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    • 3. 发明授权
    • 진공 주형품을 이용한 Al증착 방법
    • 진공주형품을이용한Al증착방법
    • KR100373876B1
    • 2003-02-26
    • KR1020000084820
    • 2000-12-29
    • 현대자동차주식회사
    • 양수복
    • C23C16/12
    • PURPOSE: An Al deposition method using vacuum molded articles is provided to satisfy sensitivity quality and tests by depositing aluminum on a simple formed article which is fabricated by the same process as normal molded articles. CONSTITUTION: The Al deposition method using vacuum molded articles comprises the processes of preparing a design drawings for a part and fabricating a master through NC processing and RP processing based on the design drawing; fabricating a molded article through molding by fabricating a mold using the master; washing and drying the molded article to remove a releasing agent remained on the molded article; prime coating the molded article with a coating agent for easily performing Al deposition; forming an Al layer by Al depositing the molded article using vacuum pressure; performing top coating on the upper part of the Al layer; and inspecting the molded article.
    • 目的:提供使用真空成型制品的Al沉积方法以满足灵敏度质量和通过将铝沉积在通过与常规模制品相同的工艺制造的简单成型制品上的测试。 构成:使用真空成形品的Al析出方法包括:根据设计图,通过NC加工和RP加工制作零件的设计图,制作母模的工序; 使用母模制造模具来制造模制品; 洗涤和干燥模塑制品以除去残留在模塑制品上的脱模剂; 用涂布剂对模制品进行底涂以便于进行Al沉积; 通过使用真空压力沉积模制品来形成Al层; 在Al层的上部执行顶部涂层; 并检查模制品。
    • 4. 发明公开
    • 원자층 증착 방식에 의한 알루미늄층 형성 방법
    • 通过原子层沉积形成铝层的方法
    • KR1020030003330A
    • 2003-01-10
    • KR1020010038652
    • 2001-06-30
    • 에스케이하이닉스 주식회사
    • 김정태
    • C23C16/12
    • C23C16/12C23C16/45536H01L21/28556
    • PURPOSE: A method is provided which forms an aluminum layer having low specific resistance and superior layer coverage as a metallic wiring layer for semiconductor devices using atomic layer deposition. CONSTITUTION: The method for forming an aluminum layer comprises a first step of adsorbing the aluminum source gas onto the substrate by supplying an aluminum source gas including Cl groups to a substrate; and a second step of forming an aluminum atomic layer by supplying excited hydrogen atoms to the substrate, thereby emitting a reactant of the Cl groups and hydrogen atoms, wherein an aluminum layer having a desired thickness is formed by alternately repeating the first and second steps, the first and second steps are performed in the temperature range of 200 to 500 deg.C, the aluminum source gas is AlCl3, and the hydrogen atoms are excited by plasma.
    • 目的:提供一种形成具有低电阻率和优异的层覆盖度的铝层作为使用原子层沉积的半导体器件的金属布线层的方法。 构成:形成铝层的方法包括:通过向基板供给包括Cl基团的铝源气体,将铝源气体吸附到基板上的第一步骤; 以及第二步骤,通过向所述衬底提供激发的氢原子形成铝原子层,从而发射所述Cl基团和氢原子的反应物,其中通过交替地重复所述第一和第二步骤形成具有所需厚度的铝层, 第一和第二步骤在200至500℃的温度范围内进行,铝源气体为AlCl 3,氢原子被等离子体激发。
    • 5. 发明公开
    • 원자층 증착법을 이용한 박막 형성 방법
    • 使用原子层沉积法形成薄膜的方法
    • KR1020010039874A
    • 2001-05-15
    • KR1020000053415
    • 2000-09-08
    • 삼성전자주식회사
    • 김영관박영욱임재순최성제이상인
    • C23C16/12
    • C23C16/45553C07F5/063C23C16/403
    • PURPOSE: A method for forming a thin film using an atomic layer deposition is provided to obtain a superior stoichiometric thin film by restraining the formation of undesirable impurities when using the atomic layer deposition. CONSTITUTION: The method comprises the steps of chemically adsorbing the first reactant on the substrate by infusing first reactant comprising elements consisting the thin film and ligands into a reaction chamber containing a substrate; removing the first reactant physically adsorbed by purging the reaction chamber with an inert gas; and forming an atomic layer unit of thin film by the chemical reaction of the elements consisting the thin film with the second reactant by infusing second reactant of which binding energy with the elements consisting the thin film is greater than the ligands into the reaction chamber and simultaneously removing the ligands without any side reactions. The method comprises the steps of chemically adsorbing the first reactant on the substrate by infusing first reactant into a substrate loaded reaction chamber (101); removing the physically adsorbed first reactant by purging the reaction chamber with an inert gas (103); forming an atomic layer unit of thin film by the chemical substitution of the first reactant with the second reactant by infusing second reactant into the reaction chamber (105); removing the physically adsorbed second reactant by purging the reaction chamber with an inert gas (107); and infusing third reactant for removing impurities and improving stoichiometry into the thin film formed reaction chamber.
