元将测试托盘与腔室交换; 传送单元，将包含要被测试的包装芯片的测试托盘从所述更换单元传送到所述室，以及将包含经测试的封装芯片的测试托盘从所述室传送到所述交换单元;拾取器，将测试的封装芯片从测试托盘停留在更换单元中，并将待测试的包装的芯片放入留在更换单元中的测试托盘中; 以及插入单元，其包括推动所述测试托盘以将待测试的封装芯片连接到所述测试板的插座的推动器，驱动所述推动器的推动器驱动单元，感测由所述推动器施加的压力的传感器试纸盘以及控制器，其控制所述推动器驱动单元以使所述推动器能够向所述测试托盘施加适当的压力。

3. 发明申请

US20120127463A1 INSPECTION APPARATUS 有权
标题翻译：检查装置
公开(公告)号：US20120127463A1
公开(公告)日：2012-05-24
申请号：US13295707
申请日：2011-11-14
申请人： Jong-Kyu Hong , Monn-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
发明人： Jong-Kyu Hong , Monn-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/956 , G01N2021/8829 , G01N2021/95638
摘要： An inspection apparatus includes a work stage part, an optical module, and an optical module moving part. The work stage part receives a board. The work stage part includes work stages disposed in parallel. The optical module includes a projecting part disposed over the board, an image capturing part disposed at a side portion of the projecting part to receive the grating pattern light and capture a reflection image, and an optical path changing part changing a path of the grating pattern light and guiding the grating pattern light to the image capturing part so that the grating pattern light is downwardly incident into the image capturing part. The optical module moving part is disposed over and coupled to the optical module to move the optical module. Thus, time may be reduced and a space may be secured, required for inspecting a board.
摘要翻译：检查装置包括工作台部件，光学部件和光学部件移动部件。工作阶段部分收到董事会。工作台部分包括平行布置的工作台。光学模块包括设置在板上的突出部分，设置在突出部分的侧部处以接收光栅图案光并捕获反射图像的图像捕获部分，以及改变光栅图案的路径的光路改变部分光并且将光栅图案光引导到图像捕获部分，使得光栅图案光向下入射到图像捕获部分中。光学模块移动部件设置在光学模块上并耦合到光学模块以移动光学模块。因此，可以减少时间并且可以确保检查板所需的空间。

4. 发明申请

US20110050893A1 APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE 有权
标题翻译：用于测量三维形状的装置和方法
公开(公告)号：US20110050893A1
公开(公告)日：2011-03-03
申请号：US12919691
申请日：2009-02-25
申请人： Seung-Jun Lee , Kwang-Ill Kho , Moon-Young Jeon , Sang-Kyu Yun , Hong-Min Kim , Jung Hur
发明人： Seung-Jun Lee , Kwang-Ill Kho , Moon-Young Jeon , Sang-Kyu Yun , Hong-Min Kim , Jung Hur
IPC分类号： H04N7/18
CPC分类号： G01B11/2513 , G01B11/245 , G02B27/40 , H04N5/247
摘要： Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
摘要翻译：提供了一种以提高的精度测量三维形状的装置和方法。该装置包括舞台，至少一个照明单元，多个摄像单元和控制单元。舞台支持要测量的对象。照明单元包括光源和栅格，并且将栅格图案的光辐射到待测量的对象。图像拾取单元在不同方向捕获从待测对象反射的网格图像。控制单元从由摄像单元拍摄的网格图像计算物体的三维形状。本发明通过主要图像拾取部分和子图像拾取部分捕获网格图像具有能够以快速和准确的方式测量对象的三维形状的优点。