    • 目的:提供使用原子层沉积形成薄膜的方法,通过在使用原子层沉积时抑制不期望的杂质的形成来获得优异的化学计量薄膜。 构成:该方法包括以下步骤:通过将包含由薄膜和配体组成的元素的第一反应物注入到含有基底的反应室中来将基底上的第一反应物化学吸附; 通过用惰性气体清洗反应室来除去物理吸附的第一反应物; 并且通过将由薄膜构成的结合能与结合能量的第二反应物注入到反应室中的配体之间,通过由构成薄膜的元件与第二反应物的化学反应形成薄膜的原子层单元,同时 去除配体而没有任何副反应。 该方法包括以下步骤:通过将第一反应物注入基底负载的反应室(101)中来在基底上化学吸附第一反应物; 通过用惰性气体(103)吹扫反应室来除去物理吸附的第一反应物; 通过将第二反应物注入到反应室(105)中,通过第一反应物与第二反应物的化学取代形成薄膜的原子层单元; 通过用惰性气体(107)清洗反应室来除去物理吸附的第二反应物; 并且将第三反应物注入到去除薄膜形成的反应室中以除去杂质并改善化学计量。
    • 6. 发明公开
    • 알루미늄막 형성 방법 및 알루미늄 증착 장비
    • 形成铝和铝沉积设备的方法
    • KR1020070012072A
    • 2007-01-25
    • KR1020050066896
    • 2005-07-22
    • 삼성전자주식회사
    • 조윤정이정호최정식
    • C23C16/12
    • C23C16/20C07F5/067C23C16/4557
    • A method of forming an aluminum film and an aluminum-depositing equipment are provided to form an aluminum film using DEAA(diethylamino alane) stable at 100 deg.C or less as a precursor such that DEAA can be easily applied to actual commercial production. An aluminum-depositing equipment(100) comprises: a storage tank(10) for storing DEAA(diethylamino alane); a vaporizer(20) for vaporizing DEAA; a deposition chamber(30) for depositing an aluminum film using vaporized DEAA as a precursor; a first pipe(11) for connecting the storage tank to the vaporizer; a second pipe(13) for connecting the deposition chamber to the vaporizer; and a supply pipe(12) for supplying a carrier gas to the vaporizer. The deposition chamber has a wafer receiving part(15) on which a wafer(W) is placed, and which sets up temperature of the wafer as a process temperature, and a shower head(14) positioned on the wafer receiving part to supply vaporized DEAA onto the wafer, wherein the second pipe is connected to the shower head.
    • 提供一种形成铝膜和铝沉积设备的方法,以在100摄氏度以下稳定的DEAA(二乙基氨基丙烷)作为前体形成铝膜,使得DEAA可以容易地应用于实际的商业生产。 铝沉积设备(100)包括:用于存储DEAA(二乙基氨基丙烷)的储罐(10); 蒸发器(20),用于蒸发DEAA; 沉积室(30),用于使用蒸发的DEAA作为前体沉积铝膜; 用于将储罐连接到蒸发器的第一管道(11) 用于将沉积室连接到蒸发器的第二管道(13); 以及用于将气体供给到蒸发器的供给管(12)。 沉积室具有晶片接收部分(15),晶片(W)放置在晶片接收部分上,并且将晶片的温度设置为处理温度,以及位于晶片接收部分上的喷淋头(14),以供应蒸发的 DEAA到晶片上,其中第二管连接到淋浴喷头。