5. 发明申请

US20110001818A1 THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS 有权
标题翻译：三维尺寸测量装置
公开(公告)号：US20110001818A1
公开(公告)日：2011-01-06
申请号：US12828615
申请日：2010-07-01
申请人： Jung HUR , Moon-Young JEON , Hong-Min KIM , Sang-Kyu YUN , Jong-Kyu HONG
发明人： Jung HUR , Moon-Young JEON , Hong-Min KIM , Sang-Kyu YUN , Jong-Kyu HONG
IPC分类号： H04N7/18 , G01B11/24
CPC分类号： G01B11/2531 , G01N21/8806 , G01N2021/8829
摘要： A three dimensional shape measurement apparatus includes an illumination section and a grating transfer unit. The illumination section includes a light source unit generating a light and a grating unit changing the light generated by the light source unit into a grating pattern light having a grating pattern. The illumination section illuminates the grating pattern light onto a measurement target in a predetermined direction. The grating transfer unit transfers the grating unit in a predetermined inclination direction with respect to an extension direction of the grating pattern and an arrangement direction of the grating pattern. Thus, manufacturing cost may be reduced, and the three dimensional shape measurement apparatus may be easily managed.
摘要翻译：三维形状测量装置包括照明部分和光栅传送单元。照明部分包括产生光的光源单元和将由光源单元产生的光改变为具有光栅图案的光栅图案光的光栅单元。照明部将规定方向的光栅图案光照射到测定对象物上。光栅传送单元相对于光栅图案的延伸方向和光栅图案的布置方向以预定的倾斜方向传送光栅单元。因此，可以降低制造成本，并且可以容易地管理三维形状测量装置。

6. 发明申请

US20060122109A1 Composition for preventing the formation of new scar comprising bmp-7 审中-公开
标题翻译：用于防止形成包含bmp-7的新疤痕的组合物
公开(公告)号：US20060122109A1
公开(公告)日：2006-06-08
申请号：US10534590
申请日：2003-07-04
申请人： Yang Cho , In Lee , Jung Hur , Bo Young Ahn , Won Yoo
发明人： Yang Cho , In Lee , Jung Hur , Bo Young Ahn , Won Yoo
IPC分类号： A61K38/17
CPC分类号： A61K38/1875
摘要： Composition for preventing the formation of new scar, e.g. myofibroblast, having BMP-7 polypeptide is disclosed. The composition for preventing the formation of scar includes an effective amount of BMP-7 (Bone Morphogenic Protein-7) polypeptide of sequence 1. The effective amount is 50 ng/ml-50 μg/ml or 0.1 ng-1 μg/kg by weight and the scar is a corneal scar.
摘要翻译：用于防止形成新瘢痕的组合物，例如公开了具有BMP-7多肽的肌成纤维细胞。用于防止形成瘢痕的组合物包括有效量的序列1的BMP-7（骨形态发生蛋白-7）多肽。有效量为50ng / ml-50ug / ml或0.1ng-1μg/ kg，重量和疤痕是角膜瘢痕。

7. 发明授权

US09046498B2 Board inspection apparatus using multiple cameras 有权
标题翻译：使用多台摄像机的电路板检查装置
公开(公告)号：US09046498B2
公开(公告)日：2015-06-02
申请号：US13522673
申请日：2011-01-18
申请人： Jong-Kyu Hong , Moon-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
发明人： Jong-Kyu Hong , Moon-Young Jeon , Hong-Min Kim , Jung Hur , Sang-Kyu Yun
IPC分类号： H04N7/18 , G01N21/95
CPC分类号： G01N21/9501
摘要： An apparatus for inspecting a board is shown. The board inspection apparatus includes at least one illuminating module, an imaging lens, a first beam splitter, a first camera, and a second camera. The illuminating module provides light to an inspection board and the imaging lens transmits a light reflected from the inspection board. The first beam splitter transmits a portion of the light transmitted from the imaging lens and reflects the rest of the transmitted light. The first camera image-captures by receiving the light that transmits the first beam, and the second camera image-captures by receiving the light reflected from the first beam splitter. Therefore, by using one imaging lens to inspect the inspection board, the decrease in accuracy caused by the different optical axis or magnification may be prevented.
摘要翻译：示出了用于检查电路板的装置。板检查装置包括至少一个照明模块，成像透镜，第一分束器，第一照相机和第二照相机。照明模块向检查板提供光，并且成像透镜透射从检查板反射的光。第一分束器透射从成像透镜传输的光的一部分并反射透射光的其余部分。通过接收透射第一光束的光来捕获第一相机图像，并且通过接收从第一分束器反射的光来捕获第二相机图像。因此，通过使用一个成像透镜检查检查板，可以防止由不同的光轴或放大率引起的精度的降低。

8. 发明申请

US20080075574A1 PICKER AND HEAD ASSEMBLY WITH THE PICKERS 审中-公开
标题翻译：拍摄者和头部大会与拍摄者
公开(公告)号：US20080075574A1
公开(公告)日：2008-03-27
申请号：US11858531
申请日：2007-09-20
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： B65G1/04
CPC分类号： H05K13/0409 , H05K13/041 , H05K13/0413
摘要： Provided is a picker for transferring packaged chips, including a picker base, a base block fixably connected to the picker base, a plurality of nozzle assemblies, provided to the base block, each nozzle assembly being movable up and down, and having a nozzle which a packaged chip is held against or released from by air pressure, an air pressure supplying unit supplying negative or positive pressure by which the packaged chip is held against or released from the nozzle, a plurality of first mechanisms, through each of which the negative or positive pressure is supplied to the nozzle; and a plurality of second mechanisms, each of which moves up and down each of nozzle assemblies.
摘要翻译：提供了一种用于传送包装芯片的拾取器，包括拾取器基座，可固定地连接到拾取器基座的基座，设置在基座上的多个喷嘴组件，每个喷嘴组件可上下移动，并且具有喷嘴封装的芯片被保持抵抗或通过空气压力释放;空气压力供应单元，其提供负压或正压，通过所述空气压力供应单元将封装的芯片保持抵靠或从喷嘴释放;多个第一机构，向喷嘴供给正压; 以及多个第二机构，每个机构每个喷嘴组件都上下移动。

9. 发明授权

US07057569B2 Broadband slot array antenna 失效
标题翻译：宽带时隙阵列天线
公开(公告)号：US07057569B2
公开(公告)日：2006-06-06
申请号：US10509163
申请日：2004-09-23
申请人： Sukhovetski Boris Isoifovich , Jung Hur
发明人： Sukhovetski Boris Isoifovich , Jung Hur
IPC分类号： H01Q13/10
CPC分类号： H01Q13/106
摘要： A broadband slot array antenna employs a closely arranged array of slot antennas to minimize antenna size. The antenna array includes a common input terminal; a conductor plate having a common slot formed in a predetermined area and a plurality of slot halves being formed separately and respectively communicating with the common slot via a plurality of slot necks spaced by a predetermined distance; a plurality of feed lines, each having one terminus connected to the common input terminal, for applying power to the conductor plate at a cross coupling point; and a dielectric layer disposed between the conductor plate and the plurality of feed lines.
摘要翻译：宽带时隙阵列天线使用紧密排列的时隙天线阵列来最小化天线尺寸。天线阵列包括公共输入端; 导体板，其具有形成在预定区域中的公共槽，并且多个槽半部分别形成并且经由间隔开预定距离的多个槽颈分别与公共槽连通; 多个馈线，每个馈线具有连接到公共输入端的一个端子，用于在交叉耦合点处向导体板施加电力; 以及设置在所述导体板和所述多个馈电线之间的电介质层。

10. 发明申请

US20080074120A1 PUSHING BLOCK AND AND A HANDLER WITH THE PUSHING BLOCK 审中-公开
标题翻译：推动块和与推动块的处理器
公开(公告)号：US20080074120A1
公开(公告)日：2008-03-27
申请号：US11858560
申请日：2007-09-20
申请人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
发明人： Jung-ug AHN , Sun-hwal Kim , Wan-hee Choi , Jung Hur
IPC分类号： H01R13/62 , G01R31/26
CPC分类号： G01R31/2893
摘要： Provided is a pushing block for use in a handle and a handler equipped with the pushing block. The pushing block includes pushing pins, provided under the test tray, each pushing the latch upwards from under the test tray to enable the latch to release the packaged chip, a first plate on which the pushing pins are provided, and an assembly changing horizontal motion into vertical motion to move the first plate vertically. Positioning of the pushing block under the test tray prevents interference between the pushing block and the picker during loading and unloading and makes it convenient to take corrective action when malfunction of the picker occurs.
摘要翻译：提供了一种用于手柄的推动块和装有推动块的搬运装置。推动块包括设置在测试托盘下方的推动销，每个推动销从测试托盘下方向上推动闩锁，以使闩锁释放封装的芯片，其上设置有推动销的第一板，以及改变水平运动的组件垂直运动以垂直移动第一板。推动块在测试托盘下方的定位可以防止装载和卸载过程中推动块与拾取器之间的干扰，从而在拾取器发生故障时方便采取纠正措施。

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